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    • 13. 发明授权
    • Illumination system and projection exposure apparatus
    • 照明系统和投影曝光装置
    • US06392742B1
    • 2002-05-21
    • US09323031
    • 1999-06-01
    • Toshihiko Tsuji
    • Toshihiko Tsuji
    • G03B2754
    • G03F7/70183
    • An illumination system includes a light source, an emission angle preserving optical element for emitting light from the light source, at a certain emission angle, a collecting optical system for collecting the light from the emission angle preserving optical element, a pattern forming optical system having at least a diffractive optical element, for producing, on a predetermined plane, a light pattern of a desired shape having a uniform light intensity distribution, by use of light from the light collecting optical system, a multiple-beam producing system for producing a plurality of light beams, a zooming optical system for projecting the light intensity distribution on the predetermined plane, onto a light entrance surface of the multiple-beam producing system at a predetermined magnification, and an illuminating device for superposedly projecting lights from a light exit surface of the multiple-beam producing system, upon a surface to be illuminated.
    • 照明系统包括:光源,用于以一定的发射角发射来自光源的光的发射角保持光学元件,用于收集来自发射角保持光学元件的光的收集光学系统;具有 至少一个衍射光学元件,用于在预定平面上通过使用来自聚光光学系统的光产生具有均匀光强分布的所需形状的光图案,用于产生多个光束的多光束产生系统 的光束,用于将预定平面上的光强度分布投射到预定放大倍数的多光束产生系统的光入射表面上的变焦光学系统,以及用于将来自光束的光出射表面的光重叠地投射的照明装置 多光束产生系统在被照射的表面上。
    • 14. 发明授权
    • Inspection method and apparatus for projection optical systems
    • 投影光学系统的检测方法和装置
    • US06169602A
    • 2001-01-02
    • US09253711
    • 1999-02-22
    • Tetsuo TaniguchiToshihiko Tsuji
    • Tetsuo TaniguchiToshihiko Tsuji
    • G01B1100
    • G03F7/70358G03F7/706G03F7/70691
    • The present invention relates to a method of detecting an image formation characteristic of a projection optical system for projecting a reference pattern on a reticle on a substrate. According to the detection method, a reticle stage is moved so that a reference mark on the reticle comes to a first reference position and a second reference position, and a wafer stage is moved so that a light transmission portion on the wafer stage crosses an image forming position of a projected image of the reference mark obtained through the projection optical system. The positions of the reticle stage and the wafer stage at the first and second reference positions are measured as moved distances of the stages, respectively. From the distances of movement of the reticle and wafer stages measured, the image formation characteristic of the projection optical system is calculated.
    • 本发明涉及一种检测投影光学系统的图像形成特性的方法,用于将基准图案投影在基板上的掩模版上。 根据检测方法,移动标线片台,使得标线上的基准标记进入第一基准位置和第二基准位置,并移动晶片台,使得晶片台上的光透射部分跨越图像 形成通过投影光学系统获得的参考标记的投影图像的位置。 在第一和第二参考位置处的标线片台和晶片台的位置分别被测量为阶段的移动距离。 从测量的标线片和晶片台的移动距离来计算投影光学系统的图像形成特性。
    • 15. 发明授权
    • Projection exposure apparatus having function of detecting intensity
distribution of spatial image, and method of detecting the same
    • 具有检测空间图像的强度分布功能的投影曝光装置及其检测方法
    • US5798838A
    • 1998-08-25
    • US713719
    • 1996-09-13
    • Tetsuo TaniguchiToshihiko TsujiTadashi Nagayama
    • Tetsuo TaniguchiToshihiko TsujiTadashi Nagayama
    • G03F7/20H01L21/30G01B11/00
    • G03F7/70591G03F7/70133G03F7/70241G03F7/70258G03F7/70358
    • The invention relates to a projection exposure apparatus for detecting a light-intensity distribution of a spatial image of a mask pattern formed through a projection optical system. The projection exposure apparatus has a knife-edge member which is disposed on the main surface of a wafer stage such that a plane including an exposure surface of a photosensitive substrate is leveled with a light incidence surface of the knife-edge member. The knife-edge member has a transmission area for transmitting the exposure light passing through the projection optical system, a light shielding area for preventing transmission of the exposure light, and a knife-edge defined as a boundary line between the transmission area and the light shielding area. The projection exposure apparatus detects the light-intensity distribution of light from the spatial image while moving the spatial image of the mask pattern and the knife-edge of the knife-edge member relatively to each other. The information related to the light-intensity distribution is used in optically adjusting a projection optical system, or the like.
