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    • 48. 发明授权
    • CMP of copper/ruthenium substrates
    • 铜/钌基板的CMP
    • US07265055B2
    • 2007-09-04
    • US11259645
    • 2005-10-26
    • Christopher C. ThompsonVlasta BrusicRenjie Zhou
    • Christopher C. ThompsonVlasta BrusicRenjie Zhou
    • H01L21/302
    • H01L21/3212C09G1/02C23F3/04
    • The invention provides a method of chemically-mechanically polishing a substrate. A substrate comprising ruthenium and copper is contacted with a chemical-mechanical polishing system comprising a polishing component, hydrogen peroxide, an organic acid, at least one heterocyclic compound comprising at least one nitrogen atom, and water. The polishing component is moved relative to the substrate, and at least a portion of the substrate is abraded to polish the substrate. The pH of the polishing system is about 6 to about 12, the ruthenium and copper are in electrical contact, and the difference between the open circuit potential of copper and the open circuit potential of ruthenium in the polishing system is about 50 mV or less.
    • 本发明提供了一种化学机械抛光衬底的方法。 包含钌和铜的基材与包括抛光组分,过氧化氢,有机酸,至少一种包含至少一个氮原子的杂环化合物和水的化学机械抛光系统接触。 抛光组分相对于基底移动,并且研磨衬底的至少一部分以抛光衬底。 抛光系统的pH为约6至约12,钌和铜电接触,并且抛光系统中铜的开路电位与钌的开路电位之间的差为约50mV或更小。
    • 50. 发明授权
    • CMP of noble metals
    • 贵金属的CMP
    • US07160807B2
    • 2007-01-09
    • US10610407
    • 2003-06-30
    • Francesco De Rege ThesauroVlasta BrusicBenjamin P. Bayer
    • Francesco De Rege ThesauroVlasta BrusicBenjamin P. Bayer
    • H01L21/461H01L21/302
    • C09G1/02C23F3/00H01L21/3212
    • The invention provides a method of polishing a substrate comprising (i) contacting a substrate comprising a noble metal layer with a chemical-mechanical polishing system comprising (a) a polishing component, (b) an oxidizing agent, and (c) a liquid carrier, and (ii) abrading at least a portion of the noble metal layer to polish the substrate. The polishing component is selected from the group consisting of an abrasive, a polishing pad, or a combination thereof, and the oxidizing agent is selected from the group consisting of bromates, bromites, hypobromites, chlorates, chlorites, hypochlorites, perchlorates, iodates, hypoiodites, periodates, peroxyacetic acid, organo-halo-oxy compounds, salts thereof, and combinations thereof. The chemical-mechanical polishing system has a pH of about 9 or less, and the oxidizing agent does not produce a substantial amount of elemental halogen. The invention also provides a method of polishing a substrate comprising a noble metal layer and a second layer using the aforementioned polishing system that further comprises a stopping compound.
    • 本发明提供了一种抛光衬底的方法,其包括(i)使包含贵金属层的衬底与化学机械抛光系统接触,所述化学机械抛光系统包括(a)抛光组分,(b)氧化剂和(c)液体载体 ,和(ii)研磨贵金属层的至少一部分以抛光基底。 抛光组分选自研磨剂,抛光垫或其组合,氧化剂选自溴酸盐,溴酸盐,次溴酸盐,氯酸盐,亚氯酸盐,次氯酸盐,高氯酸盐,碘酸盐,次碘酸盐 ,高碘酸酯,过氧乙酸,有机卤代氧化合物,其盐,及其组合。 化学机械抛光系统的pH值约为9或更低,氧化剂不产生大量的元素卤素。 本发明还提供了一种使用上述抛光系统抛光包含贵金属层和第二层的衬底的方法,所述抛光系统还包括停止化合物。