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    • 109. 发明申请
    • SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
    • 半导体器件及其制造方法
    • US20090206366A1
    • 2009-08-20
    • US12255933
    • 2008-10-22
    • Kazuyuki SawadaYuji HaradaMasahiko NiwayamaSaichirou KanekoYoshimi Shimizu
    • Kazuyuki SawadaYuji HaradaMasahiko NiwayamaSaichirou KanekoYoshimi Shimizu
    • H01L29/739H01L21/331
    • H01L29/7393H01L29/063H01L29/66325
    • Disclosed is a semiconductor device including: an N-type RESURF region formed in a P-type semiconductor substrate; a P-type base region formed in an upper portion of the semiconductor substrate so as to be adjacent to the RESURF region; an N-type emitter/source region formed in the base region so as to be apart from the RESURF region; a P-type base connection region formed in the base region so as to be adjacent to the emitter/source region; a gate insulating film and a gate electrode overlying the emitter/source region, the base region, and the RESURF region; and a P-type collector region formed in the RESURF region so as to be apart from the base region. Lattice defect is generated in the semiconductor substrate such that a resistance value of the semiconductor substrate is twice or more the resistance value of the semiconductor substrate that depends on the concentration of an impurity implanted in the semiconductor substrate.
    • 公开了一种半导体器件,包括:形成在P型半导体衬底中的N型RESURF区; 形成在半导体衬底的上部以与RESURF区相邻的P型基极区; 形成在所述基底区域中以与所述RESURF区域分离的N型发射极/源极区域; 形成在所述基极区域中以与所述发射极/源极区域相邻的P型基极连接区域; 栅极绝缘膜和覆盖发射极/源极区域,基极区域和RESURF区域的栅电极; 以及形成在RESURF区域中以与基底区域分离的P型集电极区域。 在半导体衬底中产生晶格缺陷,使得半导体衬底的电阻值是取决于注入在半导体衬底中的杂质的浓度的半导体衬底的电阻值的两倍或更多。