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1. 发明公开

US20240319110A1 OPTICAL INSPECTION DEVICE FOR OPTICAL PERFORMANCE TEST OF DISPLAY DEVICE AND OPTICAL INSPECTION METHOD USING THE SAME 审中-公开
公开(公告)号：US20240319110A1
公开(公告)日：2024-09-26
申请号：US18732934
申请日：2024-06-04
申请人： Samsung Display Co., LTD.
发明人： Gil Yeong PARK , Min Kyoung JUNG , Hee Young LEE
IPC分类号： G01N21/956 , G01M11/02 , G01N21/21 , G01N21/88 , G01N21/95 , G02F1/13
CPC分类号： G01N21/956 , G01M11/02 , G01N21/21 , G02F1/1309 , G01N2021/218 , G01N2021/8848 , G01N2021/9511 , G01N2021/9513
摘要： An optical inspection device for an optical performance test of a display device including a lens part configured to transmit external light, a phase film part configured to change a phase difference of the external light and transmit the external light, and an image processor configured to obtain electrical information of the external light, in which a phase difference of the phase film part is at least 7000 nm.

2. 发明授权

US08605282B2 Method and apparatus for high precision spectroscopy 失效
标题翻译：高精度光谱法的方法和装置
公开(公告)号：US08605282B2
公开(公告)日：2013-12-10
申请号：US13319177
申请日：2010-05-06
申请人： David Groswasser
发明人： David Groswasser
IPC分类号： G01J4/00
CPC分类号： G01N21/1717 , G01J3/447 , G01N21/23 , G01N2021/1727 , G01N2021/218
摘要： The invention provides spectroscopy apparatuses and methods allowing precise overlapping between circularly polarized pump beam and a counter propagating linearly polarized probe beams in a sample which presents unique advantages for precision spectroscopy. In general, the apparatus comprises a phase retarding element with which by double pass by retro reflection of an incident beam turn linearly polarized light to circular and vice versa. This unique configuration enable to design a compact and miniature apparatus which may be applied for measuring polarization spectroscopy, nonlinear optical rotation and coherent population trapping phenomena with certain advantages resulting from the unique optical arrangement. The design of the apparatus further facilitates integration and scaling to produce arrays of units which may be particularly useful for magnetometry applications. Other important applications of the invention include laser frequency stabilization and atomic clocks.
摘要翻译：本发明提供了光谱装置和方法，其允许圆形偏振泵浦光束和样品中的反向传播线性偏振探测光束之间的精确重叠，这为精确光谱学提供了独特的优点。通常，该装置包括一个相位延迟元件，通过入射光束的反射双重反射将线性偏振光转换成圆形，反之亦然。这种独特的配置使得能够设计一种紧凑的和微型的设备，其可以用于测量偏振光谱，非线性旋光和相干群体捕获现象，具有由独特的光学布置导致的某些优点。该装置的设计进一步促进了整合和缩放以产生可能对磁力计应用特别有用的单元阵列。本发明的其它重要应用包括激光频率稳定和原子钟。

3. 发明授权

US4102574A Method and means of monitoring the quality of a fluid dielectric 失效
标题翻译：监测流体电介质质量的方法和手段
公开(公告)号：US4102574A
公开(公告)日：1978-07-25
申请号：US795690
申请日：1977-05-11
申请人： Herman H. Wieder , Neil M. Davis
发明人： Herman H. Wieder , Neil M. Davis
IPC分类号： G01N21/21 , G01N21/40
CPC分类号： G01N21/21 , G01N2021/218
摘要： A method and means of monitoring the quality of a fluid dielectric capacitor by measuring the Kerr signal of a dielectric fluid which has the desired dielectric and breakdown properties and continually measuring the Kerr signal of the same fluid dielectric while in use to determine if there is any degradation of the fluid in use. The means for measuring the Kerr signal is by projecting a high intensity light beam such as from a laser source through the dielectric fluid of a capacitor between two of the plates and detecting the amount of light passed through the dielectric which is an indication of the condition of the dielectric liquid.
摘要翻译：一种通过测量具有所需电介质和击穿性能的介质流体的克尔信号并在使用中连续测量相同流体电介质的克尔信号来测量流体介电电容器的质量的方法和装置，以确定是否存在任何使用中流体的降解。用于测量克尔信号的装置是通过将来自激光源的高强度光束通过两个板之间的电容器的介电流体投射，并且检测通过电介质的光量，该光量是条件的指示的介电液体。

