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    • 11. 发明授权
    • Jitter measuring method utilizing A/D conversion and device
    • 使用A / D转换和器件的抖动测量方法
    • US06366631B1
    • 2002-04-02
    • US09150970
    • 1998-09-11
    • Akihito NakayamaKenji ShintaniShunsuke KohamaYukari Hashimoto
    • Akihito NakayamaKenji ShintaniShunsuke KohamaYukari Hashimoto
    • H04L700
    • G01R29/26G11B20/10G11B20/1403
    • A jitter measurement device for reproducing a signal from an optical disc, which has simple circuit configuration and can effectively measure the jitter component. A matrix circuit 4 supplies the RF signals to the analog/digital converting circuit 6. Second, the computer 8 computes the slice level from the digitized data of the RF signals. Computer 8 computes the time point at which the RF signals become the indicated slice level, by interpolating, based on the digital data at the sampling point in the neighborhood of the said slice level, and the sampling frequency of the analog/digital converting circuit 6. A computer 8 computes each time breadth between the time points at which the RF signals become the slice level, then computes the jitter component of the reproduced signal, based on the each time breadth.
    • 一种抖动测量装置,用于再现来自光盘的信号,其具有简单的电路配置并且可以有效地测量抖动分量。 矩阵电路4将RF信号提供给模拟/数字转换电路6.其次,计算机8根据RF信号的数字化数据计算限幅电平。 计算机8通过基于所述限幅电平附近的采样点处的数字数据和模拟/数字转换电路6的采样频率内插来计算RF信号变为指示的限幅电平的时间点 计算机8计算RF信号成为限幅电平的时间点之间的每个时间宽度,然后基于每个时间宽度来计算再现信号的抖动分量。
    • 12. 发明授权
    • Two chamber plasma processing apparatus
    • 双室等离子体处理装置
    • US06167835A
    • 2001-01-02
    • US09047935
    • 1998-03-26
    • Hiroki OoteraMasakazu TakiKenji ShintaniKazuyasu Nishikawa
    • Hiroki OoteraMasakazu TakiKenji ShintaniKazuyasu Nishikawa
    • C23C1600
    • H01J37/32357
    • A plasma processing apparatus has a plurality of annular permanent magnets arranged concentrically of a polarity identical in the circumferential direction at the atmosphere side of a second electrode arranged opposite to a stage on which an object to be processed is placed. Arrangement is provided so that the polarity of magnets located adjacent radially is opposite. An insulation substrate is provided between a partition panel and a processing chamber to electrically insulate a plasma generation chamber. Direct current voltage is applied in a pulsive manner to the plasma generation chamber. Thus, a plasma processing apparatus can be provided that allows formation of plasma uniformly over a large area, and processing of a specimen of a large diameter uniformly.
    • 等离子体处理装置具有多个环状永久磁铁,该多个环状永久磁铁与第一电极的气氛侧的圆周方向的极性相同地布置,该第二电极与放置有待处理物体的台相对。 提供了布置,使得位于径向相邻的磁体的极性相反。 绝缘基板设置在分隔板和处理室之间以电绝缘等离子体产生室。 直流电压以脉动方式施加到等离子体产生室。 因此,可以提供允许在大面积上均匀地形成等离子体的等离子体处理装置,并且均匀地处理大直径的样本。
    • 15. 发明授权
    • Optical reproducing apparatus
    • 光学再现装置
    • US4592038A
    • 1986-05-27
    • US535850
    • 1983-09-26
    • Shigeo KubotaKenji Shintani
    • Shigeo KubotaKenji Shintani
    • G11B7/08G11B7/09G11B7/12G11B7/1353G11B7/1381G11B7/00G11B21/10
    • G11B7/0903G11B7/1353G11B7/1381
    • In an optical reproducing apparatus a divergent beam from a semiconductor laser light source is collimated to form a parallel light beam that is converged by an objective lens and focussed on an optical record medium. The light beam is reflected by the optical record medium and introduced into a signal photodetector so as to provide a reproduced signal. A phase type diffraction grating between the semiconductor laser light source and a beam splitter separates the laser beam from the semiconductor laser light source into zero, plus first and minus first order diffracted beams. A pair of tracking photodetectors receive reflected beams of the plus first and minus first order diffracted beams reflected by the optical record medium and then by the beam splitter. A concave lens located between the photodetectors and the beam splitter facilitates convenient positioning of the photodetectors so that a tracking error signal can be obtained by calculating the difference between the outputs of the first and second tracking photodetectors.
    • 在光学再现装置中,来自半导体激光光源的发散光束被准直以形成由物镜会聚并聚焦在光学记录介质上的平行光束。 光束被光学记录介质反射并被引入到信号光电检测器中以提供再现信号。 半导体激光光源和分束器之间的相位衍射光栅将激光束与半导体激光光源分离成零,加上第一和第一级衍射光束。 一对跟踪光电检测器接收由光学记录介质反射然后由分束器反射的正的第一和第一级衍射光束的反射光束。 位于光电检测器和光束分离器之间的凹透镜促进了光电探测器的便利定位,使得可以通过计算第一和第二跟踪光电检测器的输出之间的差异来获得跟踪误差信号。