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    • 33. 发明申请
    • SEMICONDUCTOR DEVICE
    • 半导体器件
    • US20080049481A1
    • 2008-02-28
    • US11877310
    • 2007-10-23
    • Satoru HanzawaTakeshi SakataKazuhiko Kajgaya
    • Satoru HanzawaTakeshi SakataKazuhiko Kajgaya
    • G11C15/00
    • G11C15/04G11C15/043
    • The range-specified IP addresses are effectively stored to reduce the number of necessary entries thereby the memory capacity of TCAM is improved. The representative means of the present invention is that: the storage information (entry) and the input information (comparison information or search key) are the common block code such that any bit must be the logical value ‘1’; Match-lines are hierarchically structured and memory cells are arranged at the intersecting points of a plurality of sub-match lines and a plurality of search lines; Further the sub-match lines are connected to main-match lines through the sub-match detectors, respectively and main-match detectors are arranged on the main-match lines.
    • 有效存储范围指定的IP地址,以减少必要条目的数量,从而提高TCAM的存储容量。 本发明的代表性手段是:存储信息(条目)和输入信息(比较信息或搜索关键字)是公共块码,使得任何位必须是逻辑值“1”; 匹配线是分层结构的,并且存储器单元被布置在多个子匹配线和多条搜索线的交叉点处; 此外,子匹配线分别通过子匹配检测器连接到主匹配线,并且主匹配检测器被布置在主匹配线上。
    • 37. 发明授权
    • Semiconductor memory device equipped with dummy cells
    • 装有虚拟电池的半导体存储器件
    • US06683813B2
    • 2004-01-27
    • US10315938
    • 2002-12-11
    • Satoru HanzawaTakeshi Sakata
    • Satoru HanzawaTakeshi Sakata
    • G11C702
    • G11C11/4099G11C7/14
    • There are provided a reference voltage generating method used for reading out operation of a memory cell having amplification ability, and a dummy cell. The memory cell is comprised of a read NMOS transistor, a write transistor, and a coupled-capacitance. The dummy cell is made such that two memory cells are connected in series. The dummy cell is arranged at the most far end of each of the data lines against the sense amplifier. A reference voltage is generated by making a difference in an amount of current flowing in each of the read NMOS transistors of the memory cell and the dummy cell. As a result, DRAM showing a higher speed, a higher integration and a lower electrical power as compared with those of the prior art device can be realized.
    • 提供了用于读出具有放大能力的存储单元的操作的参考电压产生方法和虚拟单元。 存储单元包括读取NMOS晶体管,写入晶体管和耦合电容。 虚拟单元被制成使得两个存储单元串联连接。 每个数据线的最远端布置在相对于读出放大器的虚拟单元。 通过使存储单元的读取NMOS晶体管和虚设单元中的每一个中流动的电流量的差异来产生参考电压。 结果,可以实现与现有技术的装置相比显示更高速度,更高集成度和更低电力的DRAM。
    • 39. 发明授权
    • Phase control circuit, semiconductor device and semiconductor memory
    • 相位控制电路,半导体器件和半导体存储器
    • US06205086B1
    • 2001-03-20
    • US09560724
    • 2000-04-28
    • Satoru HanzawaTakeshi SakataOsamu Nagashima
    • Satoru HanzawaTakeshi SakataOsamu Nagashima
    • G11C800
    • G11C7/1057G11C7/1051G11C7/22G11C7/222
    • A phase control circuit comprises a plurality of fixed delay circuits (200-0 through 200-5) which assign different predetermined delay times to a first clock signal (BDA1) respectively, a detection circuit (201) which receives clock signals outputted from the plurality of fixed delay circuits and a second clock signal (PCLK) different in phase from the first clock signal therein and generates detected signals (202) represented in a plurality of bits each corresponding to the difference in phase between the first clock signal and the second clock signal, and a variable delay circuit (200-6) which gives a delay in the phase difference corresponding to each of the detected signals to a third clock signal (BDA2).
    • 相位控制电路包括分别向第一时钟信号(BDA1)分配不同的预定延迟时间的多个固定延迟电路(200-0至200-5);接收从多个时钟信号输出的时钟信号的检测电路(201) 的固定延迟电路和与其中的第一时钟信号不同的第二时钟信号(PCLK),并产生以多个位表示的检测信号(202),每个位对应于第一时钟信号和第二时钟之间的相位差 信号和可变延迟电路(200-6),其将与每个检测到的信号相对应的相位差延迟到第三时钟信号(BDA2)。