会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 31. 发明申请
    • Semiconductor memory device for controlling cell block with state machine
    • 用状态机控制电池块的半导体存储器件
    • US20050141299A1
    • 2005-06-30
    • US11015475
    • 2004-12-20
    • Sang-Hoon HongJae-Bum KoSe-Jun Kim
    • Sang-Hoon HongJae-Bum KoSe-Jun Kim
    • G11C7/10G11C7/22G11C8/12G11C29/00
    • G11C7/22G11C8/12
    • A semiconductor memory device for an effective data access operation includes a cell area having N+1 number of unit cell blocks, each including M number of word lines, for storing a data in a unit cell corresponding to an inputted address; N+1 number of unit controlling blocks having respective state machines and corresponding to the respective N+1 unit cell blocks for controlling a data restoration that is accessed from a first unit cell block selected from the N+1 unit cell blocks into the first unit cell block or a second unit cell block; and a driving controlling block for controlling the N+1 unit cell blocks so that the N+1 unit controlling means are in one of first to fourth operation states.
    • 一种用于有效数据存取操作的半导体存储器件包括:具有N + 1个单位单元块数量的单元区域,每个单元单元块包括M个字线,用于存储与输入地址对应的单位单元中的数据; N + 1个单元控制块,具有各自的状态机,并且对应于用于控制从从N + 1个单元块选择的第一单元单元块访问到第一单元的数据恢复的相应N + 1个单位单元块 单元块或第二单元单元块; 以及驱动控制块,用于控制N + 1个单元块,使得N + 1单元控制装置处于第一至第四操作状态之一。
    • 33. 发明授权
    • High speed interface type semiconductor memory device
    • 高速接口型半导体存储器件
    • US06813196B2
    • 2004-11-02
    • US09892549
    • 2001-06-28
    • Yong Jae ParkSe Jun Kim
    • Yong Jae ParkSe Jun Kim
    • G11C700
    • G11C7/222G11C7/1072G11C7/22G11C11/4076
    • The present invention discloses a high speed interface type semiconductor memory device which can transmit data of a plurality of DRAMs of a module to a controller by using only one data strobe clock signal. The high speed interface type semiconductor memory device includes a DRAM module unit for generating a strobe clock signal for synchronizing a data signal in a read operation in a DRAM farthest from a controller among a plurality of DRAMs, providing the strobe clock signal to the other DRAMs, and transmitting data to the controller in the read operation, and a controller for transmitting a clock signal and data signals synchronized with the clock signal to the plurality of DRAMs, and receiving data signals from the DRAMs.
    • 本发明公开了一种高速接口型半导体存储器件,其可以通过仅使用一个数据选通时钟信号将模块的多个DRAM的数据传输到控制器。 高速接口型半导体存储器件包括:DRAM模块单元,用于产生用于在多个DRAM中与控制器最远的DRAM中的读取操作中的数据信号同步的选通时钟信号,将选通时钟信号提供给其它DRAM ,以及在读取操作中向控制器发送数据,以及用于将时钟信号和与时钟信号同步的数据信号发送到多个DRAM的控制器,以及从DRAM接收数据信号。
    • 34. 发明授权
    • Delay circuit of clock synchronization device using delay cells having wide delay range
    • 使用具有宽延迟范围的延迟单元的时钟同步装置的延迟电路
    • US06686788B2
    • 2004-02-03
    • US10140280
    • 2002-05-06
    • Se Jun KimSang Hoon Hong
    • Se Jun KimSang Hoon Hong
    • H03H1126
    • H03K5/133H03K2005/00026H03K2005/00208H03K2005/00234H03L7/0812H03L7/0995
    • A delay circuit of a clock synchronization device that includes an operational amplifier for setting the level of a current control voltage according to a voltage difference between a regulation voltage and a reference voltage. A number of unit delay cells connected in series are included, each having a delay time set according to a resistance control voltage and the current control voltage. Also, a variable resistance unit is included having a resistance value adjusted according to the resistance control voltage, where the variable resistance unit includes a cross coupled adjustment device that outputs signals to a next unit delay cell. The delay cells are controlled by using the operational amplifier and a replica cell to have a wide delay range. As a result, the working range can be set wide, jitters may be reduced and the chip size may also be reduced.
    • 时钟同步装置的延迟电路,其包括用于根据调节电压和参考电压之间的电压差来设定电流控制电压的电平的运算放大器。 包括串联连接的多个单元延迟单元,每个具有根据电阻控制电压和电流控制电压设置的延迟时间。 此外,包括根据电阻控制电压调整的电阻值的可变电阻单元,其中可变电阻单元包括向下一个单位延迟单元输出信号的交叉耦合调整装置。 通过使用运算放大器和复制单元来控制延迟单元具有宽的延迟范围。 结果,可以将工作范围设定得很宽,可能减少抖动,并且芯片尺寸也可能降低。
    • 39. 发明申请
    • Band-gap reference voltage generator
    • 带隙基准电压发生器
    • US20080042737A1
    • 2008-02-21
    • US11648462
    • 2006-12-28
    • Se Jun KimChun Seok Jeong
    • Se Jun KimChun Seok Jeong
    • G05F1/10
    • G05F3/30
    • A band-gap reference voltage generator includes a first reference current generator, a second reference current generator, and a reference voltage generator. The first reference current generator includes: a driver generating a first reference current in response to a first voltage signal generated by comparison of the unique voltage and the thermal voltage. The second reference current generator includes a driver generating a second reference current in response to a second voltage signal generated by comparison of a division voltage of a power-supply voltage and the unique voltage. The reference voltage generator includes a driver forming current mirrors in association with each of the first reference current generator and the second reference current generator, respectively, and generating a third reference current and a fourth reference current via the formed current mirrors, and a current-voltage converter converting the sum of the third reference current and the fourth reference current into a reference voltage, and outputting the reference voltage.
    • 带隙参考电压发生器包括第一参考电流发生器,第二参考电流发生器和参考电压发生器。 第一参考电流发生器包括:响应于通过比较唯一电压和热电压而产生的第一电压信号而产生第一参考电流的驱动器。 第二参考电流发生器包括响应于通过比较电源电压的分压和独特电压而产生的第二电压信号而产生第二参考电流的驱动器。 参考电压发生器包括分别与第一参考电流发生器和第二参考电流发生器相关联地形成电流镜的驱动器,并且经由形成的电流镜产生第三参考电流和第四参考电流, 电压转换器将第三参考电流和第四参考电流的和转换成参考电压,并输出参考电压。