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11. 发明申请

US20060000714A1 Capillary array electrophoresis apparatus and method of separating and analyzing specimen 有权
公开(公告)号：US20060000714A1
公开(公告)日：2006-01-05
申请号：US11188644
申请日：2005-07-26
申请人： Masaya Kojima , Muneo Maeshima , Yoshiyuki Okishima , Tomohiro Shoji , Wataru Matsuo
发明人： Masaya Kojima , Muneo Maeshima , Yoshiyuki Okishima , Tomohiro Shoji , Wataru Matsuo
IPC分类号： C02F1/40 , G01N27/27
CPC分类号： G01N27/44782 , G01N27/44704
摘要： At a wall constituting a space for a thermostatic oven in an electrophoresis apparatus, a capillary array attachment portion is formed which permits attachment of a plurality of capillary arrays having different length. Thereby, a selected capillary array constituted by collecting a plurality of capillaries can be easily attached to the electrophoresis apparatus depending on measurement purpose.

12. 发明授权

US06660148B2 Electrophoretic method and electrophoretic instrument therefor 失效
标题翻译：电泳法及电泳仪
公开(公告)号：US06660148B2
公开(公告)日：2003-12-09
申请号：US09793242
申请日：2001-02-26
申请人： Tomohiro Shoji , Yoshiyuki Okishima , Masaya Kojima , Muneo Maeshima
发明人： Tomohiro Shoji , Yoshiyuki Okishima , Masaya Kojima , Muneo Maeshima
IPC分类号： G01N27447
CPC分类号： G01N27/44704
摘要： An injection syringe 14 for injecting a gel into a capillary 111, a charging syringe 15 for charging the injection syringe 14 with the gel 10 are attached to a block 17. A check valve 16 is inserted between the both syringes, and the check valve 16 works so as to prevent the gel 10 from flowing back to the charging syringe 15. As the result, the gel charging can be automated, and accordingly the processing ability of the electrophoretic instrument can be improved.
摘要翻译：将用于将凝胶注入毛细管111的注射器14，用于将注射器14与凝胶10一起充注的注射器15安装在块17上。止回阀16插入两个注射器之间，止回阀16 工作以防止凝胶10回流到充电注射器15.结果，凝胶充电可以自动化，因此可以提高电泳仪器的处理能力。

13. 发明申请

US20050196778A1 Nucleic acid analysis apparatus 审中-公开
标题翻译：核酸分析仪
公开(公告)号：US20050196778A1
公开(公告)日：2005-09-08
申请号：US11013403
申请日：2004-12-17
申请人： Shuhei Yamamoto , Muneo Maeshima , Katsunobu Hama , Satoshi Takahashi
发明人： Shuhei Yamamoto , Muneo Maeshima , Katsunobu Hama , Satoshi Takahashi
IPC分类号： G01N21/64 , C12M1/00 , C12M1/34 , C12N15/09 , C12Q1/68 , G01N21/78 , G01N33/53 , G01N37/00
CPC分类号： C12Q1/6834 , G01N21/6452 , G01N21/6456 , G01N2201/062 , C12Q2565/619
摘要： An apparatus measures individual measurement sites on a DNA chip in a short period of time. The DNA chip is irradiated by light-emitting diodes (LEDs) so as to excite fluorescent dye at each measurement site, and fluorescence emitted from the individual measurement sites is detected all at once. Since substantially uniform measurement conditions can be obtained for each measurement site, measurement accuracy increases. The read mechanism requires less space and is less costly, thereby decreasing the failure rate and virtually eliminating the need for maintenance of the apparatus.
摘要翻译：一种装置在短时间内测量DNA芯片上的各个测量位置。 DNA芯片被发光二极管（LED）照射，以便在每个测量部位激发荧光染料，并且一次检测到从各测量点发射的荧光。由于每个测量点可以获得大致均匀的测量条件，所以测量精度提高。读取机构需要更少的空间并且成本更低，从而降低故障率并且几乎消除了维护设备的需要。

