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171. 发明申请

US20070100586A1 Direct fault diagnostics using per-pattern compactor signatures 有权
标题翻译：直接故障诊断使用每模式压实机签名
公开(公告)号：US20070100586A1
公开(公告)日：2007-05-03
申请号：US11584038
申请日：2006-10-20
申请人： Wu-Tung Cheng , Manish Sharma , Thomas Rinderknecht
发明人： Wu-Tung Cheng , Manish Sharma , Thomas Rinderknecht
IPC分类号： G06F11/30
CPC分类号： G01R31/318547 , G01R31/318357
摘要： In embodiments of the disclosed technology, diagnosis of a circuit is performed using compactor signatures (a technique referred to herein as “signature-based diagnosis”). Signature-based diagnosis typically does not require a test step that bypasses the compactor. Compactor signatures can be read from a compactor on a per-pattern basis, and an expected signature can be loaded into a compactor while an actual signature is being read from the compactor. Error functions can be used to describe relationships between errors in scan cell values and per-pattern compactor signatures, and the functions can be used to help generate a list of fault candidates in a circuit design.
摘要翻译：在所公开的技术的实施例中，使用压缩机签名（本文称为“基于签名的诊断”的技术）来执行电路的诊断。基于签名的诊断通常不需要绕过压实机的测试步骤。压缩机签名可以在每个模式的基础上从压实机读取，并且预期的签名可以加载到压实机中，同时从压实机读取实际的签名。错误函数可用于描述扫描单元格值和每图案压缩器签名中的错误之间的关系，并且该函数可用于帮助生成电路设计中的故障候选列表。

172. 发明申请

US20070098902A1 Fabricating inorganic-on-organic interfaces for molecular electronics employing a titanium coordination complex and thiophene self-assembled monolayers 审中-公开
标题翻译：使用钛配位络合物和噻吩自组装单层制备分子电子学无机界面
公开(公告)号：US20070098902A1
公开(公告)日：2007-05-03
申请号：US11454538
申请日：2006-06-16
申请人： James Engstrom , Andrew Chadeayne , Peter Wolczanski , Abhishek Dube , Manish Sharma
发明人： James Engstrom , Andrew Chadeayne , Peter Wolczanski , Abhishek Dube , Manish Sharma
IPC分类号： B05D3/10
CPC分类号： B05D1/185 , B05D3/107 , B05D2202/40 , B82Y10/00 , B82Y30/00 , B82Y40/00 , H01L51/0075 , H01L51/0595
摘要： Systems and methods for preparing inorganic-organic interfaces using transition metal coordination complexes and self-assembled monolayers as organic surfaces. In one embodiment, a silicon wafer supports a polycrystalline gold layer, optionally using an intermediate adhesionlayer such as Cr. The surface is reacted with the thiophene end of organic molecular species comprising a thiophene moiety to prepare self assembling monomers (SAMs). The functionalized end of the SAM is then reacted with metal-bearing species such as tetrakis(dimethylamido)titanium, Ti[N(CH3)2]4, (TDMAT) to provide a titanium nitride layer.
摘要翻译：使用过渡金属配位络合物和自组装单层作为有机表面制备无机 - 有机界面的系统和方法。在一个实施例中，硅晶片可以任选地使用诸如Cr的中间粘附层来支撑多晶金层。表面与包含噻吩部分的有机分子物质的噻吩末端反应以制备自组装单体（SAM）。然后将SAM的官能化端与含金属物质如四（二甲基氨基）钛，Ti [N（CH 3）2）4， / SUB>（TDMAT）以提供氮化钛层。

