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31. 发明申请

US20160313390A1 SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCUIT DEVICE WITH WHIRLWIND COLD PLATE 审中-公开
标题翻译：用于将测试工具结合到具有四边形冷板的集成电路器件的系统和方法
公开(公告)号：US20160313390A1
公开(公告)日：2016-10-27
申请号：US15136768
申请日：2016-04-22
申请人： ESSAI, INC.
发明人： Nasser Barabi , Chee Wah Ho , Joven R. Tienzo , Oksana Kryachek , Elena V. Nazarov
IPC分类号： G01R31/28 , F28D15/00 , F28F9/02 , F28F13/02 , F28F3/12 , F28F27/02 , F28F13/12
CPC分类号： G01R31/2874 , G01R1/0458 , G01R1/0466 , H01L2224/16225 , H01L2924/15311 , H01L2924/3511
摘要： A thermal control unit used to maintain a set point temperature on an integrated circuit device under test, has at least one cooling plate configured to facilitate the testing of integrated circuits where the device under test requires efficient cooling.
摘要翻译：用于保持被测集成电路设备上的设定点温度的热控制单元具有至少一个冷却板，其被配置为便于测试被测器件需要有效冷却的集成电路。

32. 发明授权

US09459283B2 Contact test device 有权
标题翻译：接触测试装置
公开(公告)号：US09459283B2
公开(公告)日：2016-10-04
申请号：US13990186
申请日：2011-11-16
申请人： Hiroyuki Tomioka
发明人： Hiroyuki Tomioka
IPC分类号： G01R1/067 , G01R1/04 , H01R13/24
CPC分类号： G01R1/06711 , G01R1/0466 , G01R1/06722 , G01R1/06738 , H01R13/24 , H01R2201/20
摘要： A probe is fitted into cylindrical retaining holes formed in an upper block and a lower block. A plunger of the probe has a plate-like guide portion, and an edge contact portion. A bottomed one of the cylindrical retaining holes is formed in the upper block from a lower part thereof and a guide groove is formed from an upper surface thereof. The plate-like guide portion is movably guided vertically while being prevented from turning and slipping out by the guide groove.
摘要翻译：将探头装配到形成在上部块和下部块中的圆柱形保持孔中。探针的柱塞具有板状引导部和边缘接触部。圆柱形保持孔中的底部一个从其下部形成在上部块中，并且从其上表面形成引导槽。板状引导部分被可移动地垂直地引导，同时被引导槽防止转动和滑出。

33. 发明授权

US09429592B2 Connector 有权
标题翻译：连接器
公开(公告)号：US09429592B2
公开(公告)日：2016-08-30
申请号：US14494676
申请日：2014-09-24
申请人： FUJITSU COMPONENT LIMITED
发明人： Tetsugaku Tanaka , Koki Sato , Mitsuru Kobayashi
IPC分类号： G01R31/20 , G01R1/067 , G01R1/04 , H01R13/24 , G01R1/073
CPC分类号： G01R1/06733 , G01R1/0466 , G01R1/07314 , H01R13/2428 , H01R2201/20
摘要： A connector includes a connector case and probe pins that are arranged two-dimensionally in the connector case. Each of the probe pins includes a housing, a first contact terminal disposed at one end of the housing, a second contact terminal disposed at another end of the housing, and plural bent parts formed in the housing and protruding outward from a surface of the housing. The connector case includes through holes. Each of the through holes accommodates the probe pin and includes grooves that are formed in its inner surface and correspond to the bent parts. The grooves of each through hole face substantially the same directions as the grooves of other through holes.
摘要翻译：连接器包括连接器壳体和在连接器壳体中二维布置的探针。每个探针包括壳体，设置在壳体的一端的第一接触端子，设置在壳体的另一端的第二接触端子和形成在壳体中并且从壳体的表面向外突出的多个弯曲部分。连接器壳体包括通孔。每个通孔容纳探针，并且包括形成在其内表面中并对应于弯曲部分的凹槽。每个通孔的槽面与其他通孔的槽大致相同的方向。