4. 发明授权

US09645045B2 SHG imaging technique for assessing hybrid EO polymer/silicon photonic integrated circuits 有权
公开(公告)号：US09645045B2
公开(公告)日：2017-05-09
申请号：US14437776
申请日：2013-10-22
申请人： The Arizona Board of Regents on Behalf of the University of Arizona
发明人： Robert A. Norwood , Khanh Q. Kieu , Roland Himmelhuber
IPC分类号： G01N21/00 , G01M11/00 , G01N21/63 , G02B21/00 , G01N21/23 , G01N21/21 , G01N21/65
CPC分类号： G01M11/37 , G01N21/23 , G01N21/636 , G01N2021/218 , G01N2021/637 , G01N2021/653 , G02B21/0016 , G02B21/002
摘要： Probe beams are scanned with respect to waveguide substrates to generate optical harmonics. Detection of the optical harmonic radiation is used to image waveguide cores, claddings, or other structures such as electrodes. The detected optical radiation can also be used to provide estimates of linear electrooptic coefficients, or ratios of linear electrooptic coefficients. In some cases, the poling of polymer waveguide structures is monitored during fabrication based on a second harmonic of the probe beam. In some examples, third harmonic generation is used for imaging of conductive layers.

5. 发明申请

US20140176698A1 SYSTEMS AND METHODS FOR IMAGING CHARACTERISTICS OF A SAMPLE AND FOR IDENTIFYING REGIONS OF DAMAGE IN THE SAMPLE 有权
标题翻译：用于成像样本特征和识别样品中损伤区域的系统和方法
公开(公告)号：US20140176698A1
公开(公告)日：2014-06-26
申请号：US13878944
申请日：2010-11-29
申请人： Satyajit Banerjee , Shyam Mohan , Jaivardhan Sinha
发明人： Satyajit Banerjee , Shyam Mohan , Jaivardhan Sinha
IPC分类号： G01N21/88
CPC分类号： G01N21/8806 , G01N21/21 , G01N27/82 , G01N27/90 , G01N2021/218 , G01R33/032 , G01R33/0322
摘要： Systems and methods for imaging characteristics of a sample and for identifying regions of damage in the sample are generally described. Some example systems and methods for non-destructive evaluation of regions of material may operate in a direct current (DC) mode in which the system directly images regions of material where weak structural damage has occurred by imaging a self magnetic field generated by a DC electric current coupled through the material. Some example systems may operate in an alternating current (AC) mode to image regions of material where damage has occurred by generating a time varying magnetic field due to AC excitation coils inducing eddy currents in the sample, and imaging a magnetic field generated by the eddy currents around the regions of damage. The systems may use magneto-optical imaging techniques (MOI) to measure and map the magnetic field and channels of current flow in the material, for example.
摘要翻译：通常描述用于成像样本特征和用于识别样品中的损伤区域的系统和方法。用于材料区域的非破坏性评估的一些示例性系统和方法可以在直流（DC）模式中操作，其中系统通过对由DC电产生的自身磁场进行成像直接成像发生了弱结构损伤的材料区域电流通过材料耦合。一些示例性系统可以以交流（AC）模式操作，以通过由于AC励磁线圈引起样品中的涡流而产生由时间变化的磁场来对材料的区域进行成像，并且对由涡流产生的磁场进行成像周围地区的电流损坏。例如，这些系统可以使用磁光成像技术（MOI）来测量和映射材料中的电流的磁场和通道。

