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    • 51. 发明授权
    • Micro-phase adjusting and micro-phase adjusting mixer circuits designed with standard field effect transistor structures
    • 微相调节和微相调谐混频器电路采用标准场效应晶体管结构设计
    • US07795940B2
    • 2010-09-14
    • US12573910
    • 2009-10-06
    • Wagdi W. AbadeerAnthony R. BonaccioJoseph A. Iadanza
    • Wagdi W. AbadeerAnthony R. BonaccioJoseph A. Iadanza
    • H03K3/00H03H11/16H03K5/13
    • H03K5/06H03K2005/00052H03K2005/00058
    • Disclosed herein are embodiments of a programmable phase adjusting circuit, a programmable phase adjusting mixer circuit and design structures for these circuits. These circuits comprise a variable delay device connected between input and output nodes. The device includes multiple FETs with input diffusion regions that are connected to a voltage rail via switches so that they can be selectively biased, gates that are connected in series to the input node so that a periodic input signal can be propagated sequentially through each of the gates and output diffusion regions that are connected in parallel to the output node. A current source is connected between the output node and another voltage rail for biasing the output node when the variable delay device is off. The variable delay device enables a circuit in which small increments of selectable phase adjustments can be made to the periodic input signal as a function of propagation delay.
    • 这里公开了可编程相位调整电路,可编程相位调整混频器电路和这些电路的设计结构的实施例。 这些电路包括连接在输入和输出节点之间的可变延迟器件。 该器件包括多个FET,其输入扩散区通过开关连接到电压轨,使得它们可以被选择性偏置,与输入节点串联连接的栅极,使得周期性输入信号可以顺序地传播通过 门和输出扩散区域并联连接到输出节点。 当可变延迟装置关闭时,电流源连接在输出节点和另一个电压轨道之间,用于偏置输出节点。 可变延迟装置使得能够作为传播延迟的函数对周期性输入信号进行可选相位调整的小增量的电路。
    • 57. 发明授权
    • Family of analog amplifier and comparator circuits with body voltage control
    • 具有体电压控制的模拟放大器和比较器电路系列
    • US06452448B1
    • 2002-09-17
    • US09616550
    • 2000-07-14
    • Anthony R. BonaccioMichel S. MichailWilbur D. PricerSteven J. Tanghe
    • Anthony R. BonaccioMichel S. MichailWilbur D. PricerSteven J. Tanghe
    • H03F345
    • H03F3/45748H03F3/4521H03F2203/45342H03F2203/45658H03F2203/45711
    • A structure for an amplifier circuit which includes a pair of source-coupled differential transistors, each of source-coupled differential transistors having a body and a gate, and input transistors electrically connected to the source-coupled transistors. Also, the input transistors load the body and the gate of the source-coupled transistors with positive feedback signals. As a result, a differential gain is increased and a common mode gain is not increased. The output of the pair of source-coupled differential transistors is directed to second pair of transistors. The second pair of transistors generates mirrored voltages which track with input voltages. The second pair of transistors generates mirrored voltages translated by an offset voltage to values near ground, mirrored voltages which represent a voltage gain over an input voltage, and mirrored voltages which are largely differential and includes approximately no common mode input voltage.