173. 发明授权

US07193889B2 Switching of MRAM devices having soft magnetic reference layers 失效
标题翻译：具有软磁参考层的MRAM器件的切换
公开(公告)号：US07193889B2
公开(公告)日：2007-03-20
申请号：US10776061
申请日：2004-02-11
申请人： Manish Sharma
发明人： Manish Sharma
IPC分类号： G11C11/00
CPC分类号： G11C11/15
摘要： A magnetic random access memory (MRAM) that includes an array of magnetic memory cells and a plurality of word and bit lines connecting columns and rows of the memory cells so that the memory cells are positioned at cross-points of the word and bit lines. Each memory cell has a magnetic reference layer and a magnetic data layer. Each magnetic reference layer and each magnetic data layer has a magnetization that is switchable between two states under the influence of a magnetic field and each reference layer has at a first temperature a coercivity that is lower than that of each data layer at the first temperature. The MRAM also includes a plurality of heating elements each proximate to a respective data layer. Each heating element provides in use for localized heating of the respective data layer to reduce the coercivity of the data layer so as to facilitate switching of the data layer.
摘要翻译：磁性随机存取存储器（MRAM），其包括磁存储器单元阵列和连接存储器单元的列和行的多个字和位线，使得存储器单元位于字和位线的交叉点处。每个存储单元具有磁性参考层和磁性数据层。每个磁参考层和每个磁数据层具有在磁场影响下在两个状态之间切换的磁化，并且每个参考层在第一温度下具有低于第一温度下每个数据层的矫顽力的矫顽力。 MRAM还包括各自靠近相应数据层的多个加热元件。每个加热元件用于各个数据层的局部加热，以降低数据层的矫顽力，从而便于切换数据层。

174. 发明申请

US20070002911A1 Virtual optical axis determination using machine vision for passive optical alignment 失效
标题翻译：虚拟光轴确定使用机器视觉进行无源光学对准
公开(公告)号：US20070002911A1
公开(公告)日：2007-01-04
申请号：US11171899
申请日：2005-06-30
申请人： Manish Sharma , Sergei Sochava , Eric Montei
发明人： Manish Sharma , Sergei Sochava , Eric Montei
IPC分类号： H01S3/13
CPC分类号： H01S5/141 , G02B7/003 , G02B27/62 , H01S5/02248 , H01S5/02284 , H01S5/024 , H01S5/02415 , H01S5/02492 , H01S5/0617
摘要： Alignment of a laser apparatus is achieved by actively aligning components of the laser apparatus and then passively deriving an optical axis from that alignment. This passive derivation can be achieved by identifying features of an actively aligned optical element, deriving positional data for those features, and developing an optical axis from that positional data. The derivation of positional data may be performed over a particular coordinate system of an image taken of the feature, e.g., obtained by a vision system. The positional data and optical axis may be extrapolated out to a reference coordinate system for use in passively aligning other optical elements.
摘要翻译：通过主动对准激光装置的部件，然后被动地从该对准中导出光轴来实现激光装置的对准。可以通过识别主动对准的光学元件的特征，导出那些特征的位置数据，以及从该位置数据展开光轴来实现该被动导出。位置数据的推导可以在特征的特定坐标系上执行，例如由视觉系统获得的特征的图像。位置数据和光轴可以外推到参考坐标系，用于被动对准其它光学元件。

175. 发明授权

US07151652B2 Top-pinned magnetoresistive device having adjusted interface property 有权
标题翻译：具有调整的界面特性的顶钉式磁阻器件
公开(公告)号：US07151652B2
公开(公告)日：2006-12-19
申请号：US10464161
申请日：2003-06-18
申请人： Janice H. Nickel , Manish Sharma
发明人： Janice H. Nickel , Manish Sharma
IPC分类号： G11B5/39
CPC分类号： B82Y25/00 , B82Y10/00 , G11B5/3909 , G11B5/3932 , G11C11/16
摘要： A top-pinned magnetoresistive device includes a free ferromagnetic layer; a spacer layer on the free layer; and a pinned ferromagnetic layer on the spacer layer. At least one interface property at an upper surface of the pinned layer is adjusted during fabrication of the magnetoresistive device.
摘要翻译：顶置磁阻器件包括自由铁磁层; 自由层上的间隔层; 以及在间隔层上的钉扎铁磁层。在制造磁阻器件期间调整在被钉扎层的上表面处的至少一个界面特性。

