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    • 32. 发明授权
    • Short bridge phase change memory cells
    • 短桥相变存储单元
    • US07825397B2
    • 2010-11-02
    • US12125970
    • 2008-05-23
    • Haiwen XiSong S. Xue
    • Haiwen XiSong S. Xue
    • H01L45/00
    • H01L45/16H01L27/2436H01L45/06H01L45/1226H01L45/1253H01L45/144
    • Random access memory cells having a short phase change bridge structure and methods of making the bridge structure via shadow deposition. The short bridge structure reduces the heating efficiency needed to switch the logic state of the memory cell. In one particular embodiment, the memory cell has a first electrode and a second electrode with a gap therebetween. The first electrode has an end at least partially non-orthogonal to the substrate and the second electrode has an end at least partially non-orthogonal to the substrate. A phase change material bridge extends over at least a portion of the first electrode, over at least a portion of the second electrode, and within the gap. An insulative material encompasses at least a portion of the phase change material bridge.
    • 具有短相变桥结构的随机存取存储单元和通过阴影沉积制造桥结构的方法。 短桥结构降低了切换存储单元的逻辑状态所需的加热效率。 在一个特定实施例中,存储单元具有第一电极和在其之间具有间隙的第二电极。 第一电极具有至少部分地与衬底非正交的端部,并且第二电极具有至少部分地与衬底非正交的端部。 相变材料桥在第一电极的至少一部分上延伸到第二电极的至少一部分上,并在间隙内延伸。 绝缘材料包含相变材料桥的至少一部分。
    • 35. 发明申请
    • WRITE VERIFY METHOD FOR RESISTIVE RANDOM ACCESS MEMORY
    • 用于电阻随机访问存储器的写作验证方法
    • US20090290411A1
    • 2009-11-26
    • US12123647
    • 2008-05-20
    • Haiwen XiSong S. Xue
    • Haiwen XiSong S. Xue
    • G11C11/00
    • G11C13/0069G11C11/5664G11C11/5685G11C13/0007G11C13/0014G11C13/0016G11C13/0064G11C2013/0073G11C2211/5621G11C2213/31G11C2213/32
    • Write verify methods for resistance random access memory (RRAM) are disclosed. The methods include applying a reset operation voltage pulse across a RRAM cell to change a resistance of the RRAM cell from a low resistance state to a high resistance state and setting a counter to zero. Then the method includes applying a forward resetting voltage pulse across the RRAM cell if the RRAM cell has a high resistance state resistance value less than a selected lower resistance limit value and adding one to the counter. This step is repeated until either the counter reaches a predetermined number or until the high resistance state resistance value is greater than the lower resistance limit value. The method also includes applying a reverse resetting voltage pulse across the RRAM cell if the RRAM cell has a high resistance state resistance values is greater than a selected upper resistance limit value and adding one to the counter. The reverse resetting voltage pulse has a second polarity being opposite the first polarity. This step is repeated until either the counter reaches a predetermined number or until all the high resistance state resistance value is less than the upper resistance limit value.
    • 公开了电阻随机存取存储器(RRAM)的写验证方法。 所述方法包括在RRAM单元之间施加复位操作电压脉冲,以将RRAM单元的电阻从低电阻状态改变为高电阻状态,并将计数器设置为零。 然后,该方法包括如果RRAM单元具有小于所选择的较低电阻极限值的高电阻状态电阻值并且将一个加到计数器上,则在RRAM单元之间施加正向复位电压脉冲。 重复该步骤直到计数器达到预定数量,或者直到高电阻状态电阻值大于下限电阻值。 该方法还包括如果RRAM单元具有高电阻状态电阻值大于所选上限电阻值并将一个加到计数器上,则在RRAM单元之间施加反向复位电压脉冲。 反向复位电压脉冲具有与第一极性相反的第二极性。 重复该步骤直到计数器达到预定数量,或者直到所有高电阻状态电阻值都小于上限电阻值。
    • 39. 发明授权
    • Spin-torque probe microscope
    • 旋转力矩探头显微镜
    • US08069492B2
    • 2011-11-29
    • US12059407
    • 2008-03-31
    • Haiwen XiSong S. Xue
    • Haiwen XiSong S. Xue
    • G01Q60/08
    • G01Q60/52G01N24/10G01R33/323
    • A spin-torque probe microscope and methods of using the same are described. The spin-torque probe microscope includes a cantilever probe body, a magnetic tip disposed at a distal end of the cantilever probe body, an electrically conductive sample disposed proximate to the magnetic tip, an electrical circuit providing a spin-polarized electron current to the electrically conductive sample, and a vibration detection element configured to sense vibration frequency of the cantilever probe body. The spin-polarized electron current is sufficient to alter a local electron spin or magnetic moment within the electrically conductive sample and be sensed by the magnetic tip.
    • 描述了自旋扭矩探针显微镜及其使用方法。 旋转扭矩探针显微镜包括悬臂探针体,设置在悬臂探头主体的远端的磁尖,靠近磁尖设置的导电样品,向电气提供自旋极化电子电流的电路 导电样品和被配置为感测悬臂探针体的振动频率的振动检测元件。 自旋极化电子电流足以改变导电样品内的局部电子自旋或磁矩,并由磁尖检测。