    • 本发明涉及一种用于检测通过投影光学系统形成的掩模图案的空间图像的光强度分布的投影曝光装置。 投影曝光装置具有刀片部件,其设置在晶片台的主表面上,使得包括感光基板的曝光表面的平面与刀刃部件的光入射面平齐。 刀刃部件具有用于透射通过投影光学系统的曝光光的透射区域,用于防止曝光光的透射的遮光区域和被定义为透射区域与光线之间的边界线的刀刃 屏蔽区域。 投影曝光装置在将掩模图案的空间图像和刀刃部件的刀刃相对于彼此移动的同时,检测来自空间图像的光的光强度分布。 与光强分布有关的信息用于光学调整投影光学系统等。
    • 18. 发明授权
    • Color tone control device in color television receiver
    • 彩色电视接收机中的色调控制装置
    • US4021843A
    • 1977-05-03
    • US544268
    • 1975-01-27
    • Yoshisada TaniguchiToshihiko TsujiMasanori Oguino
    • Yoshisada TaniguchiToshihiko TsujiMasanori Oguino
    • H04N9/64H04N9/535
    • H04N9/643
    • Red, blue and green color difference signals are supplied to the bases of first, second and third transistors amplifying the tri-color signals of red, blue and green, and a luminance signal is introduced to the emitter of each transistor through a parallel circuit of two resistors. One of the resistors in each parallel circuit is connected through a switch. The switches are associatively operated so that the on-off operation of the switch connected to the emitter of the first transistor is opposite to that of the switches connected to the emitters of the second and the third transistor. By operating the switches, the amplification degree of the first transistor is increased and simultaneously the amplification degrees of the second and third transistors are decreased, and therefore an image with red emphasized can be obtained with no change in luminance.
    • 红色,蓝色和绿色差信号被提供给放大红色,蓝色和绿色三色信号的第一,第二和第三晶体管的基极,并且亮度信号通过并行电路被引入到每个晶体管的发射极 两个电阻。 每个并联电路中的一个电阻通过开关连接。 这些开关被联接操作,使得连接到第一晶体管的发射极的开关的导通截止操作与连接到第二和第三晶体管的发射极的开关的开关操作相反。 通过操作开关,第一晶体管的放大度增加,同时第二和第三晶体管的放大度减小,因此可以获得亮度不变的红色图像。
    • 20. 发明申请
    • IMAGING APPARATUS
    • 成像设备
    • US20120327208A1
    • 2012-12-27
    • US13488601
    • 2012-06-05
    • Yoshinari HigakiMiyoko KawashimaToshihiko Tsuji
    • Yoshinari HigakiMiyoko KawashimaToshihiko Tsuji
    • H04N5/217H04N7/18
    • G02B21/365G02B13/18G02B27/0068H04N5/3572
    • An imaging apparatus comprises: an imaging unit having an imaging optical system and an imaging device; a measuring unit that measures, for each of a plurality of regions on a specimen, an optical aberration or a physical quantity causing the aberration before the imaging of the specimen is performed; a plurality of optical elements that are inserted in an optical path of the imaging optical system for correcting the aberration and that differ in correction amount; and a control unit that selects an optical element from among the optical elements on the basis of a measurement result of the measuring unit, and inserts the selected optical element into the optical path of the imaging optical system before the imaging of the specimen. The imaging optical system is configured to be capable of forming simultaneously images of the plurality of regions on the imaging device.
    • 一种成像装置包括:具有成像光学系统和成像装置的成像单元; 测量单元,其针对样本的多个区域中的每一个测量导致在所述样本的成像之前产生像差的光学像差或物理量; 多个光学元件,其插入到成像光学系统的光路中,用于校正像差,并且校正量不同; 以及控制单元,其基于所述测量单元的测量结果从所述光学元件中选择光学元件,并且在所述样本的成像之前将所选择的光学元件插入所述成像光学系统的光路中。 成像光学系统被配置为能够同时形成成像装置上的多个区域的图像。