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    • 34. 发明授权
    • Thin film transistor substrate and display device
    • 薄膜晶体管基板和显示装置
    • US07781767B2
    • 2010-08-24
    • US11743916
    • 2007-05-03
    • Nobuyuki KawakamiHiroshi GotohAya Hino
    • Nobuyuki KawakamiHiroshi GotohAya Hino
    • H01L29/04H01L31/20H01L31/036H01L31/0376
    • H01L29/458H01L29/78609
    • Disclosed are a thin film transistor substrate where barrier metal can be omitted to be formed between a semiconductor layer of a thin film transistor and source and drain electrodes (barrier metal need not be formed between the semiconductor layer of the thin film transistor and the source and drain electrodes), and a display device. (1) A thin film transistor substrate has a semiconductor layer of a thin film transistor, a source electrode, a drain electrode, and a transparent conductive film, wherein the substrate has a structure in which the source and drain electrodes are directly connected to the semiconductor layer of the thin film transistor, and the source and drain electrodes include an Al alloy thin film containing Ni of 0.1 to 6.0 atomic percent, La of 0.1 to 1.0 atomic percent, and Si of 0.1 to 1.5 atomic percent. (2) A display device has the thin film transistor substrate.
    • 公开了一种薄膜晶体管基板,其中可以省略在薄膜晶体管的半导体层和源极和漏极之间形成阻挡金属(不需要在薄膜晶体管的半导体层和源极之间形成阻挡金属和在源极之间形成阻挡金属, 漏电极)和显示装置。 (1)薄膜晶体管基板具有薄膜晶体管,源电极,漏电极和透明导电膜的半导体层,其中,所述基板具有其中源电极和漏电极直接连接到 薄膜晶体管的半导体层,源极和漏极包括含有0.1至6.0原子%的Ni,0.1至1.0原子%的La和0.1至1.5原子%的Si的Al合金薄膜。 (2)显示装置具有薄膜晶体管基板。
    • 35. 发明申请
    • LAYERED STRUCTURE AND ITS MANUFACTURING METHOD
    • 层状结构及其制造方法
    • US20090004490A1
    • 2009-01-01
    • US12131493
    • 2008-06-02
    • Hiroshi GOTOUMototaka OchiYuichi TaketomiNobuyuki Kawakami
    • Hiroshi GOTOUMototaka OchiYuichi TaketomiNobuyuki Kawakami
    • B32B15/04B05D5/12
    • G02F1/136286B32B2457/20C22C21/00G02F2001/136295
    • This invention is intended to provide a layered structure in which Al alloy is directly connected to transparent oxide conducting layer without increasing electrical contact resistance between the two, with wiring resistance held low and galvanic corrosion being less likely to occur in developing solution or other electrolyte fluids, and the manufacturing method of such layered structure. The manufacturing method intended to provide such layered structure composed of the Al alloy and the transparent oxide conducting layer directly connected to each other, includes a first process to form the above transparent oxide conducting layer on a substrate, a second process to form, on the transparent oxide conducting layer, an Al alloy layer containing alloy components having less ionization tendency than aluminum, and a third process to heat the above Al alloy layer at a temperature equal to or higher than the temperature at which interchemical compound between aluminum and the above alloy components can be separated out.
    • 本发明旨在提供一种分层结构,其中Al合金直接连接到透明氧化物导电层,而不增加两者之间的电接触电阻,布线电阻保持较低,并且电镀腐蚀在显影液或其它电解液中不太可能发生 ,以及这种层状结构体的制造方法。 旨在提供由Al合金和直接连接的透明氧化物导电层构成的层状结构的制造方法包括在基板上形成上述透明氧化物导电层的第一工序, 透明氧化物导电层,含有比铝离子化倾向小的合金成分的Al合金层,以及在等于或高于铝与上述合金之间的化学化合物的温度的温度下加热上述Al合金层的第三工艺 组件可以分离出来。