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    • 19. 发明申请
    • ADHESION IMPROVEMENT BETWEEN CVD DIELECTRIC FILM AND CU SUBSTRATE
    • CVD介质膜与铜基板之间的粘合改进
    • US20140272187A1
    • 2014-09-18
    • US14180339
    • 2014-02-13
    • Applied Materials, Inc.
    • Tae Kyung WONYi CUIBeom Soo PARKSoo Young CHOI
    • C23C16/02C23C16/34
    • C23C16/345C23C16/0245
    • Methods of forming dielectric layers on a copper substrate are disclosed herein. In one embodiment, a method of depositing a dielectric layer can include positioning a copper substrate in a process chamber, forming and delivering the cleaning plasma to the substrate to form a cleaned surface on the substrate, forming and delivering the adhesion plasma to the surface of the substrate to form a copper compound thereon and depositing a dielectric layer over the copper compound. In another embodiment, a method of depositing a dielectric layer can include positioning a copper substrate in a process chamber, delivering an adhesion plasma to the copper substrate to form a copper compound and flowing a deposition gas into the process chamber to deposit a dielectric layer over the copper compound, wherein the flow between the adhesion plasma and the deposition gas is continuous.
    • 本文公开了在铜基底上形成电介质层的方法。 在一个实施例中,沉积电介质层的方法可以包括将铜衬底定位在处理室中,形成并将清洁等离子体输送到衬底,以在衬底上形成清洁表面,形成并将粘合等离子体输送到 所述基板在其上形成铜化合物并在所述铜化合物上沉积介电层。 在另一个实施例中,沉积电介质层的方法可以包括将铜衬底定位在处理室中,将粘合等离子体输送到铜衬底以形成铜化合物并将沉积气体流入处理室以沉积介电层 铜化合物,其中粘附等离子体和沉积气体之间的流动是连续的。