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    • 31. 发明授权
    • Minimizing power noise during sensing in memory device
    • 在存储设备中感测期间最大限度地减少功率噪声
    • US07751249B2
    • 2010-07-06
    • US12163115
    • 2008-06-27
    • Seungpil LeeHao Thai NguyenMan Lung Mui
    • Seungpil LeeHao Thai NguyenMan Lung Mui
    • G11C16/26
    • G11C7/02G11C5/147G11C7/06G11C7/067G11C8/10G11C11/5642G11C16/0483G11C16/26G11C27/005G11C2207/005
    • In a sensing method, accuracy of sensing operations, such as read or verify, in a memory device is improved by avoiding fluctuations in a sense amp supply voltage which can occur when different sense amps are strobed at different times. First and second sets of sense amps perform a sensing operation on respective storage elements, such as in an all bit line configuration. The first set of sense amps is strobed at a first time point. In response, a sensed analog level is converted to digital data. The A/D conversion relies on the sense amp supply voltage being accurate. To avoid a fluctuation in the sense amp supply voltage, a bypass path allows the storage elements associated with the first set of sense amps to continue to draw power from the sense amp supply voltage. The second set of sense amps is strobed at a later, second time point.
    • 在感测方法中,通过避免当在不同时间选通不同的感测放大器时可能发生的感测放大器电源电压的波动,改进了存储器件中的读取或验证等感测操作的精度。 第一和第二组感测放大器对各个存储元件执行感测操作,例如以全位线配置。 第一组感测放大器在第一时间点选。 作为响应,将感测的模拟电平转换为数字数据。 A / D转换依赖于正确的读出放大器电源电压。 为了避免感测放大器电源电压的波动,旁路通路允许与第一组感测放大器相关联的存储元件继续从感测放大器电源电压获取功率。 第二组感测放大器在稍后的第二时间点被选通。
    • 33. 发明申请
    • NON-VOLATILE STORAGE WITH SOURCE BIAS ALL BIT LINE SENSING
    • 非挥发性存储与源偏移所有位线感测
    • US20090003069A1
    • 2009-01-01
    • US11772009
    • 2007-06-29
    • Seungpil LeeHao Thai NguyenMan Lung Mui
    • Seungpil LeeHao Thai NguyenMan Lung Mui
    • G11C11/34
    • G11C16/0483G11C11/5628G11C11/5642G11C16/10G11C16/344G11C16/3454G11C2211/565
    • A NAND string in which bit line-to-bit line noise is discharged prior to sensing a programming condition of a selected non-volatile storage element in the NAND string. A source voltage is applied which boosts the voltage in conductive NAND strings. The voltage boost results in capacitive coupling of noise to neighboring NAND strings. A current pull down device is used to discharge each NAND string prior to performing sensing. After each NAND string is coupled to a discharge path for a predetermined amount of time, bit lines of the NAND string are coupled to voltage sense components for sensing the programming condition of the selected non-volatile storage elements based on a potential of the bit lines. The selected non-volatile storage elements may have a negative threshold voltage. Further, a word line associated with the selected non-volatile storage elements may be set at ground.
    • 在读取NAND串中选定的非易失性存储元件的编程条件之前,其中位线对位线噪声被放电的NAND串。 施加源电压,其提高导电NAND串中的电压。 电压升高导致噪声与相邻NAND串的电容耦合。 电流下拉器件用于在执行感测之前对每个NAND串进行放电。 在每个NAND串被连接到放电路径达预定时间量之后,NAND串的位线被耦合到电压感测组件,用于基于位线的电位感测所选择的非易失性存储元件的编程状态 。 所选择的非易失性存储元件可具有负阈值电压。 此外,可以将与所选择的非易失性存储元件相关联的字线设置为接地。
    • 35. 发明申请
    • COMPLETE WORD LINE LOOK AHEAD WITH EFFICIENT DATA LATCH ASSIGNMENT IN NON-VOLATILE MEMORY READ OPERATIONS
    • 完整的字线前瞻性,无损数据分配在非易失性存储器读操作
    • US20080158973A1
    • 2008-07-03
    • US11617544
    • 2006-12-28
    • Man Lung MuiSeungpil Lee
    • Man Lung MuiSeungpil Lee
    • G11C16/06G11C7/00
    • G11C7/1006G11C7/1051G11C7/106G11C7/1078G11C7/1087G11C11/5628G11C11/5642G11C16/3418
    • Shifts in the apparent charge stored by a charge storage region such as a floating gate in a non-volatile memory cell can occur because of electrical field coupling based on charge stored by adjacent cells. To account for the shift, compensations are applied when reading. When reading a selected word line, the adjacent word line is read first and the data stored in a set of data latches for each bit line. One latch for each bit line stores an indication that the data is from the adjacent word line. The selected word line is then read with compensations based on the different states of the cells on the adjacent word line. Each sense module uses the data from the adjacent word line to select the results of sensing with the appropriate compensation for its bit line. The data from the adjacent word line is overwritten with data from the selected word line at the appropriate time and the indication updated to reflect that the latches store data from the selected word line. The efficient use of the data latches eliminates the need for separate latches to store data from the adjacent word line.
