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    • 25. 发明申请
    • Data Storage Device
    • 数据存储设备
    • US20080316905A1
    • 2008-12-25
    • US12185530
    • 2008-08-04
    • Peter BaechtoldJohannes G. BednorzGerd K. BinnigGiovanni CherubiniEvangelos S. EleftheriouMichel Despont
    • Peter BaechtoldJohannes G. BednorzGerd K. BinnigGiovanni CherubiniEvangelos S. EleftheriouMichel Despont
    • G11B9/00
    • G11B11/007B82Y10/00G11B9/1472
    • A storage device including a storage medium for storing data in the form of topographic or magnetic marks. At least one probe is mounted on a common frame, the common frame and the storage medium designed for moving relative to each other for creating or detecting said marks. Each probe includes a tip facing the storage medium, a read sensing element, a write element and a capacitive platform, that forms a first electrode and is designed for a voltage potential applied to it independent from a control signal for said read sensing element and for said voltage potential applied to said capacitive platform being independent from a control signal for said write heating element. It further comprises a second electrode arranged in a fixed position relative to the storage medium forming a first capacitor together wherein said first electrode and a medium between the first and second electrode.
    • 一种存储装置,包括用于以地形或磁标记的形式存储数据的存储介质。 至少一个探针安装在公共框架上,公共框架和存储介质被设计用于相对于彼此移动以创建或检测所述标记。 每个探针包括面向存储介质的尖端,读取感测元件,写入元件和电容平台,其形成第一电极,并被设计用于独立于用于所述读取感测元件的控制信号的施加于其的电压电位,并且为 施加到所述电容平台的所述电压电位独立于用于所述写入加热元件的控制信号。 它还包括布置在相对于存储介质固定位置的第二电极,形成第一电容器,其中所述第一电极和第一和第二电极之间的介质。
    • 26. 发明授权
    • Data overwriting in probe-based data storage devices
    • US07099257B2
    • 2006-08-29
    • US10440692
    • 2003-05-19
    • Theodoros AntonakopoulosGerd K. BinnigEvangelos S. Eleftheriou
    • Theodoros AntonakopoulosGerd K. BinnigEvangelos S. Eleftheriou
    • G11B7/0045
    • G11B20/10B82Y10/00G01Q80/00G11B9/14H03M5/04H03M5/145
    • Methods are provided for overwriting data in a probe-based data storage device (1) wherein data is represented by the presence and absence of pits formed in a storage surface (4) by a probe of the device. Input data is first coded such that successive bits of a first value in the coded input data are separated by at least one bit of the other value. Overwrite data bits v0, v1, v2, . . . , are generated from the coded input data bits b0, b1, b2, . . . , and the overwrite data bits v0, v1, v2, . . . , are then used to overwrite data on the storage surface (4). According to a first method, the overwrite data bits are generated such that, if a pit represents a bit of said first value in the data storage device (1) then vi={overscore (b)}i−1, for i≧1 and v0 has said first value, and if a pit represents a bit of said other value in the data storage device (1) then vi=bi−1 for i≧1 and v0 has said other value. According to a second method, the overwrite data bits are generated such that, if a pit represents a bit of said first value in the data storage device (1) then vi={overscore (b)}i−1({overscore (b)}i−2+bi) for i≧2, v0 has said first value and v1={overscore (b)}0, and if a pit represents a bit of said other value in the data storage device (1) then vi={overscore (({overscore (b)}i−1({overscore (b)}i−2+bi)))} for i≧2, v0 has said other value and v1=b0. With both methods, the result of the overwrite operation is to record either the coded input data b0, b1, b2, . . . , or its complement {overscore (b)}0, {overscore (b)}1, {overscore (b)}2, . . . , depending on whether a pit represents a bit having the first value or a bit having the other value. This result is independent of the bit values of the data which is overwritten.
    • 29. 发明授权
    • Data storage device
    • 数据存储设备
    • US07848213B2
    • 2010-12-07
    • US12185530
    • 2008-08-04
    • Peter BaechtoldJohannes G. BednorzGerd K. BinnigGiovanni CherubiniEvangelos S. EleftheriouMichel Despont
    • Peter BaechtoldJohannes G. BednorzGerd K. BinnigGiovanni CherubiniEvangelos S. EleftheriouMichel Despont
    • G11B9/00
    • G11B11/007B82Y10/00G11B9/1472
    • A storage device including a storage medium for storing data in the form of topographic or magnetic marks. At least one probe is mounted on a common frame, the common frame and the storage medium designed for moving relative to each other for creating or detecting said marks. Each probe includes a tip facing the storage medium, a read sensing element, a write element and a capacitive platform, that forms a first electrode and is designed for a voltage potential applied to it independent from a control signal for said read sensing element and for said voltage potential applied to said capacitive platform being independent from a control signal for said write heating element. It further comprises a second electrode arranged in a fixed position relative to the storage medium forming a first capacitor together wherein said first electrode and a medium between the first and second electrode.
    • 一种存储装置,包括用于以地形或磁标记的形式存储数据的存储介质。 至少一个探针安装在公共框架上,公共框架和存储介质被设计用于相对于彼此移动以创建或检测所述标记。 每个探针包括面向存储介质的尖端,读取感测元件,写入元件和电容平台,其形成第一电极,并被设计用于独立于用于所述读取感测元件的控制信号的施加于其的电压电位,并且为 施加到所述电容平台的所述电压电位独立于用于所述写入加热元件的控制信号。 它还包括布置在相对于存储介质固定位置的第二电极,形成第一电容器,其中所述第一电极和第一和第二电极之间的介质。
    • 30. 发明申请
    • SAMPLE ANALYSIS USING CANTILEVER PROBE
    • 使用CANTILEVER探针的样本分析
    • US20080271522A1
    • 2008-11-06
    • US12137559
    • 2008-06-12
    • Gerd K. Binnig
    • Gerd K. Binnig
    • G01B5/28
    • G01Q20/04G01Q30/04
    • A method and apparatus for analysis of a sample. The method includes an accessing operation for accessing a region of the sample via a tip of at least one probe mounted on a cantilever. A removing operation removes a sample material from the region that is accessed by the tip of the at least one probe mounted on the cantilever. A sensing operation senses a parameter associated to the removal of the sample material in the removing operation. The accessing, removing, and sensing operations are repeated to facilitate removal of at least one layer of the sample.
    • 用于样品分析的方法和装置。 该方法包括用于经由安装在悬臂上的至少一个探针的尖端访问样品区域的存取操作。 去除操作从安装在悬臂上的至少一个探针的尖端访问的区域中移除样品材料。 感测操作在去除操作中感测与去除样品材料有关的参数。 重复访问,去除和感测操作以便于去除至少一个样品层。