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    • 4. 发明授权
    • Piezoelectric device and method of manufacturing the same
    • 压电元件及其制造方法
    • US5982010A
    • 1999-11-09
    • US976452
    • 1997-11-25
    • Akihiko NambaTetsuyoshi OguraYoshihiro TomitaKazuo Eda
    • Akihiko NambaTetsuyoshi OguraYoshihiro TomitaKazuo Eda
    • H01L41/22H01L41/312H01L41/338H03H3/02H01L29/84
    • H03H3/02H01L41/312H01L41/338
    • A piezoelectric device is manufactured by: (1) mirror finishing surfaces of a first substrate and a second substrate made of a piezoelectric element; (2) forming grooves on at least one of the two surfaces of the first and second substrates; (3) joining the mirror-finished surfaces of the first substrate and the second substrate; (4) applying heat to the joined substrates and bonding them; (5) forming an opening on the first substrate so that a part of the exposed areas of the second substrate is exposed through the opening; (6) forming piezoelectric devices by forming electrodes on at least one of the second substrate through the opening and a corresponding area to the exposed area on the rear side of the second substrate; and (7) dividing the bonded substrates into portions each having one of the piezoelectric devices. Through this manufacturing method, piezoelectric devices with high yield ratios and high reliability can be obtained.
    • 压电器件通过以下制造:(1)第一衬底和由压电元件制成的第二衬底的镜面精加工表面; (2)在第一和第二基板的两个表面中的至少一个上形成凹槽; (3)连接第一基板和第二基板的镜面抛光面; (4)向接合的基片施加热量并将其粘合; (5)在所述第一基板上形成开口,使得所述第二基板的所述暴露区域的一部分通过所述开口露出; (6)通过在所述第二基板中的至少一个上通过所述开口形成电极并形成与所述第二基板的后侧上的暴露区域相对应的区域来形成压电装置; 和(7)将接合的衬底分成各自具有一个压电器件的部分。 通过该制造方法,可以获得高屈服比和高可靠性的压电装置。
    • 6. 发明授权
    • Method and apparatus for measuring electric circuit parameters
    • 测量电路参数的方法和装置
    • US07805265B2
    • 2010-09-28
    • US11579866
    • 2005-05-13
    • Akihiko NambaTetsuyoshi OguraToru Yamada
    • Akihiko NambaTetsuyoshi OguraToru Yamada
    • G01R27/06
    • G01R27/28
    • A method for measuring electric circuit parameters of a 2-terminal circuit having first and second terminals, includes steps of: terminating one of the first and second terminals with a terminal impedance Z1, to measure reflection characteristics α1 for the other terminal; terminating one of the first and second terminals with a terminal impedance Z2 different from the terminal impedance Z1, to measure reflection characteristics α2 for the other terminal; terminating one of the first and second terminals with a terminal impedance Z3 different from the terminal impedances Z1 and Z2, to measure reflection characteristics α3 for the other terminal; and calculating electric circuit parameters of the 2-terminal circuit based on the resultant reflection characteristics α1, α2 and α3, whereby measuring electric circuit parameters, such as S-parameters, Z-parameters or the like, even of a DUT having a weak ground, in a simple way with high accuracy and low cost.
    • 一种用于测量具有第一和第二端子的2端电路的电路参数的方法,包括以下步骤:用端子阻抗Z1端接第一端子和第二端子之一,以测量另一端子的反射特性α1; 用不同于端子阻抗Z1的端子阻抗Z2终止第一和第二端子中的一个,以测量另一个端子的反射特性α2; 用与端子阻抗Z1和Z2不同的端子阻抗Z3终止第一和第二端子中的一个,以测量另一个端子的反射特性α3; 基于所得到的反射特性α1,α2和α3计算2端电路的电路参数,由此测量具有弱地的DUT的诸如S参数,Z参数等的电路参数 以一种简单的方式,具有高精度和低成本。
    • 7. 发明申请
    • Method and Apparatus for Measuring Electric Circuit Parameters
    • 测量电路参数的方法和装置
    • US20080004819A1
    • 2008-01-03
    • US11579866
    • 2005-05-13
    • Akihiko NambaTetsuyoshi OguraToru Yamada
    • Akihiko NambaTetsuyoshi OguraToru Yamada
    • G01R27/06
    • G01R27/28
    • A method for measuring electric circuit parameters of a 2-terminal circuit having first and second terminals, includes steps of: terminating one of the first and second terminals with a terminal impedance Z1, to measure reflection characteristics al for the other terminal; terminating one of the first and second terminals with a terminal impedance Z2 different from the terminal impedance Z1, to measure reflection characteristics (2 for the other terminal; terminating one of the first and second terminals with a terminal impedance Z3 different from the terminal impedances Z1 and Z2, to measure reflection characteristics α3 for the other terminal; and calculating electric circuit parameters of the 2-terminal circuit based on the resultant reflection characteristics α1, α2 and α3, whereby measuring electric circuit parameters, such as S-parameters, Z-parameters or the like, even of a DUT having a weak ground, in a simple way with high accuracy and low cost.