14. 发明授权

US06191849B1 Wafer inspecting apparatus 有权
标题翻译：晶圆检查仪
公开(公告)号：US06191849B1
公开(公告)日：2001-02-20
申请号：US09219873
申请日：1998-12-24
申请人： Muneo Maeshima , Kazuo Takeda , Shigeru Matsui
发明人： Muneo Maeshima , Kazuo Takeda , Shigeru Matsui
IPC分类号： G01N2147
CPC分类号： G01N21/9501 , G01N21/9505
摘要： Disclosed is a wafer inspecting apparatus suitable to determine whether a scattering substance is a surface foreign matter or an internal defect even if the particle size of the scattering substance is smaller than the wavelength of irradiation rays used for inspection. The wafer is obliquely irradiated with irradiation rays at the Brewster angle, and scattered rays which are scattered from a scattering substance on or in the wafer are detected at and angle 0° and an angle of the Brewster angle or more by detectors. Then, it is determined whether the scattering substance is a surface foreign matter or an internal defect on the basis of a ratio between the intensities of the scattered rays detected by the detectors. The intensity of scattered rays which are scattered from a surface foreign matter and detected at an angle of the Brewster angle or more is larger than the intensity of scattered rays which are scattered from the foreign matter and detected at an angle 0°, and the intensity of scattered rays which are scattered from an internal defect and detected at an angle of the Brewster angle or more is smaller than the intensity of scattered rays which are scattered from the internal defect and detected at an angle 0°. This makes it possible to distinguish the surface foreign matter and the internal defect from each other.
摘要翻译：公开了一种适用于确定散射物质是表面异物还是内部缺陷的晶片检查装置，即使散射物质的粒径小于用于检查的照射射线的波长。以布鲁斯特角度的照射光线倾斜照射晶片，从晶片上或晶片上的散射物质散射的散射光线以0°的角度和布鲁斯特角度以上的角度检测。然后，基于由检测器检测到的散射光线的强度之间的比例来确定散射物质是表面异物还是内部缺陷。从表面异物散射并以布鲁斯特角度以上的角度检测的散射光的强度大于从异物散射并以0°的角度检测的散射光的强度，强度从内部缺陷散射并以布鲁斯特角度以上的角度检测的散射光的散射光小于从内部缺陷散射并以0°的角度检测的散射光的强度。这使得可以将表面异物和内部缺陷彼此区分开。

15. 发明授权

US6160615A Surface measurement apparatus for detecting crystal defects of wafer 有权
标题翻译：用于检测晶片的晶体缺陷的表面测量装置
公开(公告)号：US6160615A
公开(公告)日：2000-12-12
申请号：US255766
申请日：1999-02-23
申请人： Shigeru Matsui , Muneo Maeshima , Isao Nemoto
发明人： Shigeru Matsui , Muneo Maeshima , Isao Nemoto
IPC分类号： H01L21/66 , G01N21/94 , G01N21/95 , G01N21/956 , H01L21/00 , G01N21/00 , C23C16/00 , G01B11/06
CPC分类号： H01L21/67288 , G01N21/94 , G01N21/9501
摘要： A sample is supported flat in high precision by a sample chuck, and is easily mounted and dismounted.A wafer lifting mechanism is arranged in a position separated from a rotating system of a rotatable wafer chuck, and a wafer is lifted from a supporting surface by moving the wafer lifting mechanism upward to let pins penetrate through through holes of the wafer chuck under a state that the wafer chuck is stopped at a sample mounting-and-dismounting position.
摘要翻译：样品通过样品卡盘以高精度平坦地支撑，并且易于安装和拆卸。将晶片升降机构设置在与旋转晶片卡盘的旋转系统分离的位置，通过向上移动晶片升降机构使晶片从支撑面抬起，以使引脚在状态下穿过晶片卡盘的通孔晶片卡盘停在样品安装和拆卸位置。

