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    • 32. 发明授权
    • Impregnating carbonizing process and apparatus
    • 浸渍碳化工艺和设备
    • US5137755A
    • 1992-08-11
    • US656691
    • 1991-02-19
    • Takao FujikawaTakahiko Ishii
    • Takao FujikawaTakahiko Ishii
    • C04B41/82C01B31/02C01B31/04C04B35/52C04B35/83F27B17/00
    • C04B35/521C04B35/52C04B35/83
    • An impregnating carbonizing process and apparatus which permit reduction in cost of consumable goods and can operate at a reduced cost and a heating and vacuum impregnating operation which requires a very long period of time can be performed on the outside of an expensive high pressure vessel to accomplish rapid carbonization and baking. The process comprises of inserting a porous shaped body of carbon and a block of impregnant into a specimen case, discharging gas from within the specimen case, heating the impregnant into a molten condition under a reduced pressure, inserting the specimen case into a high pressure vessel, admitting high pressure gas into the high pressure vessel and also into the specimen case so as to penetrate the impregnant into the shaped body of carbon, heating the shaped body to a high temperature, and discharging the high pressure gas to lower the pressure within the specimen case at a controlled rate in response to a pressure within the high pressure vessel to carbonize the impregnant. The apparatus is constructed to suitably carry out the process.
    • 可以在昂贵的高压容器的外部进行浸渍碳化方法和装置,其允许降低消耗品的成本并且可以以降低的成本运行并且需要非常长的时间段的加热和真空浸渍操作来完成 快速碳化和烘烤。 该方法包括将多孔成形体的碳和一块浸渍剂插入样品壳体中,从样品壳体内排出气体,将浸渍剂在减压下加热到熔融状态,将样品箱插入高压容器 将高压气体进入高压容器并进入样品箱,以便将浸渍剂渗透到成型体中,将成形体加热到高温,并排出高压气体以降低内部压力 样品盒以受控的速率响应于高压容器内的压力以使浸渍剂碳化。 该装置被构造成适当地执行该过程。
    • 38. 发明授权
    • High-temperature high-pressure gas processing apparatus
    • 高温高压气体处理设备
    • US5898727A
    • 1999-04-27
    • US845822
    • 1997-04-28
    • Takao FujikawaTakahiko IshiiTomomitsu NakaiYoshihiko Sakashita
    • Takao FujikawaTakahiko IshiiTomomitsu NakaiYoshihiko Sakashita
    • F27B17/00C23C14/58H01L21/00F27D7/06
    • C23C14/5806C23C14/5886H01L21/67017
    • The present invention provides a processing apparatus for eliminating pores in via holes of a silicon semiconductor. The apparatus includes a high-pressure vessel divided into at least two vessel component members in the axial direction thereof, at least one of which has a cooling unit, a frame for holding a load acting in the axial direction of the high-pressure vessel in processing a workpiece to be processed in the high-pressure vessel, an actuator for moving the vessel component members of the high-pressure vessel in the axial direction thereof so as to load and unload the workpiece, a sealing unit fitted to a portion for loading and unloading the workpiece, which is formed when the vessel component members are moved in the axial direction of the vessel, and a retractable cotter unit for transmitting a load acting in the axial direction of the high-pressure vessel to the frame.
    • 本发明提供一种用于消除硅半导体的通孔中的孔的处理装置。 该装置包括在其轴向方向上分成至少两个容器部件的高压容器,其中至少一个具有冷却单元,用于保持在高压容器的轴向方向上作用的负载的框架 在高压容器内加工待加工的工件,用于使高压容器的容器部件沿其轴向移动以便加载和卸载工件的致动器,安装到用于装载的部分的密封单元 以及卸载当容器部件沿容器的轴向移动时形成的工件,以及用于将在高压容器的轴向方向上作用的负载传递到框架的伸缩开口单元。
    • 39. 发明授权
    • Apparatus for preparing compound single crystals
    • 复合单晶制备装置
    • US5685907A
    • 1997-11-11
    • US586825
    • 1996-01-31
    • Takao FujikawaKatsuhiro UeharaYoshihiko SakashitaKazuya SuzukiHiroshi OkadaTakao KawanakaSeiichiro Ohmoto
    • Takao FujikawaKatsuhiro UeharaYoshihiko SakashitaKazuya SuzukiHiroshi OkadaTakao KawanakaSeiichiro Ohmoto
    • C30B11/00C30B35/00
    • C30B11/00C30B29/48Y10T117/102
    • A method and apparatus for the preparation of single crystals of group II-VI compounds such as ZnSe and CdTe and group III-V compounds such as InP and GaP or of ternary compounds thereof, from which some of their components are likely to be dissociated and evaporated during crystal growth at high temperatures. Single crystals are prepared which enable the preparation of high quality compound single crystals and prevent the contamination of furnace structures. The method includes melting a source material in a container by heating in a furnace body and solidifying the melt by cooling from the bottom to grow a single crystal. The container is enclosed by an airtight chamber communicating to the outside with a pressure equalizing passage. Heating is performed while the passage is held at a low temperature equal to or lower than the melting point of a high-dissociation-pressure component of the source material. The apparatus includes a container for holding the source material, a hermetical furnace body including a heater to heat the container, an airtight chamber inside the heater which encloses the container and a pressure equalizing passage communicating with the airtight chamber and forming a lower portion of the chamber.
    • PCT No.PCT / JP95 / 01069 Sec。 371日期1996年1月31日 102(e)日期1996年1月31日PCT归档1995年6月1日PCT公布。 WO95 / 33873 PCT出版物 日期:1995年12月14日一种用于制备诸如ZnSe和CdTe的II-VI族化合物的单晶和InP和GaP的III-V族化合物或其三元化合物的方法和装置,其一些组分为 在高温下晶体生长期间可能会被解离和蒸发。 制备单晶,其可制备高质量的复合单晶并防止炉结构的污染。 该方法包括通过在炉体中加热熔化容器中的源材料并通过从底部冷却来固化熔体以生长单晶。 容器由与压力平衡通道连通的气密室封闭。 当通道保持在等于或低于源材料的高解离压分量的熔点的低温时进行加热。 该装置包括用于保持源材料的容器,包括用于加热容器的加热器的密封炉体,包围容器的加热器内的气密室和与气密室连通的压力平衡通道,并形成 房间。