    • 一种用于测量具有第一和第二端子的2端电路的电路参数的方法,包括以下步骤:用端子阻抗Z1端接第一端子和第二端子之一,以测量另一端子的反射特性a1; 用不同于端子阻抗Z1的端子阻抗Z2端接第一端子和第二端子中的一个,以测量反射特性(2为另一端子;端接阻抗Z3与端子阻抗Z1不同的终端中的一个端子 和Z2,以测量另一终端的反射特性α3;以及基于所得到的反射特性α1,α2和α3计算2端电路的电路参数,由此测量诸如S参数,Z- 参数等,即使具有弱地的DUT也能以简单的方式具有高精度和低成本。
    • 9. 发明授权
    • Synthesizer, synthesizer module, and reception device and electronic device using same
    • 合成器,合成器模块和接收装置以及使用它们的电子装置
    • US08466716B2
    • 2013-06-18
    • US12742793
    • 2008-11-11
    • Akihiko NambaTakeshi FujiiYasunobu Tsukio
    • Akihiko NambaTakeshi FujiiYasunobu Tsukio
    • H03B21/00
    • H03L1/027H03L7/1976
    • A synthesizer including an oscillator for outputting an oscillation signal based on an output signal from a comparator, a frequency divider for dividing a frequency of an output signal from the oscillator based on control from a controller, and a temperature sensor for detecting an error between a preset frequency and a frequency based on a reference oscillation signal. The comparator compares an output signal from the frequency divider with an output signal from a MEMS oscillator and outputs a signal indicating the comparison result to the oscillator. The controller changes the frequency division ratio of the frequency divider based on an output signal from the temperature sensor and changes the frequency division ratio in a state in which the frequency division ratio is kept at the past value. Thus, phase noise deterioration in the synthesizer can be suppressed.
    • 一种合成器,包括:振荡器,用于基于来自比较器的输出信号输出振荡信号;分频器,用于根据来自控制器的控制来分频来自振荡器的输出信号的频率;以及温度传感器,用于检测 预设频率和基于参考振荡信号的频率。 比较器将来自分频器的输出信号与来自MEMS振荡器的输出信号进行比较,并向振荡器输出指示比较结果的信号。 控制器基于来自温度传感器的输出信号来改变分频器的分频比,并且在分频比保持在过去值的状态下改变分频比。 因此,可以抑制合成器中的相位噪声恶化。
    • 10. 发明授权
    • Synthesizer and reception device and electronic device using the same
    • 合成器和接收装置及使用其的电子装置
    • US08390334B2
    • 2013-03-05
    • US13057055
    • 2009-08-26
    • Yasunobu TsukioAkihiko Namba
    • Yasunobu TsukioAkihiko Namba
    • H03B21/00
    • H03L7/197H03J7/065H03L1/027
    • A synthesizer includes: a synthesizer unit that outputs an oscillation signal based on a reference oscillation signal; a temperature detecting unit that detects a temperature; a time variation detecting unit that detects a time variation in frequency of the reference oscillation signal based on a result of temperature detection by the temperature detecting unit; and a control unit that adjusts a frequency of the oscillation signal outputted from the synthesizer unit based on a result of detection by the time variation detecting unit. With such a configuration, frequency compensation control is performed on a transducer having a large temperature coefficient.
    • 合成器包括:合成器单元,其基于参考振荡信号输出振荡信号; 温度检测单元,其检测温度; 时间变化检测单元,其基于温度检测单元的温度检测结果来检测基准振荡信号的频率的时间变化; 以及控制单元,其基于时间变化检测单元的检测结果调整从合成器单元输出的振荡信号的频率。 通过这样的结构,对具有大的温度系数的换能器进行频率补偿控制。