会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 21. 发明授权
    • Memory device
    • 内存设备
    • US06337833B1
    • 2002-01-08
    • US09346919
    • 1999-07-02
    • Kazuyuki KanazashiToshiya UchidaMasaki Okuda
    • Kazuyuki KanazashiToshiya UchidaMasaki Okuda
    • G11C800
    • G11C7/225G11C7/1051G11C7/1072
    • One aspect of the present invention is that, when the memory is in the non-power-down state, the supply of clock signals to the data output circuit is limited to the read status after the reception of a read command, and no clock signal supply is performed when either the active status or the write status is in effect. In the best aspect, furthermore, in the read status after the reception of a read command, the supply of clock signals to the data output circuit starts after a number of clock signals corresponding to a set CAS latency following the read command, and stops after a number of clock signals corresponding to a set burst length, after the output of the read out data from the data output circuit starts. Accordingly, even in the non-power-down state, clock signals are only supplied during the time required for the read out data to be actually output from the data output circuit to the outside, whereby it is possible to reduce the number of clock signal supply actions that require large current drive.
    • 本发明的一个方面是,当存储器处于非掉电状态时,向数据输出电路提供时钟信号被限制在接收到读命令之后的读状态,并且没有时钟信号 当活动状态或写入状态都有效时执行供电。 此外,在最佳方面,在接收到读取命令之后的读取状态下,在与读取命令之后的设定的CAS延迟相对应的多个时钟信号之后,向数据输出电路提供时钟信号开始,并且在后面停止 在从数据输出电路输出读出数据开始之后,与设定的突发长度对应的多个时钟信号。 因此,即使在非掉电状态下,时钟信号仅在从数据输出电路向外部输出的读出数据所需的时间内提供,从而可以减少时钟信号的数量 提供需要大电流驱动的动作。
    • 23. 发明授权
    • Semiconductor memory and operating method of same
    • 半导体存储器及其操作方法相同
    • US07649796B2
    • 2010-01-19
    • US12005389
    • 2007-12-27
    • Masaki OkudaAtsushi Fujii
    • Masaki OkudaAtsushi Fujii
    • G11C7/00
    • G11C29/50G11C11/401G11C11/406G11C29/14G11C29/50012G11C2211/4061
    • A semiconductor memory has a memory cell array having dynamic memory cells. An access control circuit accesses the memory cells in response to an access command which is supplied externally. A refresh control circuit generates, during a test mode, a test refresh request signal in synchronization with the access command so as to execute a refresh operation of the memory cells when a refresh mask signal is at an invalid level. Also, the refresh control circuit prohibits generation of the test refresh request signal when the refresh mask signal is at a valid level. The test refresh request signal is generated or prohibited from being generated according to the level of the refresh mask signal. Thus, only a refresh operation needed for a test can be executed, and hence test efficiency can be improved.
    • 半导体存储器具有具有动态存储单元的存储单元阵列。 访问控制电路响应于外部提供的访问命令来访问存储器单元。 刷新控制电路在测试模式期间与访问命令同步地生成测试刷新请求信号,以便当刷新屏蔽信号处于无效级时执行存储器单元的刷新操作。 此外,当刷新屏蔽信号处于有效电平时,刷新控制电路禁止产生测试刷新请求信号。 生成或禁止根据刷新屏蔽信号的电平生成测试刷新请求信号。 因此,可以仅执行测试所需的刷新操作,因此可以提高测试效率。
    • 24. 发明授权
    • Logical circuit
    • 逻辑电路
    • US07190204B2
    • 2007-03-13
    • US11042335
    • 2005-01-26
    • Hiroyuki KobayashiMasaki Okuda
    • Hiroyuki KobayashiMasaki Okuda
    • H03H11/16
    • H03K5/1515H03K5/26H03K19/00323H03K19/21H03L7/0812H03L7/089
    • A logical circuit receives first and second input signals in which a period of a first logic level partially overlaps, and outputs first and second output signals in which a period of the first logic level does not overlap. The logical circuit comprises a first unit which changes a phase of the first output signal from a second logic level to the first logic level when a change of the first input signal from the second logic level to the first logic level is detected. A second unit changes a phase of the second output signal from the first logic level to the second logic level when the second input signal is detected as being at the first logic level at a time of detection of the change of the first input signal.
    • 逻辑电路接收第一和第二输入信号,其中第一逻辑电平的周期部分地重叠,并输出其中第一逻辑电平的周期不重叠的第一和第二输出信号。 逻辑电路包括第一单元,当从第二逻辑电平到第一逻辑电平的第一输入信号的改变被检测到时,将第一输出信号的相位从第二逻辑电平改变到第一逻辑电平。 当检测到第一输入信号的变化时,第二输入信号被检测为处于第一逻辑电平时,第二单元将第二输出信号的相位从第一逻辑电平改变为第二逻辑电平。
    • 28. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US06667913B2
    • 2003-12-23
    • US10285425
    • 2002-11-01
    • Masaki OkudaHiroyuki Kobayashi
    • Masaki OkudaHiroyuki Kobayashi
    • G11C1604
    • G11C29/028G11C7/22G11C7/222G11C11/401G11C11/4076G11C29/02G11C29/50G11C29/56012
    • A phase adjustment circuit delays an external clock signal to generate an adjusted clock signal. A phase comparator compares phases of the external clock signal and the adjusted clock signal, and outputs a phase adjustment signal for adjusting a delay time of the phase adjustment circuit. A data output circuit outputs read data to a data terminal in synchronization with the adjusted clock signal. A data input circuit receives write data supplied to the data terminal, in synchronization with the adjusted clock signal. When performing input of the write data and output of the read data successively, switching control between the input operation of the write data and the output operation of the read data only has to be completed within one clock cycle. The clock cycle can thus be reduced to the time required for the switching control. Consequently, maximum frequency of the external clock signal can be increased.
