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    • 21. 发明授权
    • Sequential tester for longest prefix search engines
    • 最长前缀搜索引擎的顺序测试器
    • US07548844B2
    • 2009-06-16
    • US11706943
    • 2007-02-13
    • Alexander E. AndreevAnatoli A. Bolotov
    • Alexander E. AndreevAnatoli A. Bolotov
    • G06F9/45
    • G01R31/31917Y10S707/99933
    • The present invention is directed to a sequential tester for longest prefix search engines. The tester may include a longest prefix search engine, an inputs generator for providing a nearly random flow of input commands to the longest prefix search engine and for outputting a floating rectangle which may represent a search table of the longest prefix search engine, a coding module for providing address and prefix information to the longest prefix search engine, a mapping module for providing data information to the longest prefix search engine, a super search engine for performing super search operations, and an analyzer for computing predicted outputs of the longest prefix search engine and for comparing the predicted outputs with actual outputs computed by the longest prefix search engine.
    • 本发明涉及一种用于最长前缀搜索引擎的顺序测试器。 测试器可以包括最长的前缀搜索引擎,用于向最长的前缀搜索引擎提供几乎随机的输入命令的输入生成器,并输出可以表示最长前缀搜索引擎的搜索表的浮动矩形,编码模块 用于向最长前缀搜索引擎提供地址和前缀信息,用于向最长前缀搜索引擎提供数据信息的映射模块,用于执行超级搜索操作的超级搜索引擎和用于计算最长前缀搜索引擎的预测输出的分析器 并将预测输出与由最长前缀搜索引擎计算的实际输出进行比较。
    • 22. 发明授权
    • Memory BISR architecture for a slice
    • 内存BISR架构为一片
    • US07430694B2
    • 2008-09-30
    • US11038698
    • 2005-01-20
    • Alexander E. AndreevSergey V. GribokAnatoli A. Bolotov
    • Alexander E. AndreevSergey V. GribokAnatoli A. Bolotov
    • G11C29/00G06F12/00
    • G11C29/44G11C29/4401G11C29/72
    • The present invention provides a memory BISR architecture for a slice. The architecture includes (1) a plurality of physical memory instances; (2) a Mem_BIST controller, communicatively coupled to the plurality of physical memory instances, for testing the plurality of physical memory instances; (3) a FLARE module, communicatively coupled to the Mem_BIST controller, including a scan chain of registers for storing test results of the plurality of physical memory instances, each of the plurality of physical memory instances M_i being assigned one FLARE bit f_i, i=1, 2, . . . , n, the FLARE module being used by the Mem_BIST controller to scan in an error vector F=(f—1, f—2, . . . , f_n); (4) a BISR controller, communicatively coupled to the FLARE module, a ROM module and a REPAIR_CONFIGURATION module, for scanning out the error vector F from the FLARE module to computer a repair configuration vector R=(r—1, r—2, . . . , r_n); and (5) a FUSE module, communicatively coupled to the BISR controller and the REPAIR_CONFIGURATION module, for storing the repair configuration vector R. The REPAIR_CONFIGURATION module, communicatively coupled to the plurality of physical memory instances M_i and an integrated circuit design D, includes switch module instances S for switching among the plurality of physical memory instances in accordance with the repair configuration vector R. The ROM module stores a vector U indicating usage of the plurality of physical memory instances M_i by the integrated circuit design D.
    • 本发明提供了一种用于切片的存储器BISR架构。 该架构包括(1)多个物理存储器实例; (2)通信地耦合到所述多个物理存储器实例的用于测试所述多个物理存储器实例的Mem_BIST控制器; (3)FLARE模块,通信地耦合到所述Mem_BIST控制器,包括用于存储所述多个物理存储器实例的测试结果的寄存器扫描链,所述多个物理存储器实例M_i中的每一个被分配一个FLARE位f_i,i = 1,2,... 。 。 ,n,由Mem_BIST控制器使用的FLARE模块以错误向量F =(f 1 - 1,f 2 - ,...,f_n)进行扫描; (4)通信地耦合到FLARE模块的BISR控制器,ROM模块和REPAIR_CONFIGURATION模块,用于从FLARE模块向计算机扫描出错误向量F,修复配置向量R =(r - > 1,r 2,...,r_n); 和(5)通信地耦合到BISR控制器和REPAIR_CONFIGURATION模块的FUSE模块,用于存储修复配置向量R.通信地耦合到多个物理存储器实例M_i和集成电路设计D的REPAIR_CONFIGURATION模块包括开关 模块实例S,用于根据修复配置向量R在多个物理存储器实例之间切换.ROM模块通过集成电路设计D存储指示多个物理存储器实例M_i的使用的向量U。
    • 23. 发明申请
    • Flexible hardware architecture for ECC/HECC based crytography
    • 基于ECC / HECC的基于冰箱的灵活硬件架构
    • US20080130873A1
    • 2008-06-05
    • US11999211
    • 2007-12-04
    • Anatoli A. BolotovMikhail I. GrinchukPaul G. FilsethLav D. Ivanovic
    • Anatoli A. BolotovMikhail I. GrinchukPaul G. FilsethLav D. Ivanovic
    • H04L9/28
    • H04L9/3066H04L2209/122
    • A circuit for implementing elliptic curve and hyperelliptic curve encryption and decryption operations, having a read only memory with no more than about two kilobytes of accessible memory, containing first programming instructions. An arithmetic logic unit has access to second programming instructions that are resident in a gate-level program disposed in the arithmetic logic unit, and is operable to receive data from no more than one input FIFO register. A microcontroller has no more than about two thousand gates, and is adapted to read the first programming instructions from the read only memory, send control signals to the arithmetic logic unit, and receive flags from the arithmetic logic unit. The arithmetic unit reads the third programming instructions, selectively performs elliptic curve and hyperelliptic curve encryption and decryption operations on the data according to the second programming instructions and the microcontroller, and sends output to no more than one output FIFO register.