    • 由于基于相邻单元存储的电荷的电场耦合,可能会发生存储在非易失性存储单元中的诸如浮动栅极之类的电荷存储区域的视在电荷的变化。 为了解释这种偏差,在阅读时应用补偿。 当读取所选择的字线时,首先读取相邻的字线,并且将数据存储在每个位线的一组数据锁存器中。 每个位线的一个锁存器存储数据来自相邻字线的指示。 然后基于相邻字线上的单元格的不同状态,利用补偿来读取所选择的字线。 每个感测模块使用来自相邻字线的数据来选择感测结果,并对其位线进行适当的补偿。 来自相邻字线的数据在适当的时间用来自所选择的字线的数据被覆盖,并且指示被更新以反映锁存器存储来自所选字线的数据。 数据锁存器的有效使用消除了分离锁存器来存储来自相邻字线的数据的需要。
    • 37. 发明授权
    • Low noise sense amplifier array and method for nonvolatile memory
    • 低噪声感知放大器阵列和非易失性存储器的方法
    • US08300472B2
    • 2012-10-30
    • US13178690
    • 2011-07-08
    • Hao Thai NguyenMan Lung MuiSeungpil Lee
    • Hao Thai NguyenMan Lung MuiSeungpil Lee
    • G11C16/26
    • G11C7/02G11C7/065G11C7/08G11C7/12G11C11/5642G11C16/26
    • In sensing a page of nonvolatile memory cells with a corresponding group of sense modules in parallel, as each high current cell is identified, it is locked out from further sensing while others in the page continued to be sensed. The sense module involved in the locked out is then in a lockout mode and becomes inactive. A noise source from the sense module becomes significant when in the lockout mode. The noise is liable to interfere with the sensing of neighboring cells by coupling through its bit line to neighboring ones. The noise can also couple through the common source line of the page to affect the accuracy of ongoing sensing of the cells in the page. Improved sense modules and method isolate the noise from the lockout sense module from affecting the other sense modules still active in sensing memory cell in the page.
    • 在感测具有对应的一组感测模块的非易失性存储器单元的页面中,当识别出每个高电流单元时,它被锁定以进一步检测,而页面中的其他单元继续被感测。 被锁定的感测模块处于锁定模式并变为非活动状态。 当处于锁定模式时,来自感测模块的噪声源变得显着。 通过将其位线耦合到邻近单元,噪声容易干扰相邻单元的感测。 噪声也可以通过页面的公共源行耦合,以影响页面中单元格的持续感测的准确性。 改进的感测模块和方法将噪声与锁定感测模块隔离,以影响在页面中感测存储器单元中仍然有效的其他感测模块。
    • 38. 发明申请
    • MEMORY DEVICE WITH POWER NOISE MINIMIZATION DURING SENSING
    • 在感测期间具有电力噪声最小化的存储器件
    • US20090323421A1
    • 2009-12-31
    • US12163133
    • 2008-06-27
    • Seungpil LeeHao Thai NguyenMan Lung Mui
    • Seungpil LeeHao Thai NguyenMan Lung Mui
    • G11C16/06G11C5/14
    • G11C16/0483G11C5/147G11C16/26
    • Accuracy of sensing operations, such as read or verify, in a memory device is improved by avoiding fluctuations in a sense amp supply voltage which can occur when different sense amps are strobed at different times. First and second sets of sense amps perform a sensing operation on respective storage elements, such as in an all bit line configuration. The first set of sense amps is strobed at a first time point. In response, a sensed analog level is converted to digital data. The A/D conversion relies on the sense amp supply voltage being accurate. To avoid a fluctuation in the sense amp supply voltage, a bypass path allows the storage elements associated with the first set of sense amps to continue to draw power from the sense amp supply voltage. The second set of sense amps is strobed at a later, second time point.
