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    • 18. 发明授权
    • Structure for integrated circuit for measuring set-up and hold times for a latch element
    • 用于测量闩锁元件的设置和保持时间的集成电路的结构
    • US07930663B2
    • 2011-04-19
    • US12111609
    • 2008-04-29
    • Larry Wissel
    • Larry Wissel
    • G06F17/50
    • G11C29/003G01R31/31725G11C11/41G11C29/50
    • A design structure for an integrated circuit (IC) includes circuitry for measuring accurately at least one of set-up and hold times of a flip-flop included in the IC design. The circuitry uses data determined at the location of the flip-flop in the IC, and includes a first delay element driven by a first clock and configured to supply a zero-delay value of the first clock to a first flip-flop. The circuitry also includes a second delay element having a selectable delay, the second delay element configured to supply a first delayed version of the first clock to a second flip-flop, wherein an output of the first flip-flop is coupled to an input of the second flip-flop. A third delay element has a selectable delay and is coupled in series with the second delay element to supply a second delayed version of the first clock to a third flip-flop, and an output of the second flip-flop is coupled to an input of the third flip-flop. The second delayed version of the clock signal drives the third flip-flop to monitor the second flip-flop delay, the possible “pass set-up” state, and “pass hold” state outputs are determined for the second flip-flop based on a final test state of the second and third flip-flops.
    • 集成电路(IC)的设计结构包括用于精确地测量IC设计中包括的触发器的设置和保持时间中的至少一个的电路。 电路使用在IC中的触发器位置确定的数据,并且包括由第一时钟驱动并被配置为将第一时钟的零延迟值提供给第一触发器的第一延迟元件。 电路还包括具有可选延迟的第二延迟元件,第二延迟元件被配置为将第一时钟的第一延迟版本提供给第二触发器,其中第一触发器的输出耦合到 第二个触发器。 第三延迟元件具有可选择的延迟并且与第二延迟元件串联耦合以将第一时钟的第二延迟版本提供给第三触发器,并且第二触发器的输出耦合到 第三个触发器。 时钟信号的第二延迟版本驱动第三触发器以监视第二触发器延迟,可能的“通过建立”状态,并且基于第二触发器确定“通过保持”状态输出 第二和第三个触发器的最终测试状态。