176. 发明申请

US20060270057A1 Sensor array using sail 有权
标题翻译：传感器阵列使用帆
公开(公告)号：US20060270057A1
公开(公告)日：2006-11-30
申请号：US11138619
申请日：2005-05-26
申请人： Manish Sharma
发明人： Manish Sharma
IPC分类号： G01N1/00
CPC分类号： G01N27/4145 , Y10T436/25
摘要： Provided is a sensor array and a method of forming the same. The sensor array includes an array of apertures etched into a 3D patterned resist layer to expose areas of one or more agents and/or reagents deposited on a substrate. The sensor is formed using a Self-Aligned Imprint Lithography (“SAIL”) method, a process that allows for a one-time deposition of all required materials followed by a series of etching/cleaning steps. The location of reagents on the sensor template, as well as the concentration gradient of each reagent, may be controlled through the sensor manufacturing process. Bores of a single reagent, or bores containing two or more reagents, may be formed using the SAIL process.
摘要翻译：提供一种传感器阵列及其形成方法。传感器阵列包括刻蚀成3D图案化抗蚀剂层的孔的阵列，以暴露沉积在基底上的一种或多种试剂和/或试剂的区域。传感器使用自对准印迹光刻（“SAIL”）方法形成，该方法允许一次性沉积所有所需材料，然后进行一系列蚀刻/清洁步骤。传感器模板上的试剂位置以及各试剂的浓度梯度可通过传感器制造过程进行控制。可以使用SAIL方法形成单个试剂的孔或包含两种或更多种试剂的孔。

177. 发明申请

US20060250281A1 Method for remote monitoring equipment for an agricultural machine 有权
标题翻译：农机远程监控设备方法
公开(公告)号：US20060250281A1
公开(公告)日：2006-11-09
申请号：US11481282
申请日：2006-07-05
申请人： Brian Mahoney , Steven Colvin , Manish Sharma
发明人： Brian Mahoney , Steven Colvin , Manish Sharma
IPC分类号： G08G1/123
CPC分类号： G06Q10/08 , G08G1/20
摘要： A method of providing information from a plurality of fleet machines located at a plurality of locations for purposes of permitting a manager of fleet equipment to make management decisions pertaining to a fleet comprised of such equipment, monitoring functional operational data from individual machines in a fleet of machines, conveying the monitored data to a remote server, converting the monitored data into a first group pertaining to current existing operational data, and into a second group comprised of past historical data, and transmitting by wireless means to a person having responsibility for the fleet information at least one of the groups of data.
摘要翻译：为了允许车队设备的管理者做出与由这样的设备组成的车队有关的管理决定，从位于多个位置的多个车队机器提供信息的方法，监视来自各机组中的各个机器的功能操作数据机器，将监视的数据传送到远程服务器，将监视的数据转换成与当前现有操作数据相关的第一组，并将其转换成由过去的历史数据组成的第二组，以及通过无线装置向负责车队的人员进行发送信息数据组中的至少一个。

178. 发明授权

US07103718B2 Non-volatile memory module for use in a computer system 有权
标题翻译：用于计算机系统的非易失性存储器模块
公开(公告)号：US07103718B2
公开(公告)日：2006-09-05
申请号：US10234424
申请日：2002-09-03
申请人： Janice H. Nickel , Manish Sharma
发明人： Janice H. Nickel , Manish Sharma
IPC分类号： G06F12/00
CPC分类号： G11C11/16 , G11C7/20 , G11C29/02 , G11C29/026 , G11C29/028 , G11C2029/0407 , G11C2029/5004
摘要： A non-volatile memory module for use in a computer system is disclosed. The non-volatile memory module is capable of storing information indefinitely and can be inserted and removed from the computer system during operation. The non-volatile memory can serve as the main memory within the computer system to hold the operating system and any other programs that are accessed by the computer system during operation.
摘要翻译：公开了一种用于计算机系统的非易失性存储器模块。非易失性存储器模块能够无限期地存储信息，并且可以在操作期间从计算机系统插入和移除。非易失性存储器可以用作计算机系统内的主存储器，以在操作期间保持操作系统和计算机系统访问的任何其他程序。

