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    • 5. 发明授权
    • Apparatus and method for low power, single-ended sensing in a multi-port SRAM using pre-discharged bit lines
    • 在使用预放电位线的多端口SRAM中进行低功耗,单端检测的装置和方法
    • US07830727B2
    • 2010-11-09
    • US12135237
    • 2008-06-09
    • Igor ArsovskiMichael Thomas FraganoRobert Maurice Houle
    • Igor ArsovskiMichael Thomas FraganoRobert Maurice Houle
    • G11C7/06
    • G11C7/12G11C11/412G11C11/413
    • An apparatus and method for low power, single-ended sensing in a multi-port static random access memory (SRAM) using pre-discharged bit lines includes holding a bit line associated with the memory cell at a zero voltage potential when the memory cell is not being accessed; releasing the bit line from being held at a zero voltage potential when the memory cell is being accessed; charging the bit line to a first voltage potential greater in value than the zero voltage potential during an access of the memory cell, wherein charging the bit line to a first voltage potential occurs for a first predetermined period of time after access to the memory cell has begun; and sensing the memory cell contents during an access of the memory cell, wherein sensing of the memory cell contents occurs for a second predetermined period of time after access to the memory cell has begun.
    • 在使用预放电位线的多端口静态随机存取存储器(SRAM)中用于低功率,单端感测的装置和方法包括:当存储器单元为存储单元时,将与存储器单元相关联的位线保持在零电压电位 没有被访问 当存储器单元被访问时,释放位线保持在零电压电位; 在存储单元访问期间将位线充电到比零电压电位大的第一电压电位,其中在访问存储器单元之后的第一预定时间段内将位线充电到第一电压电位, 开始了 以及在所述存储器单元的访问期间感测所述存储器单元的内容,其中在开始访问所述存储器单元之后的第二预定时间段内存储单元内容的感测发生。
    • 7. 发明申请
    • Low Power, Single-Ended Sensing in a Multi-Port SRAM Using Pre-Discharged Bit Lines
    • 使用预放电位线的多端口SRAM中的低功耗,单端感测
    • US20100309740A1
    • 2010-12-09
    • US12858499
    • 2010-08-18
    • Igor ArsovskiMichael Thomas FraganoRobert Maurice Houle
    • Igor ArsovskiMichael Thomas FraganoRobert Maurice Houle
    • G11C7/00
    • G11C7/12G11C11/412G11C11/413
    • An apparatus and method for low power, single-ended sensing in a multi-port static random access memory (SRAM) using pre-discharged bit lines includes holding a bit line associated with the memory cell at a zero voltage potential when the memory cell is not being accessed; releasing the bit line from being held at a zero voltage potential when the memory cell is being accessed; charging the bit line to a first voltage potential greater in value than the zero voltage potential during an access of the memory cell, wherein charging the bit line to a first voltage potential occurs for a first predetermined period of time after access to the memory cell has begun; and sensing the memory cell contents during an access of the memory cell, wherein sensing of the memory cell contents occurs for a second predetermined period of time after access to the memory cell has begun.
    • 在使用预放电位线的多端口静态随机存取存储器(SRAM)中用于低功率,单端感测的装置和方法包括:当存储器单元为存储单元时,将与存储器单元相关联的位线保持在零电压电位 没有被访问 当存储器单元被访问时,释放位线保持在零电压电位; 在存储单元访问期间将位线充电到比零电压电位大的第一电压电位,其中在访问存储器单元之后的第一预定时间段内对位线进行充电到第一电压电位, 开始了 以及在所述存储器单元的访问期间感测所述存储器单元的内容,其中在开始访问所述存储器单元之后的第二预定时间段内存储单元内容的感测发生。
    • 8. 发明申请
    • Apparatus and Method for Low Power, Single-Ended Sensing in a Multi-Port SRAM Using Pre-Discharged Bit Lines
    • 使用预放电位线的多端口SRAM中低功耗,单端检测的装置和方法
    • US20090303821A1
    • 2009-12-10
    • US12135237
    • 2008-06-09
    • Igor ArsovskiMichael Thomas FraganoRobert Maurice Houle
    • Igor ArsovskiMichael Thomas FraganoRobert Maurice Houle
    • G11C7/00G11C8/00
    • G11C7/12G11C11/412G11C11/413
    • An apparatus and method for low power, single-ended sensing in a multi-port static random access memory (SRAM) using pre-discharged bit lines includes holding a bit line associated with the memory cell at a zero voltage potential when the memory cell is not being accessed; releasing the bit line from being held at a zero voltage potential when the memory cell is being accessed; charging the bit line to a first voltage potential greater in value than the zero voltage potential during an access of the memory cell, wherein charging the bit line to a first voltage potential occurs for a first predetermined period of time after access to the memory cell has begun; and sensing the memory cell contents during an access of the memory cell, wherein sensing of the memory cell contents occurs for a second predetermined period of time after access to the memory cell has begun.
    • 在使用预放电位线的多端口静态随机存取存储器(SRAM)中用于低功率,单端感测的装置和方法包括:当存储器单元为存储单元时,将与存储器单元相关联的位线保持在零电压电位 没有被访问 当存储器单元被访问时,释放位线保持在零电压电位; 在存储单元访问期间将位线充电到比零电压电位大的第一电压电位,其中在访问存储器单元之后的第一预定时间段内将位线充电到第一电压电位, 开始了 以及在所述存储器单元的访问期间感测所述存储器单元的内容,其中在开始访问所述存储器单元之后的第二预定时间段内存储单元内容的感测。