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    • 31. 发明申请
    • Diamond substrate and manufacturing method thereof
    • 金刚石基板及其制造方法
    • US20060213428A1
    • 2006-09-28
    • US11390333
    • 2006-03-28
    • Kiichi MeguroKeisuke TanizakiAkihiko NambaYoshiyuki YamamotoTakahiro Imai
    • Kiichi MeguroKeisuke TanizakiAkihiko NambaYoshiyuki YamamotoTakahiro Imai
    • C30B25/00
    • C30B25/105C30B25/02C30B25/20C30B29/04H01L21/02381H01L21/0243H01L21/02527H01L21/0262H01L21/02645
    • The present invention provides a manufacturing method for a large-scale diamond substrate and a substrate produced by the method suitable for semiconductor lithography processing and large-scale optical parts, semiconductor materials, thermal-release substrate, semiconductor wafer processing, and back-feed devices, and others. The manufacturing method for a diamond substrate of the present invention comprises: the mounting step of preparing a substrate having a main face comprising a first region which is a concave and having a second region which surrounds the first region, and mounting, on the first region, a single crystalline diamond seed substrate having a plate thickness thicker than the concave depth of the first region; a connecting step of forming a CVD diamond layer from the single crystalline diamond seed substrate using a chemical vapor deposition, and mutually connecting by forming a CVD diamond layer on the second region at the same time; and a polishing step of polishing to substantially flatten both the CVD diamond layers on the single crystalline diamond seed substrate and on the second region by mechanically polishing.
    • 本发明提供了通过适用于半导体光刻处理的方法制造的大规模金刚石基板和基板的制造方法以及大型光学部件,半导体材料,热释放基板,半导体晶片处理和反馈装置 , 和别的。 本发明的金刚石基板的制造方法包括:准备基板的安装步骤,所述基板具有主面,所述主面包括第一区域,所述第一区域是凹形的并且具有围绕所述第一区域的第二区域,并且安装在所述第一区域 ,具有厚于所述第一区域的凹入深度的板厚度的单晶金刚石种子基板; 使用化学气相沉积从所述单晶金刚石种子基板形成CVD金刚石层并且通过在所述第二区域上同时形成CVD金刚石层来相互连接的连接步骤; 以及抛光步骤,通过机械抛光在单晶金刚石种子基底上和第二区域上基本上平坦化CVD金刚石层。
    • 35. 发明授权
    • Piezoelectric device and method of manufacturing the same
    • 压电元件及其制造方法
    • US5982010A
    • 1999-11-09
    • US976452
    • 1997-11-25
    • Akihiko NambaTetsuyoshi OguraYoshihiro TomitaKazuo Eda
    • Akihiko NambaTetsuyoshi OguraYoshihiro TomitaKazuo Eda
    • H01L41/22H01L41/312H01L41/338H03H3/02H01L29/84
    • H03H3/02H01L41/312H01L41/338
    • A piezoelectric device is manufactured by: (1) mirror finishing surfaces of a first substrate and a second substrate made of a piezoelectric element; (2) forming grooves on at least one of the two surfaces of the first and second substrates; (3) joining the mirror-finished surfaces of the first substrate and the second substrate; (4) applying heat to the joined substrates and bonding them; (5) forming an opening on the first substrate so that a part of the exposed areas of the second substrate is exposed through the opening; (6) forming piezoelectric devices by forming electrodes on at least one of the second substrate through the opening and a corresponding area to the exposed area on the rear side of the second substrate; and (7) dividing the bonded substrates into portions each having one of the piezoelectric devices. Through this manufacturing method, piezoelectric devices with high yield ratios and high reliability can be obtained.
