会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 42. 发明申请
    • ULTRA-COMPACT, PASSIVE, VARACTOR-BASED WIRELESS SENSOR USING QUANTUM CAPACITANCE EFFECT IN GRAPHENE
    • 超声波,无源,基于变压器的无线传感器,在图形中使用量子电容效应
    • US20140145735A1
    • 2014-05-29
    • US14111753
    • 2012-04-13
    • Steven J. Koester
    • Steven J. Koester
    • G01N27/22G01R27/26
    • G01N27/221G01N27/227G01R27/2605H01L29/1025H01L29/1606H01L29/42312H01L29/93H01L31/085H01L31/115
    • An electrical device includes at least one graphene quantum capacitance varactor. In some examples, the graphene quantum capacitance varactor includes an insulator layer, a graphene layer disposed on the insulator layer, a dielectric layer disposed on the graphene layer, a gate electrode formed on the dielectric layer, and at least one contact electrode disposed on the graphene layer and making electrical contact with the graphene layer. In other examples, the graphene quantum capacitance varactor includes an insulator layer, a gate electrode recessed in the insulator layer, a dielectric layer formed on the gate electrode, a graphene layer formed on the dielectric layer, wherein the graphene layer comprises an exposed surface opposite the dielectric layer, and at least one contact electrode formed on the graphene layer and making electrical contact with the graphene layer.
    • 电气装置包括至少一个石墨烯量子电容变容二极管。 在一些示例中,石墨烯量子电容变容二极管包括绝缘体层,设置在绝缘体层上的石墨烯层,设置在石墨烯层上的电介质层,形成在电介质层上的栅电极,以及设置在绝缘体层上的至少一个接触电极 石墨烯层,并与石墨烯层电接触。 在其他实例中,石墨烯量子电容变容二极管包括绝缘体层,凹入绝缘体层中的栅电极,形成在栅电极上的电介质层,形成在电介质层上的石墨烯层,其中石墨烯层包括相对的暴露表面 所述电介质层和形成在所述石墨烯层上并与所述石墨烯层电接触的至少一个接触电极。
    • 43. 发明授权
    • Semiconductor device for radiation detection
    • 用于辐射检测的半导体器件
    • US08729652B2
    • 2014-05-20
    • US12282932
    • 2007-03-13
    • Anco HeringaErik Jan LousWibo Daniel Van NoortWilhelmus Cornelis Maria PetersJoost Willem Christiaan Veltkamp
    • Anco HeringaErik Jan LousWibo Daniel Van NoortWilhelmus Cornelis Maria PetersJoost Willem Christiaan Veltkamp
    • H01L31/115
    • G01T1/2018H01L27/14659H01L27/14663H01L31/115
    • The invention provides a semiconductor device (11) for radiation detection, which comprises a substrate region (1) of a substrate semiconductor material, such as silicon, and a detection region (3) at a surface of the semiconductor device (11), in which detection region (3) charge carriers of a first conductivity type, such as electrons, are generated and detected upon incidence of electromagnetic radiation (L) on the semiconductor device (11). The semiconductor device (11) further comprises a barrier region (2,5,14) of a barrier semiconductor material or an isolation material, which barrier region (2,5,14) is an obstacle between the substrate region (1) and the detection region (3) for charge carriers that are generated in the substrate region (1) by penetration of ionizing radiation (X), such as X-rays, into the substrate region (1). This way the invention provides a semiconductor device (11) for radiation detection in which the influence on the performance of the semiconductor device (11) of ionizing radiation (X), such as X-rays, that penetrates into the substrate region (1) is reduced.
