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    • 38. 发明申请
    • DEVICE THRESHOLD CALIBRATION THROUGH STATE DEPENDENT BURNIN
    • 通过状态相关燃烧器进行设备阈值校准
    • US20080219069A1
    • 2008-09-11
    • US11684225
    • 2007-03-09
    • Igor ArsovskiHarold PiloMichael A. Ziegerhofer
    • Igor ArsovskiHarold PiloMichael A. Ziegerhofer
    • G11C7/00
    • G11C29/50G11C11/41G11C29/028
    • Disclosed are embodiments of a method for reducing and/or eliminating mismatch. The embodiments sample the bias of one or more circuit sub-components that require a balanced state (e.g., sampling the bias of the cross-coupled transistors in each memory cell and/or sense amp in a memory array) before chip burn-in, by initiating a burn-in process during which an individually selected state is applied to each of the devices in the circuit. This fatigues the devices away from their preferred states and towards a balanced state. The bias is periodically reassessed during the burn-in process to avoid over-correction. By using this method both memory cell and sense-amplifier mismatch can be reduced in memory arrays, resulting in smaller timing uncertainty and therefore faster memories.
    • 公开了用于减少和/或消除错配的方法的实施例。 这些实施例在芯片烧录之前对需要平衡状态的一个或多个电路子部件(例如,在每个存储器单元中的交叉耦合晶体管的偏置和/或存储器阵列中的读出放大器)进行采样, 通过启动老化过程,在该过程中,单独选择的状态被应用于电路中的每个设备。 这使得设备远离其优选的状态并且朝向平衡状态。 在老化过程中定期重新评估偏差,以避免过度校正。 通过使用这种方法,可以在存储器阵列中减少存储器单元和读出放大器的失配,从而导致较小的定时不确定性,因此更快的存储器。