会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 15. 发明授权
    • Pattern generator for memory burn-in and test
    • 图形发生器用于内存老化和测试
    • US6006345A
    • 1999-12-21
    • US853597
    • 1997-05-09
    • Robert W. Berry, Jr.
    • Robert W. Berry, Jr.
    • G11C29/20G11C29/36G11C29/38G06F11/00
    • G11C29/36G11C29/20G11C29/38
    • A system and method for testing of a memory during burn-in is disclosed. In one aspect, the method and system include an address generator. The address generator includes a shift register means. The shift register includes n bit positions. The n bit positions are for storing n bits. The n bits are capable of being in a plurality of patterns. The address generator further includes a counter coupled to the shift register means. The counter includes a value that is incremented in response to a particular pattern of the plurality of patterns. The address generator has a complement mechanism coupled to the shift register and the counter which provides a complement of at least a portion of the n bits stored in the n bit positions in response to the value in the counter. In another aspect, the method and system comprise the address generator previously discussed coupled to the memory undergoing testing. In this aspect, the method and system further have a data generator coupled to the address generator and the memory and compare circuitry coupled to the memory and the data generator. In this aspect, a fail is detected when data from the data generator does not match data stored in the memory.
    • 公开了一种用于在老化期间测试存储器的系统和方法。 一方面,该方法和系统包括地址生成器。 地址发生器包括移位寄存器装置。 移位寄存器包括n位位置。 n位位置用于存储n位。 n位能够处于多个模式。 地址发生器还包括耦合到移位寄存器装置的计数器。 计数器包括响应于多个模式的特定模式而递增的值。 地址发生器具有耦合到移位寄存器和计数器的补码机制,该计数器响应于计数器中的值提供存储在n位位置中的n位的至少一部分的补码。 在另一方面,该方法和系统包括先前讨论的地址生成器,其耦合到正在进行测试的存储器。 在这方面,该方法和系统还具有耦合到地址发生器和存储器的数据发生器,以及耦合到存储器和数据发生器的比较电路。 在这方面,当来自数据发生器的数据与存储在存储器中的数据不匹配时,检测到故障。