179. 发明授权

US07039845B2 Method and apparatus for deriving a bounded set of path delay test patterns covering all transition faults 失效
标题翻译：用于导出覆盖所有过渡故障的有界路径延迟测试模式集的方法和装置
公开(公告)号：US07039845B2
公开(公告)日：2006-05-02
申请号：US10109018
申请日：2002-03-28
申请人： Jeff Rearick , Manish Sharma
发明人： Jeff Rearick , Manish Sharma
IPC分类号： G06F11/00
CPC分类号： G01R31/318328 , G01R31/31813 , G01R31/31917
摘要： A method and apparatus for generating test patterns used to test an integrated circuit (IC). The apparatus comprises first logic for determining a subset of transition fault sites on an IC to be tested, second logic that identifies a longest sensitizable path through each transition fault site of the subset of transition fault sites, and third logic that generates a bounded set of test patterns that test the identified longest sensitizable paths through each transition fault site of the subset of transition fault sites. The present invention combines various aspects of transition fault modeling and path delay fault modeling to enable global delay testing of an IC within reasonable amount of time.
摘要翻译：一种用于产生用于测试集成电路（IC）的测试图案的方法和装置。该设备包括用于确定要测试的IC上的过渡故障点的子集的第一逻辑，识别通过过渡故障位置子集的每个过渡故障位点的最长可敏化路径的第二逻辑，以及生成有限组的测试模式，通过过渡故障点子集的每个过渡故障点测试识别的最长敏感路径。本发明结合了转换故障建模和路径延迟故障建模的各个方面，以在合理的时间量内实现IC的全局延迟测试。

180. 发明申请

US20060066339A1 Determining and analyzing integrated circuit yield and quality 有权
标题翻译：确定和分析集成电路产量和质量
公开(公告)号：US20060066339A1
公开(公告)日：2006-03-30
申请号：US11221395
申请日：2005-09-06
申请人： Janusz Rajski , Gang Chen , Martin Keim , Nagesh Tamarapalli , Manish Sharma , Huaxing Tang
发明人： Janusz Rajski , Gang Chen , Martin Keim , Nagesh Tamarapalli , Manish Sharma , Huaxing Tang
IPC分类号： G01R31/26
CPC分类号： G06F11/2273 , G01R31/01 , G01R31/2846 , G01R31/2853 , G01R31/2894 , G01R31/31704 , G01R31/31835
摘要： Methods, apparatus, and systems for computing, analyzing, and improving integrated circuit yield and quality are disclosed herein. For example, in one exemplary method disclosed herein, information is received from processing test responses of integrated circuits designed for functional use in electronic devices. In this embodiment, the information is indicative of integrated circuit failures observed during testing of the integrated circuits and of possible yield limiting factors causing the integrated circuit failures. Probabilities that one or more of the possible yield limiting factors in the integrated circuits actually caused the integrated circuit failures are determined by statistically analyzing the received information. The probabilities that one or more possible yield limiting factors actually caused the integrated circuit failures are reported. Tangible computer-readable media comprising computer-executable instructions for causing a computer to perform any of the described methods are also disclosed.
摘要翻译：本文公开了用于计算，分析和改进集成电路产量和质量的方法，装置和系统。例如，在本文公开的一个示例性方法中，从设计用于电子设备中的功能使用的集成电路的处理测试响应中接收信息。在该实施例中，该信息表示在集成电路测试期间观察到的集成电路故障以及导致集成电路故障的可能的产量限制因素。通过统计分析接收的信息来确定集成电路中的一个或多个可能的屈服限制因素实际上引起集成电路故障的概率。报告了一个或多个可能的屈服限制因素实际上导致集成电路故障的概率。还公开了包括用于使计算机执行任何所述方法的计算机可执行指令的有形计算机可读介质。

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