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    • 54. 发明授权
    • Method for bonding heat sinks to overmolds and device formed thereby
    • 用于将散热器连接到包覆成型体的方法和由此形成的装置
    • US06770968B2
    • 2004-08-03
    • US10369778
    • 2003-02-19
    • Frank D. EgittoMichael A. GaynesRamesh R. KodnaniLuis J. MatienzoMark V. Pierson
    • Frank D. EgittoMichael A. GaynesRamesh R. KodnaniLuis J. MatienzoMark V. Pierson
    • H01L2334
    • B29C59/14H01L21/56H01L24/73H01L2224/32225H01L2224/48091H01L2224/48227H01L2224/48472H01L2224/73265H01L2924/15311H01L2924/00012H01L2924/00H01L2924/00014
    • A method for bonding heat sinks to packaged electronic components comprises the steps of: (a) exposing to a plasma a surface of a molded polymer formed on a substrate; (b) allowing the plasma to at least partially convert silicon-containing residue on the surface to silica; and (c) bonding an article to the surface by applying an adherent between the article and the surface. Often, the silicon-containing residue is silicone oil, a mold release compound, which may prevent the formation of a bond when using conventional bonding methods and materials. The silica layer formed on the surface of the molded polymer assists in formation of a proper bond. The plasma may be an oxygen plasma and the adherent may be selected from either a heat cured silicone-based paste adhesive with a metal oxide filler or a heat cured porous polymer film impregnated with adhesive. In particular, the film may be polytetrafluoroethylene, the adhesive may be polybutadine, and the film may be further impregnated with a metal oxide heat transfer medium, such as zinc oxide. An alternate method comprises applying the porous polymer film without plasma treatment and heat curing the film to form a proper bond.
    • 一种用于将散热器粘合到封装的电子部件的方法包括以下步骤:(a)将形成在基底上的模制聚合物的表面暴露于等离子体; (b)允许等离子体至少部分地将表面上的含硅残余物转化为二氧化硅; 和(c)通过在制品和表面之间施加贴附物将物品粘合到表面上。 通常,含硅残渣是使用常规粘合方法和材料的硅油,脱模剂,可以防止形成粘结。 形成在模塑聚合物表面上的二氧化硅层有助于形成适当的键。 等离子体可以是氧等离子体,并且粘合剂可以选自具有金属氧化物填料的热固化的硅氧烷基糊状粘合剂或浸渍有粘合剂的热固化多孔聚合物膜。 特别地,膜可以是聚四氟乙烯,粘合剂可以是聚丁二烯,并且该膜可以进一步用金属氧化物传热介质如氧化锌浸渍。 替代方法包括在不进行等离子体处理的情况下应用多孔聚合物膜并热固化膜以形成适当的键。
    • 59. 发明授权
    • Surface metal balancing to reduce chip carrier flexing
    • 表面金属平衡,减少芯片载体弯曲
    • US06497943B1
    • 2002-12-24
    • US09503395
    • 2000-02-14
    • Lisa J. JimarezMiguel A. JimarezMark V. Pierson
    • Lisa J. JimarezMiguel A. JimarezMark V. Pierson
    • B32B300
    • B32B15/08B32B15/20B32B17/10229B32B2250/40B32B2425/00H01L23/142H01L23/49822H01L2224/16225H01L2924/00014H01L2924/01322H05K1/0271H05K3/4602H05K2201/0949H05K2201/09781H05K2201/10674H05K2201/10734Y10T428/24917H01L2924/00H01L2224/0401
    • A surface metal balancing structure for a chip carrier, and an associated method of fabrication, to reduce or eliminate thermally induced chip carrier flexing. A substrate, such as a chip carrier made of organic dielectric material, is formed and includes: internal circuitization layers, a plated through hole, and outer layers comprised of an allylated polyphenylene ether. A stiffener ring for mechanically stabilizing the substrate is bonded to an outer portion, such as an outer perimeter portion, of the top surface of the substrate, in light of the soft and conformal organic material of the substrate. The top and bottom surfaces of the substrate have metal structures, such as copper pads and copper circuitization, wherein a surface area (A) multiplied by a coefficient of thermal expansion (C) is greater for the metal structure at the bottom surface than for the metal structure at the top surface. A metal pattern is adjacent to the top surface so as to make the product AC of metal structures at or near the top and bottom surfaces approximately equal. The metal pattern reduces or eliminates flexing of the substrate in an elevated temperature environment, such as during a reflow of solder that couples a semiconductor chip to the substrate.
    • 用于芯片载体的表面金属平衡结构以及相关的制造方法,以减少或消除热诱导的芯片载体弯曲。 形成诸如由有机电介质材料制成的芯片载体的衬底,其包括:内部电路层,电镀通孔和由烯丙基化聚苯醚构成的外层。 根据衬底的软和保形有机材料,用于机械稳定衬底的加强环被结合到衬底的顶表面的外部部分,例如外周部分。 衬底的顶表面和底表面具有诸如铜焊盘和铜电路的金属结构,其中在底表面处的金属结构的表面积(A)乘以热膨胀系数(C)大于对于 金属结构在顶面。 金属图案与顶表面相邻,以使金属结构的产品AC在顶表面和底表面处或附近大致相等。 金属图案减少或消除了在升高的温度环境中的衬底的弯曲,例如在将半导体芯片耦合到衬底的焊料的回流期间。