    • 本发明提供了一种用于放射线检测的半导体器件(11),其包括诸如硅的衬底半导体材料的衬底区域(1)和在半导体器件(11)的表面处的检测区域(3) 在半导体器件(11)上的电磁辐射(L)入射时,产生并检测出检测区域(3)对第一导电类型(例如电子)的载流子。 半导体器件(11)还包括阻挡半导体材料或隔离材料的阻挡区域(2,5,14),所述阻挡区域(2,5,14)是衬底区域(1)和衬底区域 用于通过诸如X射线的电离辐射(X)穿透而在衬底区域(1)中产生的电荷载体的检测区域(3)。 这样,本发明提供了一种用于放射线检测的半导体器件(11),其中对穿透到衬底区域(1)中的诸如X射线的电离辐射(X)的半导体器件(11)的性能的影响, 降低了。
    • 44. 发明申请
    • LATERAL SILICON-ON-INSULATOR BIPOLAR JUNCTION TRANSISTOR RADIATION DOSIMETER
    • 横向绝缘子绝缘子双极晶体管辐射剂量计
    • US20140084301A1
    • 2014-03-27
    • US13625440
    • 2012-09-24
    • INTERNATIONAL BUSINESS MACHINES CORPORATION
    • Jin CaiEffendi LeobandungTak H. NingJeng-Bang Yau
    • G01T1/02H01L31/0312H01L31/028H01L31/0304
    • H01L27/14G01T1/026H01L21/02H01L27/14689H01L31/028H01L31/0304H01L31/0312H01L31/1105H01L31/115
    • A radiation dosimeter includes a semiconductor substrate and a buried insulator layer disposed on the semiconductor substrate. The buried insulator layer has a plurality of charge traps. A semiconductor layer is disposed on the buried insulator layer. The semiconductor layer has an emitter, an intrinsic base, and a collector laterally arranged with respect to one another. In response to radiation exposure by the radiation dosimeter, positive charges are trapped in the plurality of charge traps in the buried insulator layer, the amount of positive charge trapped being used to determine the amount of radiation exposure. A method for radiation dosimetry includes providing a radiation dosimeter, where the radiation dosimeter includes a lateral silicon-on-insulator bipolar junction transistor having a buried insulator layer; exposing the radiation dosimeter to ionizing radiation; determining a change in one of the collector current and current gain of the radiation dosimeter; and determining an amount of the radiation dose based on the change in one of the collector current and current gain.
    • 辐射剂量计包括设置在半导体衬底上的半导体衬底和掩埋绝缘体层。 掩埋绝缘体层具有多个充电陷阱。 半导体层设置在埋层绝缘体层上。 半导体层具有相对于彼此横向布置的发射极,本征基极和集电极。 响应于辐射剂量计的辐射照射,正电荷被捕获在掩埋绝缘体层中的多个电荷陷阱中,所捕获的正电荷量用于确定辐射暴露量。 辐射剂量测定方法包括提供辐射剂量计,其中辐射剂量计包括具有埋层绝缘体层的横向绝缘体上硅绝缘体双极结型晶体管; 将辐射剂量计暴露于电离辐射; 确定辐射剂量计的集电极电流和电流增益之一的变化; 以及基于集电极电流和电流增益之一的变化来确定辐射剂量的量。
    • 45. 发明授权
    • Radiation detecting element and radiation detecting device
    • 辐射检测元件和辐射检测装置
    • US08674358B2
    • 2014-03-18
    • US13321246
    • 2010-05-17
    • Takehisa Sasaki
    • Takehisa Sasaki
    • H01L21/02
    • H01L31/085G01T1/2018G01T1/249H01L31/1085H01L31/115
    • There has been such a problem that radiation detecting elements using semiconductor elements have a low radiation detection efficiency, since the radiation detecting elements easily transmit radiation, even though the radiation detecting elements have merits, such as small dimensions and light weight. Disclosed are a radiation detecting element and a radiation detecting device, wherein a film formed of a metal, such as tungsten, is formed on the radiation incident surface of the radiation detecting element, and the incident energy of the radiation is attenuated. The efficiency of generating carriers by way of radiation incidence is improved by attenuating the incident energy, the thickness of the metal film is optimized, and the radiation detection efficiency is improved.
    • 存在使用半导体元件的放射线检测元件具有低辐射检测效率的问题,因为即使辐射检测元件具有尺寸小,重量轻等优点,因为辐射检测元件容易发射辐射。 公开了一种放射线检测元件和放射线检测装置,其中由诸如钨的金属形成的膜形成在辐射检测元件的辐射入射表面上,并且辐射的入射能量被衰减。 通过衰减入射能量,通过辐射入射发生载流子的效率得到改善,金属膜的厚度被优化,辐射检测效率得到提高。