16. 发明授权

US6157444A Defect inspection apparatus for silicon wafer 有权
标题翻译：硅片缺陷检查装置
公开(公告)号：US6157444A
公开(公告)日：2000-12-05
申请号：US198644
申请日：1998-11-24
申请人： Koji Tomita , Muneo Maeshima , Shigeru Matsui , Hitoshi Komuro , Kazuo Takeda
发明人： Koji Tomita , Muneo Maeshima , Shigeru Matsui , Hitoshi Komuro , Kazuo Takeda
IPC分类号： G01N21/95 , G01N21/88
CPC分类号： G01N21/9505 , G01N21/9501
摘要： In order to easily evaluate defects of the silicon wafer affecting the characteristic of a device, the present invention provides a defect inspection apparatus for detecting defects existing on a surface of a sample and/or inside the sample, which comprises a display apparatus for displaying a distribution of the defects on a graph having coordinate axes of distance from a central position of the sample and the depth where the defect exists based on the depth information and the positional information obtained by a detecting means.
摘要翻译：为了容易地评估影响器件特性的硅晶片的缺陷，本发明提供了一种用于检测存在于样品表面和/或样品内部的缺陷的缺陷检查装置，其包括显示装置基于由检测装置获得的深度信息和位置信息，在具有距离样本的中心位置的距离的坐标轴和存在缺陷的深度的图形上的缺陷的分布。

17. 发明授权

US10302641B2 Automatic analysis device 有权
公开(公告)号：US10302641B2
公开(公告)日：2019-05-28
申请号：US14766377
申请日：2014-01-23
申请人： Shunichiro Nobuki , Muneo Maeshima , Terumi Tamura , Kenta Imai
发明人： Shunichiro Nobuki , Muneo Maeshima , Terumi Tamura , Kenta Imai
IPC分类号： G01N21/05 , G01N21/69 , G01N21/76 , G01N27/74 , G01N35/00 , G01N33/543 , G01N33/561
摘要： An analyzing device of the present invention is provided with a flow chamber that a fluid including magnetic particles associated with a labeling substance flows from a fluid inlet to a fluid outlet, magnetic trap means to apply a magnetic field for trapping the magnetic particles to the fluid in the flow chamber, a working electrode and a counter electrode to apply a voltage to the magnetic particles trapped by the magnetic trap means, and to emit a luminescence, a light detection element to detect a luminescence derived from the labeling substance on the magnetic particles trapped in the flow chamber, and regulating means to regulate a region that the light detection element detects the luminescence derived from the labeling substance on a part of magnetic particles of them trapped by the magnetic trap means.

18. 发明授权

US09109194B2 Device for harvesting bacterial colony and method therefor 有权
标题翻译：收获细菌菌落的装置及其方法
公开(公告)号：US09109194B2
公开(公告)日：2015-08-18
申请号：US13505803
申请日：2010-11-05
申请人： Toshifumi Honda , Hiroko Fujita , Muneo Maeshima , Akira Maekawa , Yoshiko Ishida , Yuta Urano , Shinya Murakami
发明人： Toshifumi Honda , Hiroko Fujita , Muneo Maeshima , Akira Maekawa , Yoshiko Ishida , Yuta Urano , Shinya Murakami
IPC分类号： G06K9/00 , C12M1/26
CPC分类号： C12M33/00 , C12M41/36
摘要： When multiple kinds of bacterial colonies are present in a petri dish and, for example, a drug tolerance is to be measured, harvesting of mixed colonies of different types of bacteria makes it impossible to accurately determine the drug tolerance. Also, it is required to improve the throughput of a device for harvesting a bacterial colony. From images illuminated from multiple directions, isolating bacterial colonies are automatically extracted. Next, the image feature amounts are calculated from the multiple images that are illuminated from multiple directions and colonies are grouped depending on the feature amounts. Then, bacterial colonies to be harvested are determined based on the results of the grouping.
摘要翻译：当培养皿中存在多种细菌菌落时，例如测定药物耐受性时，收集不同类型细菌的混合菌落使得不可能准确地确定药物耐受性。此外，需要提高用于收获细菌菌落的装置的产量。从多个方向照射的图像，分离细菌菌落被自动提取。接下来，根据从多个方向照明的多个图像计算图像特征量，并且根据特征量对殖民地进行分组。然后，基于分组的结果确定要收获的细菌菌落。