    • 一种用于放大器电路的结构,其包括一对源极耦合差分晶体管,每个源极耦合差分晶体管具有主体和栅极,以及输入晶体管,电连接到源耦合晶体管。 此外,输入晶体管负载负极反馈信号的源极耦合晶体管的主体和栅极。 结果,差分增益增加并且共模增益不增加。 一对源极耦合差分晶体管的输出被引导到第二对晶体管。 第二对晶体管产生用输入电压跟踪的镜像电压。 第二对晶体管产生由偏移电压转换为接近接近的值的镜像电压,表示输入电压上的电压增益的镜像电压和大幅度差分的近似不包含共模输入电压的镜像电压。
    • 58. 发明授权
    • Contact test circuit
    • 接触测试电路
    • US06337573B1
    • 2002-01-08
    • US09360150
    • 1999-07-26
    • Anthony R. BonaccioHoward J. Leighton
    • Anthony R. BonaccioHoward J. Leighton
    • G01R1073
    • G01R31/043
    • A method and apparatus for contact testing a plurality of devices under test, either sequentially or simultaneously. In a first test phase it is determined whether the test probe to each contact is shorted to the most negative rail. In a second phase it is determined whether the test probe has made proper contact, and whether ESD diodes on the devices under test are functional. In both test phases a negative pulse is generated on a tester bus and applied to the contact by the test probe. In the first test phase the positive rail of the device under test is grounded; in the second test phase the positive rail of the device under test is made positive. The negative rail of the device under test is connected to the negative rail of the tester. In both test phases, upon termination of the negative pulse, the bus is restored to a positive voltage which is dependent upon the condition of the contact and the condition of expected input devices at the contact. The bus voltage is measured in accordance with a logic which determines the condition of the contact and the condition of expected input devices at the contact. Data signals for functional testing of the device under test are can be applied to the bus through an isolating driver which preserves the logic of the contact test.
    • 一种用于连续或同时接触测试多个待测器件的方法和装置。 在第一个测试阶段,确定每个触点的测试探针是否短接到最负的导轨。 在第二阶段,确定测试探针是否已正确接触,以及被测器件上的ESD二极管是否正常工作。 在两个测试阶段,在测试仪总线上产生负脉冲,并通过测试探头施加到触点。 在第一个测试阶段,被测器件的正极接地; 在第二个测试阶段,正在测试的器件的正极。 被测器件的负极线连接到测试仪的负极轨。 在两个测试阶段,在负脉冲终止时,总线恢复到正电压,这取决于触点的状态和触点处的预期输入设备的状态。 总线电压根据确定触点状态的逻辑和触点处的预期输入装置的状态来测量。 用于测试设备功能测试的数据信号可以通过保护接触测试逻辑的隔离驱动器应用于总线。
    • 59. 发明授权
    • Differential current mode driver circuit with low common-mode noise
    • 差分电流模式驱动电路具有低共模噪声
    • US5424662A
    • 1995-06-13
    • US250968
    • 1994-05-31
    • Anthony R. Bonaccio
    • Anthony R. Bonaccio
    • H03K19/018H04L25/02G01R19/00
    • H04L25/0282H03K19/01831H04L25/0274
    • An improved, differential current-mode driver circuit with low common-mode noise and high output impedance. In this circuit both sink and source currents are controlled by two pairs of emitter coupled differential amplifiers operated as current switches. One of the pairs of current switches is comprised of PNP transistors and hence slower than the other pair of current switches which is comprises of NPN transistors. The input data is applied differentially to the slower pair of the current switches and simultaneously to auxiliary switches which act as inverting amplifiers and are cross-coupled to and drive the inputs of the two faster current switches. A fifth current switch and auxiliary switch inverting amplifier is used to as an inhibit circuit to shunt both source and sink currents to ground so that no circuit node will swing excessively while holding the output nodes of the current sink and source a constant voltage thus reducing common-mode noise.
    • 具有低共模噪声和高输出阻抗的改进的差分电流模式驱动电路。 在这个电路中,电流和源极电流由两对发射极耦合差动放大器控制,作为电流开关。 一对电流开关由PNP晶体管组成,因此比由NPN晶体管组成的另一对电流开关慢。 输入数据差分地施加到较慢的电流开关对,并同时用于辅助开关,这些辅助开关用作反相放大器,并且交叉耦合到并驱动两个更快的电流开关的输入。 第五个电流开关和辅助开关反相放大器被用作抑制电路,以将源电流和吸收电流分流到地,使得没有电路节点过度摆动,同时保持电流吸收器的输出节点并且源极具有恒定的电压,从而减少常见的 模式噪音