    • 相位调整电路延迟外部时钟信号以产生经调整的时钟信号。 相位比较器比较外部时钟信号和调整后的时钟信号的相位,并输出用于调整相位调整电路的延迟时间的相位调整信号。 数据输出电路与被调整的时钟信号同步地将数据输出到数据终端。 数据输入电路与调整后的时钟信号同步地接收提供给数据终端的写入数据。 当连续执行写入数据的输入和读取数据的输出时,必须在一个时钟周期内完成写入数据的输入操作和读取数据的输出操作之间的切换控制。 因此,时钟周期可以减少到开关控制所需的时间。 因此,可以增加外部时钟信号的最大频率。
    • 29. 发明授权
    • Semiconductor memory device having error correction function for data reading during refresh operation
    • 具有用于刷新操作期间的数据读取的纠错功能的半导体存储器件
    • US06535452B2
    • 2003-03-18
    • US10097621
    • 2002-03-15
    • Masaki OkudaToshiya Uchida
    • Masaki OkudaToshiya Uchida
    • G11C800
    • G06F11/1032G11C7/1006G11C11/406G11C11/4096G11C2207/002G11C2207/065G11C2207/108
    • A semiconductor memory device includes a plurality of memory blocks, each of which is refreshed independently of one another, m (m>1) data pins, each of which continuously receives or outputs n (n>1) data pieces, a conversion circuit which converts data of each of the data pins between parallel data and serial data, m×n data bus lines on which the n data pieces are expanded in parallel with respect to each of the m data pins, m address selection lines which are connected to m respective blocks of the memory blocks corresponding to the m respective data pins, and are simultaneously activated, the activation of any one of the address selection lines connecting the data bus lines to a corresponding one of the m respective blocks and resulting in the n data pieces being input/output to/from the corresponding one of the m respective blocks.
    • 一种半导体存储器件包括多个存储块,每个存储块彼此独立地刷新,m(m> 1)个数据引脚,每个存储块连续地接收或输出n(n> 1)个数据段,转换电路 在并行数据和串行数据之间转换每个数据引脚的数据,相对于每个m个数据引脚并行扩展n个数据段的m×n数据总线,连接到m个相应块的m个地址选择线 的对应于各个数据引脚的存储器块,并且同时被激活,将数据总线线路中的任何一个地址选择线激活到相应的m个块中的相应一个,并且导致n个数据段被输入 /输出到相应的m个相应块中的一个。
    • 30. 发明授权
    • Memory device
    • 内存设备
    • US6104659A
    • 2000-08-15
    • US338599
    • 1999-06-23
    • Yoshimasa YagishitaToshiya UchidaMasaki Okuda
    • Yoshimasa YagishitaToshiya UchidaMasaki Okuda
    • G11C11/413G05F1/00G11C5/14G11C11/401G11C11/406G11C11/407G11C7/00
    • G11C5/143G11C5/147
    • A memory device comprises: a plurality of banks each of which includes an array of memory cells; and at least a first and a second internal power generator, provided for each of the plurality of banks, for generating an internal power source voltage which differs from a voltage supplied by an external power source. If the internal common power source voltage in the memory device is lower than the first voltage when the power is on, the first and the second internal power generators in a plurality of banks are activated so as to rapidly raise the common internal power source voltage. When the common internal power source voltage in the memory device is higher than the first voltage and lower than the second voltage, the second internal power generators in the banks are activated to compensate for a drop in the internal power source voltage, which is caused by current leakage. When the internal power source voltage in a bank in the activated state is lower than the third voltage, the first and the second internal power generators in the corresponding bank are activated and satisfactorily drive the internal power source voltage in the bank so as to operate the memory device at a high speed.
    • 存储器件包括:多个存储体,每个存储体包括存储器单元的阵列; 以及为多个组中的每一个提供的至少第一和第二内部发电机,用于产生不同于由外部电源提供的电压的内部电源电压。 如果在电源接通时存储器件内部的公共电源电压低于第一电压,则多个组中的第一和第二内部发电机被激活,以便迅速提高公共内部电源电压。 当存储器件中的公共内部电源电压高于第一电压并低于第二电压时,该组中的第二内部发电机被激活以补偿内部电源电压的下降,这是由 电流泄漏。 当处于激活状态的组中的内部电源电压低于第三电压时,相应组中的第一和第二内部发电机被激活并令人满意地驱动组中的内部电源电压,以便操作 高速存储设备。