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    • 36. 发明授权
    • Tunable clock system
    • 可调时钟系统
    • US09124256B2
    • 2015-09-01
    • US14589444
    • 2015-01-05
    • Laurence H. Cooke
    • Laurence H. Cooke
    • H03K3/00H03K5/13H03K5/00
    • H03K5/15H03K5/131H03K5/133H03K5/15013H03K2005/00065H03K2005/00247
    • A memory-like structure composed of variable resistor elements for use in tuning respective branches and leaves of a clock distribution structure, which may be used to compensate for chip-by-chip and/or combinatorial logic path-by-path delay variations, which may be due, for example, to physical variations in deep submicron devices and interconnections, is presented. A single system clocked scan flip-flop with the capability to perform delay test measurements is also presented. Methods for measuring combinatorial logic path delays to determine the maximum clock frequency and delays to program the variable resistors, as well as methods for calibrating and measuring the programmed variable resistors, are also presented.
    • 由可变电阻器元件组成的存储器状结构,用于调整时钟分配结构的相应分支和叶片,其可用于补偿逐芯片和/或组合逻辑逐个路径延迟变化,其中 可能是因为例如深亚微米器件和互连中的物理变化。 还提供了具有执行延迟测试测量功能的单个系统时钟扫描触发器。 还提出了用于测量组合逻辑路径延迟以确定最大时钟频率和编程可变电阻器的延迟的方法,以及用于校准和测量编程的可变电阻器的方法。
    • 37. 发明申请
    • TUNABLE CLOCK SYSTEM
    • 时钟系统
    • US20150109039A1
    • 2015-04-23
    • US14589444
    • 2015-01-05
    • Laurence H. COOKE
    • Laurence H. COOKE
    • H03K5/13
    • H03K5/15H03K5/131H03K5/133H03K5/15013H03K2005/00065H03K2005/00247
    • A memory-like structure composed of variable resistor elements for use in tuning respective branches and leaves of a clock distribution structure, which may be used to compensate for chip-by-chip and/or combinatorial logic path-by-path delay variations, which may be due, for example, to physical variations in deep submicron devices and interconnections, is presented. A single system clocked scan flip-flop with the capability to perform delay test measurements is also presented. Methods for measuring combinatorial logic path delays to determine the maximum clock frequency and delays to program the variable resistors, as well as methods for calibrating and measuring the programmed variable resistors, are also presented.
    • 由可变电阻器元件组成的存储器状结构,用于调整时钟分配结构的相应分支和叶片,其可用于补偿逐芯片和/或组合逻辑逐个路径延迟变化,其中 可能是因为例如深亚微米器件和互连中的物理变化。 还提供了具有执行延迟测试测量功能的单个系统时钟扫描触发器。 还提出了用于测量组合逻辑路径延迟以确定最大时钟频率和编程可变电阻器的延迟的方法,以及用于校准和测量编程的可变电阻器的方法。