6. 发明授权

US08107075B2 Optical characteristic measuring apparatus and optical characteristics measuring method 有权
标题翻译：光学特性测量仪器和光学特性测量方法
公开(公告)号：US08107075B2
公开(公告)日：2012-01-31
申请号：US11887410
申请日：2006-03-17
申请人： Yukitoshi Otani , Toshitaka Wakayama
发明人： Yukitoshi Otani , Toshitaka Wakayama
IPC分类号： G01J4/00
CPC分类号： G01N21/23 , G01N2021/218
摘要： An optical characteristic measuring apparatus includes an optical system 10 including first and second carrier retarders 24 and 32 having the retardations being known and differing from each other. The optical characteristic measuring apparatus performs: a spectrum extraction process of extracting a plurality of spectral peaks from a frequency spectrum obtained by analyzing a light intensity signal detected by light-receiving/spectroscopic means; and an optical characteristic element calculation process of calculating an optical characteristic element representing optical characteristics of a measurement target based on the spectral peaks and the retardations of the first and second carrier retarders.
摘要翻译：光学特性测量装置包括光学系统10，该光学系统10包括第一和第二载体延迟器24和32，其具有已知的并且彼此不同的延迟。光学特性测量装置执行：从通过分析由光接收/分光装置检测的光强度信号获得的频谱中提取多个频谱峰值的频谱提取处理; 以及基于第一和第二载波延迟器的频谱峰值和延迟来计算表示测量对象的光学特性的光学特征元素的光学特征元素计算处理。

7. 发明授权

US07286229B1 Detecting multi-domain states in perpendicular magnetic media 有权
标题翻译：在垂直磁介质中检测多畴状态
公开(公告)号：US07286229B1
公开(公告)日：2007-10-23
申请号：US11220045
申请日：2005-09-06
申请人： Steven W. Meeks
发明人： Steven W. Meeks
IPC分类号： G01J4/00
CPC分类号： G01N21/21 , G01B11/0641 , G01B11/303 , G01N21/8422 , G01N21/9501 , G01N21/9503 , G01N2021/218
摘要： In one embodiment a system to detect multi-domain regions in the soft under layer of a perpendicular magnetic media comprises a radiation targeting assembly to target a polarized radiation beam onto a surface of a substrate covered by the soft under layer of a perpendicular magnetic media, a radiation collecting assembly that collects radiation reflected from the surface, a processor coupled to the first radiation collecting assembly, and a memory module coupled to the processor. The memory module comprises logic instructions which, when executed by the processor, configure the processor to record signal values from radiation reflected by the radiation beam at different positions on the surface and analyze the signal values to detect a region of multiple magnetic domains in the soft under layer of a perpendicular magnetic media.
摘要翻译：在一个实施例中，用于检测垂直磁介质的软底层中的多畴区域的系统包括辐射瞄准组件，以将偏振辐射束对准到由垂直磁性介质的软底层覆盖的衬底的表面上，收集从表面反射的辐射的辐射收集组件，耦合到第一辐射收集组件的处理器以及耦合到处理器的存储器模块。所述存储器模块包括逻辑指令，所述逻辑指令在由所述处理器执行时将所述辐射束反射的辐射的信号值配置在所述表面上的不同位置处，并且分析所述信号值以检测所述软的多个磁畴的区域垂直磁性介质下层。

8. 发明申请

US20070236686A1 Rubbing Angle-Measuring Equipment, and Manufacturing Methods of Liquid Crystal Display Device and Optical Film 有权
标题翻译：摩擦角度测量设备，以及液晶显示器件和光学膜的制造方法
公开(公告)号：US20070236686A1
公开(公告)日：2007-10-11
申请号：US11693755
申请日：2007-03-30
申请人： ATSUSHI KISHIOKA
发明人： ATSUSHI KISHIOKA
IPC分类号： G01J4/00 , G01B1/00
CPC分类号： G01N21/21 , G01N2021/218 , G01N2021/9513 , G02F1/133784
摘要： A rubbing angle measuring equipment of the invention includes an light source unit, a measuring optical system, an imaging means, and an image evaluation means in which the measuring optical system is adapted such that a light from the light source unit passes by way of an illumination optical system and a polarizer to a rubbed measuring object and further passes by way of an analyzer and a focusing optical system to the imaging means, and the surface of the measuring object is focused to the imaging means, and in which image signals obtained by the imaging means are transmitted to the image evaluation means where signals having an intense periodicity in the image are detected, to measure the rubbing angle of the measuring object in a nondestructive manner, within a short period and at a high accuracy of 0.1° or more.
摘要翻译：本发明的摩擦角测量装置包括光源单元，测量光学系统，成像装置和图像评估装置，其中测量光学系统适于使得来自光源单元的光通过照明光学系统和偏振器到摩擦测量对象，并且通过分析器和聚焦光学系统进一步通过成像装置，并且将测量对象的表面聚焦到成像装置，并且其中由成像装置被传送到图像评估装置，在该图像评估装置中检测到图像中具有强烈周期性的信号，在短时间内以0.1度以上的高精度测量测量对象的摩擦角度，以非破坏性的方式。

