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    • 11. 发明授权
    • Chuck, a chuck control system, a lithography apparatus and a method of using a chuck
    • 卡盘,卡盘控制系统,光刻设备和使用卡盘的方法
    • US09494875B2
    • 2016-11-15
    • US14349900
    • 2012-09-19
    • ASML Netherlands B.V.
    • Sebastiaan Maria Johannes CornelissenNoud Jan GilissenAnko Jozef Cornelus SijbenRoger Wilhelmus Antonius Henricus SchmitzArnoud Willem NotenboomRonald Van Der WilkManon Elise Will
    • G03F7/20H01L21/683G10L15/08G10L15/22
    • G03F7/70708G03F7/707G03F7/70875G03F7/70908G10L15/08G10L2015/223H01L21/6831
    • A chuck, chuck control system, lithographic apparatus and method of using a chuck are disclosed. In an embodiment, there is provided a chuck (43) for use in holding a patterning device (MA) or a substrate (W) onto a supporting table (MT, WT) of a lithography apparatus (100) by electrostatic force, in which the patterning device is for imparting a radiation beam (B) with a pattern in its cross-section to form a patterned radiation beam, and the substrate is for receiving the patterned radiation beam; said chuck comprising: a dielectric member (45); a temperature conditioning fluid channel (48) formed within the chuck; a drive electrode (40, 42) for applying a potential difference between the drive electrode and the patterning device or substrate across the dielectric member in order to electrostatically attract the patterning device or substrate towards the drive electrode; and a first shield electrode (60) for reducing or preventing the development of an electric field across temperature conditioning fluid in the temperature conditioning fluid channel due to a voltage applied to the drive electrode, in order to reduce or prevent electrolysis in the fluid.
    • 公开了一种卡盘,卡盘控制系统,光刻设备和使用卡盘的方法。 在一个实施例中,提供了一种用于通过静电力将图案形成装置(MA)或基板(W)保持在光刻设备(100)的支撑台(MT,WT)上的卡盘,其中 图案形成装置用于在其横截面中赋予具有图案的辐射束(B)以形成图案化的辐射束,并且该衬底用于接收图案化的辐射束; 所述卡盘包括:电介质构件(45); 形成在卡盘内的温度调节流体通道(48) 用于在驱动电极和图案形成装置或基板之间跨越电介质构件施加电位差的驱动电极(40,42),以便静电地将图案形成装置或衬底吸引到驱动电极; 以及第一屏蔽电极(60),用于由于施加到驱动电极的电压而减少或防止温度调节流体通道中温度调节流体的电场的发展,以便减少或防止流体中的电解。
    • 16. 发明申请
    • ELECTROSTATIC CHUCK CLEANER, CLEANING METHOD, AND EXPOSURE APPARATUS
    • 静电清洗机,清洁方法和曝光装置
    • US20150261104A1
    • 2015-09-17
    • US14466250
    • 2014-08-22
    • KABUSHIKI KAISHA TOSHIBA
    • TAKASHI KAMOYOSHIHITO KOBAYASHI
    • G03F7/20B08B7/00H02N13/00
    • G03F7/70708G03F7/70925
    • According to one embodiment, an electrostatic chuck cleaner cleaning an adsorption face of an electrostatic chuck capable of attracting a reticle, and the cleaner includes: a plurality of substrates; adhesive layers provided on a major surface of each of the substrates, the adhesive layers being pressed against the adsorption face; and conductive layers provided on the major surface of each of the substrates, and the conductive layers being provided in a region other than a region where the adhesive layer being provided. The adhesive layers provided on the major surface of each of the substrates are disposed in different regions, and the entire adsorption face is pressed by the adhesive layers when the adhesive layers of the substrates are pressed against the adsorption face.
    • 根据一个实施例,一种能够吸收能够吸引掩模版的静电卡盘的吸附面的静电卡盘清洁器,并且所述清洁器包括:多个基板; 粘合剂层设置在每个基材的主表面上,粘合剂层压在吸附面上; 以及设置在每个基板的主表面上的导电层,并且导电层设置在除了设置有粘合剂层的区域之外的区域中。 设置在各基板的主表面上的粘合层设置在不同的区域中,并且当基板的粘合剂层压在吸附面上时,整个吸附面被粘合层挤压。
    • 19. 发明申请
    • Method of Overlay In Extreme Ultra-Violet (EUV) Lithography
    • 极紫外(EUV)平版印刷方法
    • US20150077733A1
    • 2015-03-19
    • US14029844
    • 2013-09-18
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Chia-Ching HuangChia-Hao HsuChia-Chen Chen
    • G03F7/20H01L21/683
    • G03F7/70708C23C16/042C23C16/34C23C16/56G03F7/70633G03F7/70783H01L21/6833Y10T29/49155
    • Some embodiments of the present disclosure relate to a method of overlay control which utilizes a deformable electrostatic chuck. The method comprises exposing a substrate to radiation which is reflected off of a reticle. The reticle is mounted to a deformable electrostatic chuck by a plurality of raised contacts, where each raised contact is configured to independently vary in height from a surface of the deformable electrostatic chuck. After exposure of the substrate to radiation which is reflected off of the reticle, a displacement between a first alignment shape formed on a first layer disposed on a surface of the substrate and a second alignment shape formed by the exposure is measured. The height of one or more of the plurality of raised contact is changed based upon the displacement to alter a surface topology of the reticle, which negates some effects of clamping topology. Other embodiments are also disclosed.
    • 本公开的一些实施例涉及利用可变形的静电卡盘的覆盖控制的方法。 该方法包括将衬底暴露于从掩模版反射的辐射。 通过多个凸起的触点将掩模版安装到可变形的静电卡盘上,其中每个凸起的触点构造成独立地从可变形的静电卡盘的表面改变高度。 在将衬底暴露于从掩模版反射的辐射之后,测量形成在设置在衬底表面上的第一层上形成的第一对准形状与通过曝光形成的第二取向形状之间的位移。 基于位移改变多个凸起接触中的一个或多个的高度,以改变掩模版的表面拓扑,这消除了钳位拓扑的一些影响。 还公开了其他实施例。
    • 20. 发明申请
    • ELECTROSTATIC CLAMP
    • 静电夹
    • US20150036258A1
    • 2015-02-05
    • US14380622
    • 2013-01-29
    • ASML Netherlands B.V.
    • Tjarko Adriaan Rudolf Van Empel
    • H01L21/683
    • H01L21/6833G03F7/70708
    • An electrostatic clamp configured to, in use, hold an article, such as a reticle or a wafer in a lithographic apparatus. The clamp includes a lower portion; an upper portion formed of a dielectric material, and a plurality of electrodes disposed between the lower portion and the upper portion. The electrodes include a first electrode configured in use to be held at a first voltage, at least one intermediate electrode configured in use to be held at a second voltage, and a ground electrode. The at least one intermediate electrode is located between the first electrode and the ground electrode and the second voltage is between the first voltage and ground to reduce the voltage across a barrier between the electrodes and so reduce the risk of high-voltage breakdown.
    • 构造成在使用中的静电夹持器将光学设备中的物品(例如光罩或晶片)保持在其中。 夹具包括下部; 由介电材料形成的上部,以及设置在下部与上部之间的多个电极。 电极包括被配置为保持在第一电压的第一电极,至少一个中间电极被配置为保持在第二电压,以及接地电极。 所述至少一个中间电极位于第一电极和接地电极之间,并且第二电压在第一电压和地之间,以降低电极之间的屏障上的电压,并因此降低高压击穿的风险。