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    • 42. 发明授权
    • Detecting surface pits
    • 检测表面凹坑
    • US07295300B1
    • 2007-11-13
    • US11237257
    • 2005-09-28
    • Laurie BechtlerVamsi VelidandlaSteven W. Meeks
    • Laurie BechtlerVamsi VelidandlaSteven W. Meeks
    • G01N21/00
    • G01N21/9501G01N21/94G01N21/9503G01N2021/218
    • A system to detect pits in a surface comprises first and second radiation targeting assemblies to target a second radiation beam onto a surface, a first radiation collecting assembly that collects radiation scattered from the surface, a processor coupled to the first radiation collecting assembly, a memory module coupled to the processor and comprising logic instructions which, when executed by the processor, configure the processor to generate a first signal from radiation scattered from the first radiation beam, generate a second signal from radiation scattered from the second radiation beam, record the first signal and the second signal at an array of different positions on the surface, calculate a median value for the first signal and the second signal over the array of different positions on the surface, and use the first signal, the second signal, and the median value to detect pits in the surface.
    • 用于检测表面中的凹坑的系统包括将第二辐射束瞄准到表面上的第一和第二辐射瞄准组件,收集从表面散射的辐射的第一辐射收集组件,耦合到第一辐射收集组件的处理器,存储器 模块,其耦合到所述处理器并且包括逻辑指令,所述逻辑指令在被所述处理器执行时配置所述处理器以从所述第一辐射束散射的辐射生成第一信号,从所述第二辐射束散射的辐射产生第二信号, 信号和表面上不同位置的阵列上的第二信号,计算表面上不同位置阵列上的第一信号和第二信号的中值,并使用第一信号,第二信号和中值 值以检测表面中的凹坑。
    • 43. 发明申请
    • Systems and methods for chiroptical heterodyning
    • 手性外差的系统和方法
    • US20060001876A1
    • 2006-01-05
    • US11168295
    • 2005-06-29
    • Phillip GibbsJason Beebe
    • Phillip GibbsJason Beebe
    • G01B9/02
    • G01J3/2803G01N21/1717G01N21/21G01N2021/218
    • An apparatus and method for improved detection of a chiral property of a sample begins with a probe beam of light having a first modulation frequency ω and is further modulated with a second modulation frequency φ. A non-linear photo-detector, which may include multiple detector portions to form a balanced receiver, mixes the first modulation with the second modulation to analyze frequency components at inter-modulated sidebands, where the level of the inter-modulated sidebands are related to the chiroptical property of the sample. The inter-modulated sidebands may be the additive sidebands or the subtractive sidebands. A lock-in detector can be used to receive a signal output from the non-linear photo-detector and generate the modulation signals at the different modulating frequencies. Furthermore, the non-linear photo-detector may analyze a ratio of the inter-modulated sideband levels, such as (φ+2ω)/(φ+ω), to yield a signal that is linearly related to the chiral property of the sample.
    • 用于改进样品手性性质检测的装置和方法以具有第一调制频率ω的探测光束开始,并且用第二调制频率phi进一步调制。 可以包括多个检测器部分以形成平衡接收器的非线性光检测器将第一调制与第二调制混合,以分析调制后边带处的频率分量,其中相互调制的边带的电平与 样本的手性属性。 相互调制的边带可以是加性边带或减法边带。 锁定检测器可用于接收来自非线性光电检测器的信号输出,并产生不同调制频率的调制信号。 此外,非线性光检测器可以分析诸如(phi + 2omega)/(phi +ω)之间的调制调制边带等级的比率,以产生与样品的手性特征线性相关的信号 。
    • 46. 发明授权
    • Infrared spectropolarimeter
    • 红外分光计
    • US5045701A
    • 1991-09-03
    • US413414
    • 1989-09-27
    • Dennis H. GoldsteinRussell A. Chipman
    • Dennis H. GoldsteinRussell A. Chipman
    • G01J3/447G01J3/453G01N21/21G01N21/35
    • G01J3/447G01J3/453G01N2021/218G01N2021/3595
    • An infrared spectropolarimeter system for making spectroscopic measurements of electro-optic properties of materials over a large wavelength range in the infrared is described which comprises in combination a spectrometer having a sample region for receiving a sample for making spectroscopic measurements thereon and a source of light for providing a sample beam of selected wavelength for projection through the sample region, the sample region defined between a first focusing element for selectively focusing the sample beam within the sample region and a second focusing element for collimating the sample beam and providing an output beam for analysis, first and second polarizers between the focusing elements with the sample region therebetween for selectively polarizing the sample beam, first and second rotatable optical retarders between the polarizers with the sample region therebetween for selectively retarding one linear polarization component with respect to the orthogonal component of the sample beam, and a detector for analyzing the output beam.
    • 描述了用于对在红外线中的大波长范围内的材料进行光学特性的光谱测量的红外分光偏光计系统,其包括具有用于接收用于在其上进行光谱测量的样品的样品区域的光谱仪和用于在其上进行光谱测量的光源 提供用于通过采样区域的投影的所选波长的采样光束,在用于选择性地聚焦采样区域内的采样光束的第一聚焦元件和用于准直采样光束的第二聚焦元件之间限定的采样区域,并提供用于分析的输出光束 在聚焦元件之间的第一和第二偏振器与其间的样品区域用于选择性地使样品光束偏振;偏振器之间的第一和第二可旋转光学延迟器,其间具有样品区域,用于相对于正交成分选择性地延迟一个线性偏振分量 t,以及用于分析输出光束的检测器。