19. 发明申请

US20120141330A1 AUTOMATIC ANALYZER 有权
标题翻译：自动分析仪
公开(公告)号：US20120141330A1
公开(公告)日：2012-06-07
申请号：US13382316
申请日：2010-07-05
申请人： Sakuichiro Adachi , Muneo Maeshima , Isao Yamazaki , Tomonori Mimura
发明人： Sakuichiro Adachi , Muneo Maeshima , Isao Yamazaki , Tomonori Mimura
IPC分类号： G01N21/00
CPC分类号： G01N21/51 , G01N15/0205 , G01N21/253 , G01N2015/0065 , G01N2035/00396 , G01N2035/0453
摘要： To be adapted to various types of latex reagents for detecting scattered light and thereby measuring agglutination reactions with high sensitivity while sufficiently ensuring integration time. To be adapted to various types of latex particles of different particle sizes, a plurality of light receivers are arranged in a plane perpendicular to the direction of cell movement by rotation of a cell disk. To ensure sufficient integration time, the angle between the optical axis of the irradiation light and each of a plurality of optical axes of scattered light viewed from above the cell is made equal to or less than 17.7° including a mounting error.
摘要翻译：适用于各种类型的用于检测散射光的乳胶试剂，从而以高灵敏度测量凝集反应，同时充分确保积分时间。为了适应于各种类型的不同粒度的胶乳颗粒，多个光接收器通过旋转细胞盘而布置在垂直于细胞移动方向的平面中。为了确保足够的积分时间，使得照射光的光轴与从电池单元的上方观察的散射光的多个光轴中的每一个之间的角度等于或小于包括安装误差的17.7°。

20. 发明授权

US06256092B1 Defect inspection apparatus for silicon wafer 有权
标题翻译：硅片缺陷检查装置
公开(公告)号：US06256092B1
公开(公告)日：2001-07-03
申请号：US09198093
申请日：1998-11-23
申请人： Koji Tomita , Muneo Maeshima , Shigeru Matsui , Yoshitaka Kodama , Hitoshi Komuro , Kazuo Takeda
发明人： Koji Tomita , Muneo Maeshima , Shigeru Matsui , Yoshitaka Kodama , Hitoshi Komuro , Kazuo Takeda
IPC分类号： G01N2188
CPC分类号： G01N21/9505 , G01N21/9501
摘要： A defect inspection apparatus for detecting defects existing on a surface of a semiconductor sample and/or inside the sample based on light information from the sample obtained by irradiating a light beam onto the sample is provided, which comprises a detecting means for detecting positions in the depth direction where the defects exist and distribution of the defects based on the light information; a setting means for setting a position in the depth direction where defects exist; and a means for displaying the distribution of the defects obtained by the detecting means, the displaying means displaying the distribution of the defects corresponding to the position in the depth direction set by the setting means.
摘要翻译：一种缺陷检查装置，用于根据来自通过将光束照射在样品上的样品的光信息，检测存在于半导体样品表面和/或样品内部的缺陷，该检测装置包括检测装置，存在缺陷的深度方向和基于光信息的缺陷分布; 用于设置存在缺陷的深度方向上的位置的设定装置; 以及用于显示由检测装置获得的缺陷的分布的装置，显示装置显示与由设置装置设置的深度方向上的位置相对应的缺陷的分布。

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