    • 压电器件通过以下制造:(1)第一衬底和由压电元件制成的第二衬底的镜面精加工表面; (2)在第一和第二基板的两个表面中的至少一个上形成凹槽; (3)连接第一基板和第二基板的镜面抛光面; (4)向接合的基片施加热量并将其粘合; (5)在所述第一基板上形成开口,使得所述第二基板的所述暴露区域的一部分通过所述开口露出; (6)通过在所述第二基板中的至少一个上通过所述开口形成电极并形成与所述第二基板的后侧上的暴露区域相对应的区域来形成压电装置; 和(7)将接合的衬底分成各自具有一个压电器件的部分。 通过该制造方法,可以获得高屈服比和高可靠性的压电装置。
    • 37. 发明授权
    • Diamond substrate and manufacturing method thereof
    • 金刚石基板及其制造方法
    • US07390695B2
    • 2008-06-24
    • US11390333
    • 2006-03-28
    • Kiichi MeguroKeisuke TanizakiAkihiko NambaYoshiyuki YamamotoTakahiro Imai
    • Kiichi MeguroKeisuke TanizakiAkihiko NambaYoshiyuki YamamotoTakahiro Imai
    • H01L21/00
    • C30B25/105C30B25/02C30B25/20C30B29/04H01L21/02381H01L21/0243H01L21/02527H01L21/0262H01L21/02645
    • A manufacturing method for a large-scale diamond substrate and the produced substrate that is suitable for semiconductor lithography processing and large-scale optical parts, semiconductor materials, thermal-release substrate, semiconductor wafer processing, back-feed devices, and others. The manufacturing method of the present invention includes: preparing a substrate having a main face including a first region which is a concave and a second region which surrounds the first region, and mounting, on the first region, a single crystalline diamond seed substrate having a plate thickness thicker than the concave depth of the first region; forming a CVD diamond layer from the single crystalline diamond seed substrate using a chemical vapor deposition, and mutually connecting by forming a CVD diamond layer on the second region at the same time; and polishing to substantially flatten both the CVD diamond layers and on the second region by mechanically polishing.
    • 适用于半导体光刻处理的大规模金刚石基板和所制造的基板的制造方法以及大型光学部件,半导体材料,热释放基板,半导体晶片加工,反馈装置等。 本发明的制造方法包括:准备具有包括第一区域的第一区域的主面和包围第一区域的第二区域的基板,以及在第一区域上安装具有第一区域的单晶金刚石种子基板 板厚度比第一区域的凹深更厚; 使用化学气相沉积从所述单晶金刚石种子基板形成CVD金刚石层,并且通过在所述第二区域上同时形成CVD金刚石层来相互连接; 并通过机械研磨抛光以使CVD金刚石层和第二区域基本平坦化。
    • 40. 发明申请
    • Method and Apparatus for Measuring Electric Circuit Parameters
    • 测量电路参数的方法和装置
    • US20080004819A1
    • 2008-01-03
    • US11579866
    • 2005-05-13
    • Akihiko NambaTetsuyoshi OguraToru Yamada
    • Akihiko NambaTetsuyoshi OguraToru Yamada
    • G01R27/06
    • G01R27/28
    • A method for measuring electric circuit parameters of a 2-terminal circuit having first and second terminals, includes steps of: terminating one of the first and second terminals with a terminal impedance Z1, to measure reflection characteristics al for the other terminal; terminating one of the first and second terminals with a terminal impedance Z2 different from the terminal impedance Z1, to measure reflection characteristics (2 for the other terminal; terminating one of the first and second terminals with a terminal impedance Z3 different from the terminal impedances Z1 and Z2, to measure reflection characteristics α3 for the other terminal; and calculating electric circuit parameters of the 2-terminal circuit based on the resultant reflection characteristics α1, α2 and α3, whereby measuring electric circuit parameters, such as S-parameters, Z-parameters or the like, even of a DUT having a weak ground, in a simple way with high accuracy and low cost.
    • 一种用于测量具有第一和第二端子的2端电路的电路参数的方法,包括以下步骤:用端子阻抗Z1端接第一端子和第二端子之一,以测量另一端子的反射特性a1; 用不同于端子阻抗Z1的端子阻抗Z2端接第一端子和第二端子中的一个,以测量反射特性(2为另一端子;端接阻抗Z3与端子阻抗Z1不同的终端中的一个端子 和Z2,以测量另一终端的反射特性α3;以及基于所得到的反射特性α1,α2和α3计算2端电路的电路参数,由此测量诸如S参数,Z- 参数等,即使具有弱地的DUT也能以简单的方式具有高精度和低成本。