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    • 57. 发明授权
    • Gate configuration for nanowire electronic devices
    • 纳米线电子器件的栅极配置
    • US07473943B2
    • 2009-01-06
    • US11233398
    • 2005-09-22
    • Shahriar MostarshedJian ChenFrancisco LeonYaoling PanLinda T. Romano
    • Shahriar MostarshedJian ChenFrancisco LeonYaoling PanLinda T. Romano
    • H01L29/80
    • H01L29/0665B82Y10/00H01L29/0673H01L29/42384H01L29/42392H01L29/775H01L29/785H01L29/78645H01L29/78681H01L29/7869Y10S977/762Y10S977/932Y10S977/938
    • Methods, systems, and apparatuses for electronic devices having improved gate structures are described. An electronic device includes at least one nanowire. A gate contact is positioned along at least a portion of a length of the at least one nanowire. A dielectric material layer is between the gate contact and the at least one nanowire. A source contact and a drain contact are in contact with the at least one nanowire. At least a portion of the source contact and/or the drain contact overlaps with the gate contact along the nanowire the length. In another aspect, an electronic device includes a nanowire having a semiconductor core surrounded by an insulating shell layer. A ring shaped first gate region surrounds the nanowire along a portion of the length of the nanowire. A second gate region is positioned along the length of the nanowire between the nanowire and the substrate. A source contact and a drain contact are coupled to the semiconductor core of the nanowire at respective exposed portions of the semiconductor core.
    • 描述了具有改进的门结构的电子设备的方法,系统和装置。 电子装置包括至少一个纳米线。 栅极接触沿至少一个纳米线的长度的至少一部分定位。 介电材料层在栅极接触和至少一个纳米线之间。 源极触点和漏极触点与至少一个纳米线接触。 源极触点和/或漏极触点的至少一部分沿着该纳米线的长度与栅极触点重叠。 另一方面,一种电子器件包括具有被绝缘壳层包围的半导体芯的纳米线。 环形第一栅极区域沿着纳米线长度的一部分包围纳米线。 第二栅极区沿着纳米线和衬底之间的纳米线的长度定位。 源极触点和漏极触点在半导体芯的相应的暴露部分处耦合到纳米线的半导体芯。
    • 59. 发明申请
    • III-Nitride Light Emitting Devices Grown on Templates to Reduce Strain
    • III型氮化物发光器件生长在模板上以减少应变
    • US20080149961A1
    • 2008-06-26
    • US11615834
    • 2006-12-22
    • Patrick N. GrillotNathan F. GardnerWerner K. GoetzLinda T. Romano
    • Patrick N. GrillotNathan F. GardnerWerner K. GoetzLinda T. Romano
    • H01L33/00
    • H01L33/007H01L31/184
    • In a III-nitride light emitting device, the device layers including the light emitting layer are grown over a template designed to reduce strain in the device, in particular in the light emitting layer. Reducing the strain in the light emitting device may improve the performance of the device. The template may expand the lattice constant in the light emitting layer over the range of lattice constants available from conventional growth templates. Strain is defined as follows: a given layer has a bulk lattice constant abulk corresponding to a lattice constant of a free standing material of a same composition as that layer and an in-plane lattice constant ain-plane corresponding to a lattice constant of that layer as grown in the structure. The amount of strain in a layer is |(ain-plane−abulk)/abulk. In some embodiments, the strain in the light emitting layer is less than 1%.
    • 在III族氮化物发光器件中,包括发光层的器件层在设计成减小器件中特别是在发光层中的应变的模板上生长。 降低发光器件中的应变可以提高器件的性能。 模板可以在常规生长模板可获得的晶格常数的范围内扩展发光层中的晶格常数。 应变定义如下:给定层具有对应于与该层相同组成的自由材料的晶格常数和体内晶格常数a的体晶格常数a 对应于在该结构中生长的该层的晶格常数。 一层中的应变量是|(一个平面内的)本体体积。 在一些实施方案中,发光层中的应变小于1%。