会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 21. 发明申请
    • AUTOMATIC ANALYSIS DEVICE AND DISPENSING DEVICE
    • 自动分析装置和分配装置
    • US20120020838A1
    • 2012-01-26
    • US13263454
    • 2010-04-08
    • Tomonori MimuraAkihisa MakinoSakuichiro Adachi
    • Tomonori MimuraAkihisa MakinoSakuichiro Adachi
    • G01N33/50
    • G01N35/025G01N2035/0453
    • An automatic analysis device 1a includes: an intermediate disk (intermediate unit) 20 on which a disposable container (intermediate container) 21 for carrying out a pretreatment by pretreatment liquid for a sample dispensed from a sample container 11 or a reaction with a reagent is arranged; a reaction disk (main analysis unit) 60 for carrying out a test of an item having a relatively large number of test requests, on which a reaction vessel 61 for carrying out a reaction of a reagent with the sample obtained after the pretreatment is arranged; and flow-based analysis mechanisms (sub analysis units) 30a to 30c for carrying out a test for the sample obtained after the reaction with the reagent in the disposable container 21, which is the item having a relatively small number of test requests.
    • 自动分析装置1a包括:中间盘(中间单元)20,其上设置有用于对从样品容器11分配的样品的预处理液进行预处理或与试剂反应的一次性容器(中间容器)21 ; 反应盘(主分析单元)60,用于执行具有相对较多测试请求的项目的测试,其上布置用于进行试剂与预处理之后获得的样品的反应的反应容器61; 以及用于对作为具有相对少的测试要求的项目的一次性容器21中的试剂进行反应后获得的样品进行试验的基于流的分析机构(子分析单元)30a至30c。
    • 26. 发明申请
    • AUTOMATIC ANALYZER AND AUTOMATIC ANALYSIS METHOD
    • 自动分析仪和自动分析方法
    • US20130132022A1
    • 2013-05-23
    • US13702196
    • 2011-06-15
    • Takuo TamuraMasaki ShibaSakuichiro Adachi
    • Takuo TamuraMasaki ShibaSakuichiro Adachi
    • G01N21/51G06F17/00
    • An automatic analyzer is capable of reducing the influence of scattered light having noise components to enhance the S/N ratio properties of a light reception signal. Data is obtained at a plurality of angles by a plurality of detectors and a signal obtained by one detector selected from among the detectors is selected as a reference signal. An approximation is applied by an approximation selection unit, and an approximation calculation unit calculates an approximation using the selected approximation. A degree of variability of the reference signal is determined and a data correction unit corrects the signal of the detector by dividing the signal of the detector by the degree of variability of the reference signal. A concentration calculation processing unit performs the concentration calculation by use of the corrected signal data, and a result output unit outputs the results on a display.
    • 自动分析仪能够减少具有噪声分量的散射光的影响,以提高光接收信号的S / N比特性。 通过多个检测器以多个角度获得数据,并且选择从检测器中选出的一个检测器获得的信号作为参考信号。 近似值由近似选择单元施加,近似计算单元使用所选择的近似来计算近似值。 确定参考信号的可变性程度,并且数据校正单元通过将检测器的信号除以参考信号的变化程度来校正检测器的信号。 浓度计算处理单元通过使用校正的信号数据进行浓度计算,结果输出单元将显示结果输出。
    • 29. 发明授权
    • Automatic analyzer
    • 自动分析仪
    • US09080972B2
    • 2015-07-14
    • US13979668
    • 2012-01-10
    • Akihisa MakinoSakuichiro Adachi
    • Akihisa MakinoSakuichiro Adachi
    • G01N21/53G01N21/49G01N21/51G01N35/00
    • G01N21/49G01N21/51G01N35/00693G01N2201/0415G01N2201/1211
    • The scattered light from the measurement target substance passes through a light receiving window, and is received by a detector for +θ scattered light and a detector for −θ scattered light which are arranged symmetrically to each other across an optical axis at an equal angle or an equal interval in a vertical direction. A light source is fixed by a light-source holder (that is a base member on which the light source is arranged), and the detectors are arranged on and fixed to a detector holder (that is a base member on which the detectors are arranged). In this manner, drift of the light quantity data caused by the thermal deformation of the optical system can be corrected by comparing values of the light quantity data of the detectors.
    • 来自测量对象物质的散射光通过光接收窗口,并被检测器接收+ 散射光和检测器 - &thetas; 散射光在垂直方向上以等角度或等间隔的光轴彼此对称地布置。 光源由光源保持器(即配置有光源的基底部件)固定,检测器被配置在检测器支架(作为检测器布置在其上的基底部件)上并固定 )。 以这种方式,可以通过比较检测器的光量数据的值来校正由光学系统的热变形引起的光量数据的漂移。