    • 通过避免当在不同时间选通不同的感测放大器时可能发生的感测放大器电源电压的波动来改善存储器件中的读取或验证等感测操作的精度。 第一和第二组感测放大器对各个存储元件执行感测操作,例如以全位线配置。 第一组感测放大器在第一时间点选。 作为响应,将感测的模拟电平转换为数字数据。 A / D转换依赖于正确的读出放大器电源电压。 为了避免感测放大器电源电压的波动,旁路通路允许与第一组感测放大器相关联的存储元件继续从感测放大器电源电压获取功率。 第二组感测放大器在稍后的第二时间点被选通。
    • 39. 发明申请
    • High Speed Sense Amplifier Array and Method for Nonvolatile Memory
    • 高速感应放大器阵列和非易失性存储器的方法
    • US20090296488A1
    • 2009-12-03
    • US12128535
    • 2008-05-28
    • Hao Thai NguyenMan Lung MuiSeungpil LeeFanglin ZhangChi-Ming Wang
    • Hao Thai NguyenMan Lung MuiSeungpil LeeFanglin ZhangChi-Ming Wang
    • G11C16/26G11C7/00
    • G11C16/26G11C7/02G11C7/06G11C11/5642G11C16/0483G11C2211/5634
    • Sensing circuits for sensing a conduction current of a memory cell among a group of non-volatile memory cells being sensed in parallel and providing the result thereof to a data bus are presented. A precharge circuit is coupled to a node for charging the node to an initial voltage. An intermediate circuit is also coupled to the node and connectable to the memory cell, whereby current from the precharge circuit can be supplied to the memory cell. The circuit also includes a comparator circuit to perform a determination the conduction current by a rate of discharge at the node; a data latch coupled to the comparator circuit to hold the result of said determination; and a transfer gate coupled to the data latch to supply a result latched therein to the data bus independently of the node. This arrangement improves sensing performance and can help to eliminate noise on the analog sensing path during sensing and reduce switching current.
    • 提供了用于感测并联感测的一组非易失性存储单元中的存储器单元的传导电流的感测电路,并将其结果提供给数据总线。 预充电电路耦合到用于将节点充电到初始电压的节点。 中间电路也耦合到节点并且可连接到存储器单元,由此来自预充电电路的电流可以被提供给存储单元。 电路还包括比较器电路,用于通过节点处的放电速率来确定传导电流; 耦合到所述比较器电路以保持所述确定的结果的数据锁存器; 以及传输门,其耦合到数据锁存器,以将保存在其中的结果独立于该节点提供给数据总线。 这种布置提高了感测性能,并且可以帮助消除感测过程中模拟感测路径上的噪声并降低开关电流。
    • 40. 发明授权
    • Complete word line look ahead with efficient data latch assignment in non-volatile memory read operations
    • 在非易失性存储器读取操作中,完整的字线可以看到有效的数据锁存器分配
    • US07616505B2
    • 2009-11-10
    • US11617544
    • 2006-12-28
    • Man Lung MuiSeungpil Lee
    • Man Lung MuiSeungpil Lee
    • G11C7/10
    • G11C7/1006G11C7/1051G11C7/106G11C7/1078G11C7/1087G11C11/5628G11C11/5642G11C16/3418
    • Shifts in the apparent charge stored by a charge storage region such as a floating gate in a non-volatile memory cell can occur because of electrical field coupling based on charge stored by adjacent cells. To account for the shift, compensations are applied when reading. When reading a selected word line, the adjacent word line is read first and the data stored in a set of data latches for each bit line. One latch for each bit line stores an indication that the data is from the adjacent word line. The selected word line is then read with compensations based on the different states of the cells on the adjacent word line. Each sense module uses the data from the adjacent word line to select the results of sensing with the appropriate compensation for its bit line. The data from the adjacent word line is overwritten with data from the selected word line at the appropriate time and the indication updated to reflect that the latches store data from the selected word line. The efficient use of the data latches eliminates the need for separate latches to store data from the adjacent word line.
    • 由于基于相邻单元存储的电荷的电场耦合,可能会发生存储在非易失性存储单元中的诸如浮动栅极之类的电荷存储区域的视在电荷的变化。 为了解释这种偏差,在阅读时应用补偿。 当读取所选择的字线时,首先读取相邻的字线,并且将数据存储在每个位线的一组数据锁存器中。 每个位线的一个锁存器存储数据来自相邻字线的指示。 然后基于相邻字线上的单元格的不同状态,利用补偿来读取所选择的字线。 每个感测模块使用来自相邻字线的数据来选择感测结果,并对其位线进行适当的补偿。 来自相邻字线的数据在适当的时间用来自所选择的字线的数据被覆盖,并且指示被更新以反映锁存器存储来自所选字线的数据。 数据锁存器的有效使用消除了分离锁存器来存储来自相邻字线的数据的需要。