    • 用于实现椭圆曲线和超椭圆曲线加密和解密操作的电路,具有不超过约两千字节可访问存储器的只读存储器,其包含第一编程指令。 算术逻辑单元可访问驻留在算术逻辑单元中的门级程序中的第二编程指令,并且可操作以从不超过一个输入FIFO寄存器接收数据。 微控制器不超过约二千门,适用于从只读存储器中读取第一个编程指令,向控制逻辑单元发送控制信号,并从算术逻辑单元接收标志。 算术单元读取第三个编程指令,根据第二个编程指令和微控制器选择性地对数据执行椭圆曲线和超椭圆曲线加密和解密操作,并将输出发送到不超过一个输出FIFO寄存器。
    • 25. 发明授权
    • Memory BISR controller architecture
    • 内存BISR控制器架构
    • US07328382B2
    • 2008-02-05
    • US11270077
    • 2005-11-09
    • Alexander E. AndreevSergey V. GribokAnatoli A. Bolotov
    • Alexander E. AndreevSergey V. GribokAnatoli A. Bolotov
    • G11C29/00G01R31/28
    • G11C29/44G06F11/00G11C29/4401G11C29/72
    • The present invention provides an architecture of a memory Built-In Self Repair (BISR) controller for connecting to N memory instances, where N is a positive integer greater than 1. The architecture includes N groups of data ports, N BISR_SUBMOD modules for connecting to the N memory instances, and a CLK_IN input port and a BISR_IN input port for setting configuration of the memory BISR controller. Each of the N groups of data ports includes (1) a PHY_IN output port for connecting to input of a corresponding memory instance; (2) a PHY_OUT input port for connecting to output of the corresponding memory instance; (3) a LOG_IN input port for sending signals to the corresponding memory instance; and (4) a LOG_OUT output port for receiving signals from the corresponding memory instance. Each of the N BISR_SUBMOD modules includes a flip-flop, a first mux and a second mux. The CLK_IN input port is connected to clock inputs of all N flip-flops of the memory BISR controller. The BISR_IN input port is connected to data input of a first flip-flop, and output of a K-th flip-flop is connected to input of a (K+1)-th flip-flop, K=1, 2, . . . , N-1. When at least one of the N memory instances is defective, the memory BISR controller may reconfigure connections among the N memory instances to use other memory instance(s) instead of the defective memory instance(s).
    • 本发明提供了一种用于连接到N个存储器实例的存储器内置自修复(BISR)控制器的架构,其中N是大于1的正整数。该架构包括N组数据端口,N个BISR_SUBMOD模块用于连接到 N个内存实例,以及用于设置内存BISR控制器配置的CLK_IN输入端口和BISR_IN输入端口。 N组数据端口中的每一个包括(1)用于连接到相应存储器实例的输入的PHY_IN输出端口; (2)用于连接到相应存储器实例的输出的PHY_OUT输入端口; (3)用于向相应的存储器实例发送信号的LOG_IN输入端口; 和(4)用于从相应的存储器实例接收信号的LOG_OUT输出端口。 N BISR_SUBMOD模块中的每一个包括触发器,第一多路复用器和第二复用器。 CLK_IN输入端口连接到存储器BISR控制器的所有N个触发器的时钟输入。 BISR_IN输入端口连接到第一触发器的数据输入,第K触发器的输出连接到第(K + 1)个触发器的输入,K = 1,2。 。 。 ,N-1。 当N个存储器实例中的至少一个存在缺陷时,存储器BISR控制器可以重新配置N个存储器实例之间的连接以使用其他存储器实例而不是缺陷存储器实例。