34. 发明授权

US09410986B2 Testing jig 有权
标题翻译：测试夹具
公开(公告)号：US09410986B2
公开(公告)日：2016-08-09
申请号：US14557879
申请日：2014-12-02
申请人： MPI CORPORATION
发明人： Wei-Cheng Ku , Hao Wei , Chia-Nan Chou , Chih-Hao Ho
IPC分类号： G01R1/04
CPC分类号： G01R1/0466
摘要： A testing jig includes a substrate, a carrier provided on the substrate, two conductive members made of a conductive material, and a compensation member made of a conductive material. The substrate has a signal circuit and a grounding circuit thereon. The carrier has a base board made of an insulating material and a conductive circuit made of a conductive material provided thereon. The base board has a signal perforation aligning with the signal circuit, a grounding perforation aligning with the grounding circuit, and multiple compensation holes. The conductive members both have an end exposed out of the carrier, and are respectively fitted in the signal perforation and the grounding perforation to make another end thereof contact the signal circuit or the grounding circuit. The compensation member is fitted in one of the compensation holes to be electrically connected to the conductive member in the grounding perforation through the conductive circuit.
摘要翻译：测试夹具包括衬底，设置在衬底上的载体，由导电材料制成的两个导电构件和由导电材料制成的补偿构件。衬底上具有信号电路和接地电路。载体具有由绝缘材料制成的基板和设置在其上的由导电材料制成的导电电路。基板具有与信号电路对准的信号穿孔，与接地电路对准的接地穿孔，以及多个补偿孔。导电构件都具有暴露在载体外的端部，并且分别装配在信号穿孔和接地穿孔中，以使另一端与信号电路或接地电路接触。补偿部件安装在一个补偿孔中，以通过导电电路与接地穿孔中的导电部件电连接。

35. 发明授权

US09368889B2 Socket for reducing size and operating force 有权
标题翻译：用于减小尺寸和操作力的插座
公开(公告)号：US09368889B2
公开(公告)日：2016-06-14
申请号：US14566760
申请日：2014-12-11
申请人： Sensata Technologies Massachusetts Incorporated
发明人： Hideki Sano
IPC分类号： H05K1/00 , H01R12/71 , G01R1/04 , H05K7/10 , H01R13/627 , H01R13/629
CPC分类号： H01R12/714 , G01R1/0466 , G01R1/0483 , H01R13/6273 , H01R13/62905 , H05K7/1061
摘要： A socket according to the present invention comprises a base member for holding a plurality of contacts, a cover member and a latch mechanism for pressing a semiconductor package. A latch member has a pressing portion, a link member connected to the cover member and pressing portion of the latch member, a lever member rotatably fixed to the base member and connected with the cover member at a first end and with a narrow portion of the cover member at a second end. The link member and the lever member cause the pressing portion of the latch member to move to an evacuated position when the cover member moves in a direction to be close to the base member, while the link member and the lever member cause the pressing portion of the latch member to move to a position where an electronic device can be pressed.
摘要翻译：根据本发明的插座包括用于保持多个触点的基座构件，盖构件和用于按压半导体封装的闩锁机构。闩锁构件具有按压部分，连接到盖构件的连杆构件和闩锁构件的按压部分，杠杆构件可旋转地固定到基部构件并且在第一端处与盖构件连接，并且具有狭窄的部分盖件在第二端。连杆构件和杆构件使得当构件沿着靠近基部构件的方向移动时，闩锁构件的按压部分移动到抽空位置，同时连杆构件和杆构件使按压部分闩锁构件移动到可以按压电子装置的位置。

36. 发明授权

US09354251B2 Integrated circuit (IC) test socket using Kelvin bridge 有权
标题翻译：使用开尔文桥的集成电路（IC）测试插座
公开(公告)号：US09354251B2
公开(公告)日：2016-05-31
申请号：US14189787
申请日：2014-02-25
申请人： Titan Semiconductor Tool, LLC
发明人： Victor Landa , Pongsak Tiengtum
IPC分类号： G01R1/04 , G01R31/28
CPC分类号： G01R1/0466 , G01R31/2851
摘要： An integrated circuit test socket is adapted to use with Kelvin connectors by creating closely spaced connectors and counter-rotating links that are nested to conserve space. The connectors are shaped to make contact with a chip and communicate force and sense signals to a tester, allowing a measure of the chip's actual resistance.
摘要翻译：集成电路测试插座适用于开尔文连接器，通过创建紧密间隔的连接器和嵌套的反向旋转链接来节省空间。连接器被成形为与芯片接触并且传递力并将信号传感到测试器，从而允许测量芯片的实际电阻。

37. 发明授权

US09341649B1 On-center electrically conductive pins for integrated testing 有权
标题翻译：用于集成测试的中心导电引脚
公开(公告)号：US09341649B1
公开(公告)日：2016-05-17
申请号：US14212168
申请日：2014-03-14
申请人： Johnstech International Corporation
发明人： David Johnson , John Nelson , Sarosh Patel , Michael Andres
IPC分类号： G01R31/00 , G01R1/073
CPC分类号： G01R1/0466
摘要： A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper (30) and lower (32) section and a hinge (44/46) in between which allow flex of both upper and lower contact (24/26) which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability.
摘要翻译：公开了一种用于在被测器件（DUT）和提供轴向对准的上下接触点的负载板之间提供接触针的结构和方法。销具有上部（30）和下部（32）部分以及在其间允许上部和下部接触（24/26）的挠曲的铰链（44/46），但是该轴向对准可以直接替代 POGO引脚，但具有更高的可靠性。

