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    • 24. 发明授权
    • Colors only process to reduce package yield loss
    • 颜色只能减少包装产量损失
    • US06482669B1
    • 2002-11-19
    • US09867379
    • 2001-05-30
    • Yang-Tung FanChiou-Shian PengCheng-Yu ChuShih-Jane LinYen-Ming ChenFu-Jier FanKuo-Wei Lin
    • Yang-Tung FanChiou-Shian PengCheng-Yu ChuShih-Jane LinYen-Ming ChenFu-Jier FanKuo-Wei Lin
    • H01L2100
    • H01L27/14685H01L27/14621H01L27/14623H01L27/14627H01L27/14645H01L31/02162H01L31/02327
    • Disclosed is an ordered microelectronic fabrication sequence in which color filters are formed by conformal deposition directly onto a photodetector array of a CCD, CID, or CMOS imaging device to create a concave-up pixel surface, and, overlayed with a high transmittance planarizing film of specified index of refraction and physical properties which optimize light collection to the photodiode without additional conventional microlenses. The optically flat top surface serves to encapsulate and protect the imager from chemical and thermal cleaning treatment damage, minimizes topographical underlayer variations which aberrate or cause reflection losses of images formed on non-planar surfaces, and, obviates residual particle inclusions induced during dicing and packaging. A CCD imager is formed by photolithographically patterning a planar-array of photodiodes on a semiconductor substrate. The photodiode array is provided with metal photoshields, passivated, and, color filters are formed thereon. A transparent encapsulant is deposited to planarize the color filter layer and completes the solid-state color image-forming device without conventional convex microlenses.
    • 公开了一种有序的微电子制造顺序,其中滤色器通过直角沉积直接形成在CCD,CID或CMOS成像装置的光电检测器阵列上以形成凹入像素表面,并且覆盖有高透光率平面化膜 指定的折射率和物理性质,其优化光收集到光电二极管而不需要额外的常规微透镜。 光学平坦的顶表面用于封装和保护成像仪免受化学和热清洁处理损伤,最小化形成在非平面表面上的图像的像差或引起反射损失的形貌底层变化,并避免在切割和包装期间引起的残留颗粒夹杂物 。 通过在半导体衬底上光刻地构图光电二极管平面阵列来形成CCD成像器。 光电二极管阵列设置有金属遮光罩,钝化,并且在其上形成滤色器。 沉积透明密封剂以平坦化滤色器层并完成固态彩色图像形成装置,而不需要常规的凸起的微透镜。