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    • 32. 发明授权
    • Motor start examining device and method
    • 电机启动检查装置和方法
    • US5445017A
    • 1995-08-29
    • US289228
    • 1994-08-12
    • Masayuki Mizuno
    • Masayuki Mizuno
    • G02B26/12H02P1/04H04N1/053H04N1/113G01N15/00
    • H04N1/0476G02B26/122H02P1/04H04N1/053H04N1/1135H04N2201/0471H04N2201/04755Y10S388/921
    • The present invention is suitable for examination of the rotating state of a Polygonal mirror motor in an image forming apparatus. It is judged whether or not the rotational speed of the motor is a target speed until a first time period has elapsed since the supply of power to the motor for rotating a Polygonal mirror was started every other second time period sufficiently shorter than the first time period and continuously checked over a third time period which is sufficiently shorter than the second time period. If it is judged that the rotational speed of the motor is the target speed continuously for the third time period, it is judged again whether or not the rotational speed of the motor is the target speed after an elapse of a fourth time period since the judgment. If the rotational speed of the motor is the target speed, the motor outputs a signal indicating that the motor is stabilized at the target speed. If the rotational speed of the motor is not the target speed, the motor further waits until a fifth time period has elapsed for judging whether or not the rotational speed of the motor is the target speed. If the rotational speed of the motor is the target speed, the motor outputs a signal indicating that the motor is stabilized at the target speed. Image formation processing is performed in response to the signal indicating that the motor is stabilized at the target speed.
    • 本发明适用于图像形成装置中的多角镜电机的旋转状态的检查。 在从第一时间段到第一时间段之后,判断电动机的转速是否为从第一时间段到第一时间段以后的时间长度,每隔一个时间间隔开始, 并且连续检查比第二时间段足够短的第三时间段。 如果判断为电动机的转速是第三时间段连续的目标速度,则再次判断电动机的转速是否是从判定起经过第四时间段之后的目标速度 。 如果电动机的转速是目标转速,则电动机输出指示电动机稳定在目标速度的信号。 如果电动机的转速不是目标速度,则电动机进一步等待直到第五时间段,以判断电动机的转速是否为目标速度。 如果电动机的转速是目标转速,则电动机输出指示电动机稳定在目标速度的信号。 响应于指示电动机稳定在目标速度的信号执行图像形成处理。
    • 35. 发明授权
    • Aging diagnostic device, aging diagnostic method
    • 老化诊断仪,老化诊断方法
    • US08674774B2
    • 2014-03-18
    • US13394542
    • 2010-09-01
    • Eisuke SaneyoshiKoichi NoseMasayuki Mizuno
    • Eisuke SaneyoshiKoichi NoseMasayuki Mizuno
    • H03L7/24G01R31/28
    • G01R31/2856G01R31/2882G01R31/2884H03K5/133
    • There is provided an aging diagnostic device including: a reference ring oscillator (101) that constitutes a ring oscillator using an odd-numbered plurality of logic gates constituted using a CMOS circuit; a test ring oscillator (102) that constitutes a ring oscillator using an odd-numbered plurality of logic gates having the same configuration as that of the logic gate; a load unit (104) that inputs a load signal to the test ring oscillator (102); a control unit (105) that simultaneously inputs a control signal instructing a start of oscillation of the reference ring oscillator (101) and the test ring oscillator (102) to the reference ring oscillator (101) and the test ring oscillator (102); and a comparison unit (103) that compares differences in the amount of movement of pulses within the reference ring oscillator (101) and the test ring oscillator (102), respectively, in the same time.
    • 提供了一种老化诊断装置,包括:构成使用CMOS电路构成的奇数多个逻辑门的环形振荡器的参考环形振荡器(101) 使用具有与逻辑门相同配置的奇数多个逻辑门构成环形振荡器的测试环振荡器(102); 负载单元(104),其向所述测试环形振荡器(102)输入负载信号; 控制单元(105),其同时将参考环形振荡器(101)和测试环形振荡器(102)的振荡开始的控制信号输入到参考环形振荡器(101)和测试环形振荡器(102); 以及比较单元(103),其分别同时比较参考环形振荡器(101)和测试环形振荡器(102)中的脉冲的移动量的差异。
    • 38. 发明授权
    • Apparatus and method for performing a screening test of semiconductor integrated circuits
    • 用于进行半导体集成电路的屏蔽测试的装置和方法
    • US08301936B2
    • 2012-10-30
    • US12447524
    • 2007-10-17
    • Hiroaki InoueMasamichi TakagiMasayuki Mizuno
    • Hiroaki InoueMasamichi TakagiMasayuki Mizuno
    • G06F11/00
    • G06F11/277
    • An apparatus for performing a screening test of a semiconductor integrated circuit is disclosed, the semiconductor integrated circuit comprising a plurality of processors each having an output signal for instruction execution information, and the processors being programmatically operable. The apparatus for performing a screening test of a semiconductor integrated circuit comprises: an instruction/data signal synchronization circuit for synchronizing the supplying of instructions to said respective processors and for synchronizing the supplying of data to said respective processors; and a trace comparison circuit for comparing instruction execution information that are output from the respective processors to determine whether or not any of said processors has output different instruction execution information.
    • 公开了一种用于执行半导体集成电路的屏蔽测试的装置,所述半导体集成电路包括多个处理器,每个处理器具有用于指令执行信息的输出信号,并且所述处理器可编程地可操作。 用于执行半导体集成电路的屏蔽测试的装置包括:指令/数据信号同步电路,用于将指令的提供同步到所述各个处理器并用于同步向所述各个处理器提供数据; 以及跟踪比较电路,用于比较从各个处理器输出的指令执行信息,以确定所述处理器中的任何一个是否输出了不同的指令执行信息。
    • 40. 发明申请
    • AGING DIAGNOSTIC DEVICE, AGING DIAGNOSTIC METHOD
    • 老化诊断装置,老化诊断方法
    • US20120161885A1
    • 2012-06-28
    • US13394542
    • 2010-09-01
    • Eisuke SaneyoshiKoichi NoseMasayuki Mizuno
    • Eisuke SaneyoshiKoichi NoseMasayuki Mizuno
    • H03L7/24
    • G01R31/2856G01R31/2882G01R31/2884H03K5/133
    • There is provided an aging diagnostic device including: a reference ring oscillator (101) that constitutes a ring oscillator using an odd-numbered plurality of logic gates constituted using a CMOS circuit; a test ring oscillator (102) that constitutes a ring oscillator using an odd-numbered plurality of logic gates having the same configuration as that of the logic gate; a load unit (104) that inputs a load signal to the test ring oscillator (102); a control unit (105) that simultaneously inputs a control signal instructing a start of oscillation of the reference ring oscillator (101) and the test ring oscillator (102) to the reference ring oscillator (101) and the test ring oscillator (102); and a comparison unit (103) that compares differences in the amount of movement of pulses within the reference ring oscillator (101) and the test ring oscillator (102), respectively, in the same time.
    • 提供了一种老化诊断装置,包括:构成使用CMOS电路构成的奇数多个逻辑门的环形振荡器的参考环形振荡器(101) 使用具有与逻辑门相同配置的奇数多个逻辑门构成环形振荡器的测试环振荡器(102); 负载单元(104),其向所述测试环形振荡器(102)输入负载信号; 控制单元(105),其同时将参考环形振荡器(101)和测试环形振荡器(102)的振荡开始的控制信号输入到参考环形振荡器(101)和测试环形振荡器(102); 以及比较单元(103),其分别同时比较参考环形振荡器(101)和测试环形振荡器(102)中的脉冲的移动量的差异。