9. 发明授权

US5838453A Apparatus and method for measuring optical anisotropy 失效
标题翻译：用于测量光学各向异性的装置和方法
公开(公告)号：US5838453A
公开(公告)日：1998-11-17
申请号：US590814
申请日：1996-01-24
申请人： Yoshinori Ohsaki , Takashi Suzuki
发明人： Yoshinori Ohsaki , Takashi Suzuki
IPC分类号： G01N21/21 , G01N21/55 , G01J4/00
CPC分类号： G01N21/21 , G01N2021/212 , G01N2021/218
摘要： An apparatus for measuring an optical anisotropy of an object to be examined, such as a liquid crystal, based on an interaction of an evanescent wave occurring during total reflection of a beam with the object is disclosed. The apparatus includes a transparent member having a curved surface and a flat surface for mounting an object to be examined thereon; a light source disposed opposite to a first region of the curved surface of the transparent member so as to emit a beam incident through the first region and the transparent member to an outer surface of the object; a polarizer disposed on the emission side of the light source; an incident optical system disposed between the light source and the first region of the curved surface; a photodetector disposed opposite to a second region of the curved surface of the transparent member so as to detect a beam emitted from the light source, totally reflected at a proximity of the outer surface of the object and incident thereto through the second region; and an analyzer disposed between the photodetector and the second region of the curved surface. The object to be examined may be mounted movably on the flat surface of the transparent member via a liquid having a refractive index almost equal to that of the transparent member.
摘要翻译：本发明公开了一种用于测量待检测物体（诸如液晶）的光学各向异性的装置，其基于在与物体的全反射期间发生的ev逝波的相互作用。该装置包括具有弯曲表面的透明构件和用于安装待检测物体的平坦表面; 与所述透明构件的所述曲面的第一区域相对设置的光源，以将通过所述第一区域入射的光束和所述透明构件发射到所述物体的外表面; 设置在所述光源的发射侧的偏振器; 入射光学系统，设置在所述光源与所述曲面的所述第一区域之间; 光检测器，与所述透明构件的所述曲面的第二区域相对设置，以便检测从所述光源发射的光束，所述光束在所述物体的外表面附近经由所述第二区域被入射到其附近; 以及设置在光电检测器和曲面的第二区域之间的分析器。待检查的物体可以经由具有与透明构件的折射率几乎相同的折射率的液体可移动地安装在透明构件的平坦表面上。

10. 发明授权

US4866264A Method and apparatus for measuring non-reciprocal loss of thin magnetic films and magnetic mirrors 失效
标题翻译：用于测量薄磁膜和磁镜的不可逆损耗的方法和装置
公开(公告)号：US4866264A
公开(公告)日：1989-09-12
申请号：US265390
申请日：1988-10-31
申请人： V. Warren Biricik , Frank R. Nakatsukasa
发明人： V. Warren Biricik , Frank R. Nakatsukasa
IPC分类号： G01N21/21
CPC分类号： G01N21/211 , G01N2021/218
摘要： Method and apparatus for high accuracy measurement of non-reciprocal reflectivity of magnetic thin film materials and magnetic mirrors. An ellipsometer which employs a Helmholtz coil to supply magneto-optic modulation to p-polarized light and an acousto-optic modulator to provide intensity modulation is utilized in conjunction with a novel scheme of analyzer rotation and computational techniques to accurately measure non-reciprocal reflectivity. A microcomputer is used to provide controlled rotation of polarizing elements, data logging, data analysis, and output. The non-reciprocal reflectivity value is determined by the slope of the measured ratio of magneto-optically modulated and absolute intensities (.delta.I.sub.magnetic /I.sub.total), plotted against a function of the analyzer angle G(.PSI.).
摘要翻译：用于高精度测量磁性薄膜材料和磁性反射镜的非互易反射率的方法和装置。结合使用分析仪旋转和计算技术的新方案来准确地测量非互逆反射率，利用了使用亥姆霍兹线圈向p偏振光提供磁光调制并提供强度调制的声光调制器的椭偏仪。微机用于提供极化元件的受控旋转，数据记录，数据分析和输出。非相互反射率值由测量的磁光调制比和绝对强度的比值（delta Imagnetic / Itotal）决定，相对于分析仪角度G（PSI）的函数。

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