38. 发明申请

US20160132379A1 Storage Device Calibration Methods and Controlling Device Using the Same 有权
标题翻译：存储设备校准方法及使用其的控制设备
公开(公告)号：US20160132379A1
公开(公告)日：2016-05-12
申请号：US14535335
申请日：2014-11-07
申请人： MEDIATEK INC.
发明人： Chun-Liang Chen
IPC分类号： G06F11/07 , G06F11/14
CPC分类号： G06F11/0772 , G01R1/0466 , G01R1/0491 , G01R31/043 , G01R31/265 , G01R31/2868 , G01R31/2874 , G01R31/318511 , G06F11/00 , G06F11/0787 , G06F11/1492 , G06F11/22 , G11C11/00 , G11C29/00 , G11C29/023 , G11C29/028 , G11C29/44 , H04L1/00
摘要： A calibration method includes transmitting first data comprising a calibration data and a first checksum to the storage device according to each of a plurality of training parameter sets; recording a plurality of error indicators respectively which are corresponding to the plurality of training parameter sets and from the storage device; and identifying one of the plurality of training parameter sets as a predetermined parameter set according to the plurality of error indicators respectively corresponding to the plurality of training parameter sets; wherein each error indicator indicates whether transmitting the first data according to the corresponded training parameter set is successful.
摘要翻译：校准方法包括根据多个训练参数组中的每一个将包括校准数据和第一校验和的第一数据发送到存储设备; 分别记录与所述多个训练参数组对应的多个误差指示符和所述存储装置; 根据与多个训练参数组对应的多个误差指示符，将多个训练参数组中的一个识别为预定参数集; 其中每个错误指示符指示是否成功地根据对应的训练参数集发送第一数据。

39. 发明申请

US20160072202A1 PROBE PIN AND ELECTRONIC DEVICE USING THE SAME 有权
标题翻译：探针和电子设备使用它
公开(公告)号：US20160072202A1
公开(公告)日：2016-03-10
申请号：US14787518
申请日：2014-07-18
申请人： OMRON CORPORATION
发明人： Yoshinobu Hemmi , Takahiro Sakai , Hirotada Teranishi
IPC分类号： H01R4/48
CPC分类号： H01R4/48 , G01R1/0466 , G01R1/06722 , H01R13/2421 , H01R13/2471 , H01R2201/20
摘要： A probe pin has a coil spring having a first end and a second end, a first plunger having a major portion, and a first elastic extension and a second elastic extension that from the major portion in the same direction, and a second plunger forcedly inserted between the first and the second elastic extensions. The first and the second plungers have electric conductivity. The first and the second plungers are inserted from the first and second ends of the coil spring, respectively, so that the first and the second elastic extensions of the first plunger hold the second plunger with the first elastic extension making a forced contact with a surface of the second plunger to form thereat an electric connection between the first and the second plungers.
摘要翻译：探针具有螺旋弹簧，其具有第一端和第二端，具有主要部分的第一柱塞以及从相同方向上的主要部分的第一弹性延伸部和第二弹性延伸部以及强制插入的第二柱塞在第一和第二弹性延伸部之间。第一和第二柱塞具有导电性。第一和第二柱塞分别从螺旋弹簧的第一和第二端插入，使得第一柱塞的第一和第二弹性延伸部保持第二柱塞，第一弹性延伸部与表面强制接触的第二柱塞在第一和第二柱塞之间形成电连接。

40. 发明申请

US20160061861A1 TEST SOCKET FOR SEMICONDUCTOR DEVICE AND TEST DEVICE INCLUDING THE SAME 审中-公开
标题翻译：用于半导体器件的测试插座和包括其的测试装置
公开(公告)号：US20160061861A1
公开(公告)日：2016-03-03
申请号：US14716344
申请日：2015-05-19
申请人： Mi-so KIM , Jong-won HAN
发明人： Mi-so KIM , Jong-won HAN
IPC分类号： G01R1/04 , G01R31/28
CPC分类号： G01R1/0466 , G01R31/2863
摘要： Provided are a test socket for a semiconductor device and a test device including the test socket. The test device includes a test socket including terminals arranged in a two-dimensional array and corresponding to terminals of the semiconductor device and a ground line extending along at least one row of two-dimensional array; and a substrate electrically connected to the test socket so as to transmit and receive a test signal. The test socket includes a ground line extending along at least one row of the two-dimensional array.
摘要翻译：提供了一种用于半导体器件的测试插座和包括测试插座的测试装置。测试装置包括测试插座，其包括以二维阵列布置并对应于半导体器件的端子的端子和沿着至少一行二维阵列延伸的接地线; 以及电连接到测试插座以便发送和接收测试信号的基板。测试插座包括沿着至少一行二维阵列延伸的接地线。

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