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    • 21. 发明授权
    • Radiation thermometer
    • 辐射温度计
    • US06609824B1
    • 2003-08-26
    • US09597690
    • 2000-06-19
    • Tetsuya SatoHiroyuki Ota
    • Tetsuya SatoHiroyuki Ota
    • G01J500
    • G01J5/02G01J5/026G01J5/16G01J2005/068
    • A radiation thermometer capable of precise measurement without depending upon an absolute precision of an infrared ray sensor for detecting infrared ray or a temperature sensor for measuring a temperature of the infrared ray sensor is provided wherein, controlling means retains a reference temperature for the measurement object, a sensor reference temperature for the sensor, and a sensor reference output for the sensor output when infrared ray radiated from the object of measurement having the object of measurement reference temperature is detected by the infrared ray sensor having the sensor reference temperature, and calculates the temperature of measurement object based on a first difference as a difference between a sensor temperature to be measured by the sensor temperature measuring portion and a sensor reference temperature, a second difference as a difference between a sensor output to be detected by the infrared ray sensor and a sensor reference output and the object of measurement reference temperature.
    • 提供一种能够精确测量的辐射温度计,其不依赖于用于检测红外线的红外线传感器的绝对精度或用于测量红外线传感器的温度的温度传感器,其中控制装置保持测量对象的参考温度, 传感器的传感器参考温度,以及当具有测量基准温度对象的测量对象辐射红外线时,传感器输出的传感器基准输出由具有传感器参考温度的红外线传感器检测,并计算温度 基于作为由传感器温度测量部测量的传感器温度与传感器参考温度之间的差的第一差异的测量对象的第二差值作为由红外线传感器检测的传感器输出与 传感器参考输出和测量对象 参考温度。
    • 24. 发明授权
    • Group III nitride semiconductor light-emitting device having anticracking feature
    • III族氮化物半导体发光器件具有抗撬性能
    • US06259122B1
    • 2001-07-10
    • US09368535
    • 1999-08-04
    • Hiroyuki OtaToshiyuki TanakaAtsushi Watanabe
    • Hiroyuki OtaToshiyuki TanakaAtsushi Watanabe
    • H01L3300
    • H01L33/32H01S5/32341
    • In a semiconductor light-emitting device having a multilayered structure which consists essentially of layers of Group III nitride semiconductors (AlxGa1−x) 1−yInyN (0≦x≦1, 0≦y≦1) which are different from each other in chemical composition ratio, generation of cracks at an interface propagating from an interface between adjacent layers is prevented. Two adjacent layers within the multilayered structure, which include a lower layer having a lattice constant larger than a lattice constant of an upper layer of the two adjacent layers, have a portion close to the interface of the two adjacent layers doped such that an element different from the Group III nitride semiconductors is added in a higher concentration, i.e. in a higher distribution density than in other portions thereof.
    • 在具有多层结构的半导体发光器件中,其基本上由III族氮化物半导体(Al x Ga 1-x)1-y In y N(0 <= x <= 1,0 <= y <= 1) 彼此之间的化学组成比,防止了从相邻层之间的界面传播的界面产生裂纹。 多层结构中的两个相邻层,其包括具有大于两个相邻层的上层的晶格常数的晶格常数的下层,具有靠近所述两个相邻层的界面的部分,所述界面被掺杂,使得元件不同 从III族氮化物半导体中加入更高的浓度,即比其它部分更高的分布密度。
    • 25. 发明授权
    • Method and system for inspecting an assembly, and electrical inspection
apparatus for a flash unit
    • 用于检查组件的方法和系统,以及用于闪光单元的电气检查装置
    • US5659491A
    • 1997-08-19
    • US355975
    • 1994-12-14
    • Fusao IchikawaRyo MoriHiroyuki Ota
    • Fusao IchikawaRyo MoriHiroyuki Ota
    • B07C5/344G03B15/05G03B19/04G03B43/00H05B41/32G05B19/418
    • H05B41/325B07C5/344G03B15/05G03B19/04G03B43/00G03B2215/0503G03B2219/045
    • An inspection system for assemblies, especially for flash units of used film packages as to if the flash units are reusable. The inspection system circulates pallets each holding a flash unit in a predetermined posture around a plurality of inspection stations for various inspection items. Inspection data detected in each inspection station is written in a memory of the pallet through a data communication system disposed in each pallet and each inspection station. A computer reads the memory for classifying the flash unit on the basis of the inspection data on all inspection items and writes classification data in the memory. A plurality of electrical inspection apparatuses are disposed in the inspection system for simultaneously inspecting electrical properties of a plurality of flash units. Each inspection apparatus has proving pins, an actuator and a photo-sensor which are moved into their operative positions when the pallet holding the flash unit is stopped at the inspection apparatus, wherein the inspection apparatus charges a main capacitor with a high D.C. voltage while measuring the voltage of the main capacitor.
    • 用于组件的检查系统,特别是用于使用胶片包装的闪光单元,如果闪光灯组件是可重复使用的。 检查系统将托盘中的每个保持闪光单元的托板循环在用于各种检查项目的多个检查站周围。 在每个检查站中检测到的检查数据通过设置在每个托盘和每个检查站中的数据通信系统写入托盘的存储器中。 计算机根据所有检查项目的检查数据读取闪存单元的分类存储器,并将分类数据写入存储器。 多个电气检查装置设置在检查系统中,用于同时检查多个闪光单元的电气特性。 每个检查装置具有检测销,致动器和光传感器,当保持闪光单元的托盘停在检查装置时,其移动到其操作位置,其中检查装置对具有高DC电压的主电容器充电,同时测量 主电容的电压。
    • 27. 发明授权
    • Process for forming polarization inversion layer
    • 用于形成极化反转层的工艺
    • US5382334A
    • 1995-01-17
    • US138214
    • 1993-10-20
    • Satoshi MiyaguchiAtsushi OnoeHiroyuki Ota
    • Satoshi MiyaguchiAtsushi OnoeHiroyuki Ota
    • G02F1/37G02F1/355H01L21/00
    • G02F1/3558Y10T29/42
    • Disclosed is a process for forming a polarization inversion layer which can form a periodic metal pattern on one major surface of a substrate and can easily form a fine periodic domain inversion structure. According to this process for forming polarization inversion layer, before or after the step of forming a three-dimensional waveguide, plural pairs of ground anodes and voltage-applying cathodes are formed at predetermined intervals, each pair sandwiching the three-dimensional waveguide along the extending direction thereof, facing each other, and set apart from each other, on one major surface of the substrate parallel to an axial direction where polarization inversion easily occurs, an electron beam is irradiated to the cathodes with the anodes grounded to thereby form a plurality of polarization inversion layers along the extending direction of the three-dimensional waveguide.
    • 公开了一种用于形成极化反转层的方法,其可以在衬底的一个主表面上形成周期性金属图案,并且可以容易地形成精细的周期性畴反转结构。 根据用于形成极化反转层的方法,在形成三维波导的步骤之前或之后,以预定的间隔形成多对接地阳极和施加电压的阴极,每对将沿着延伸的三维波导夹着三维波导 方向彼此面对,并且彼此分离,在平行于极化反转容易发生的轴向的基板的一个主表面上,电子束照射到阴极,阳极接地,从而形成多个 沿着三维波导的延伸方向的极化反转层。