专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

101. 发明授权

US07351597B2 Fabrication method of semiconductor integrated circuit device 有权
标题翻译：半导体集成电路器件的制造方法
公开(公告)号：US07351597B2
公开(公告)日：2008-04-01
申请号：US11750371
申请日：2007-05-18
申请人： Yuji Wada , Susumu Kasukabe , Takehiko Hasebe , Yasunori Narizuka , Akira Yabushita , Terutaka Mori , Akio Hasebe , Yasuhiro Motoyama , Teruo Shoji , Masakazu Sueyoshi
发明人： Yuji Wada , Susumu Kasukabe , Takehiko Hasebe , Yasunori Narizuka , Akira Yabushita , Terutaka Mori , Akio Hasebe , Yasuhiro Motoyama , Teruo Shoji , Masakazu Sueyoshi
IPC分类号： H01L21/66
CPC分类号： G01R1/07314 , G01R31/2872 , Y10T29/41 , Y10T29/49128 , Y10T29/49147 , Y10T29/49155 , Y10T29/49169 , Y10T29/49798
摘要： The fabrication of a semiconductor integrated circuit device involves testing using a pushing mechanism that is constructed by forming, over the upper surface of a thin film probe, a reinforcing material having a linear expansion coefficient (thermal expansion coefficient) almost equal to that of a wafer to be tested; forming a groove in the reinforcing material above a contact terminal; placing an elastomer in the groove so that a predetermined amount projects out of the groove; and disposing a pusher and another elastomer to sandwich the pusher between the elastomers. With the use of such a probe, it is possible to improve the throughput of wafer-level electrical testing of a semiconductor integrated circuit.
摘要翻译：半导体集成电路器件的制造包括使用推压机构进行测试，所述推压机构通过在薄膜探针的上表面上形成具有几乎等于晶片的线性膨胀系数（热膨胀系数）的增强材料而构成待测在接触端子上方的增强材料中形成凹槽; 将弹性体放置在所述槽中，使得预定量突出到所述凹槽中; 并且设置推进器和另一种弹性体以将推进器夹在弹性体之间。通过使用这样的探针，可以提高半导体集成电路的晶片级电气测试的吞吐量。

102. 发明授权

US07306957B2 Fabrication method of semiconductor integrated circuit device 有权
标题翻译：半导体集成电路器件的制造方法
公开(公告)号：US07306957B2
公开(公告)日：2007-12-11
申请号：US11012225
申请日：2004-12-16
申请人： Yuji Wada , Akira Seito , Masaaki Namba
发明人： Yuji Wada , Akira Seito , Masaaki Namba
IPC分类号： G01R31/26
CPC分类号： G01R31/287 , G01R31/286 , G01R31/31718 , G11C29/56 , G11C29/56016 , G11C2029/5602 , H01L2224/16225 , H01L2224/16227 , H01L2224/48227 , H01L2224/48247 , H01L2225/06558 , H01L2924/15311 , H01L2924/3025 , H01L2924/00
摘要： A memory test is carried out on semiconductor integrated circuit devices including a semiconductor memory at low cost with efficiency. In a test burn-in system, twenty-four test boards are processed in sequence with time differences, and the test boards are circulated one by one. In this case, the memory test is conducted with the sequence of single board processing: the test is started with a test board in which semiconductor integrated circuit devices have been embedded, and semiconductor integrated circuit devices are discharged, beginning with a test board that has undergone the test.
摘要翻译：在具有效率低成本的包括半导体存储器的半导体集成电路器件上进行存储器测试。在测试老化系统中，24个测试板按时间顺序进行处理，测试板逐个循环。在这种情况下，以单板处理的顺序进行存储器测试：测试开始于已经嵌入半导体集成电路器件的测试板，半导体集成电路器件被放电，从具有经过测试

103. 发明授权

US06455335B1 Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step 失效
公开(公告)号：US06455335B1
公开(公告)日：2002-09-24
申请号：US09653624
申请日：2000-08-31
申请人： Ryuji Kohno , Tetsuo Kumazawa , Makoto Kitano , Akihiko Ariga , Yuji Wada , Naoto Ban , Shuji Shibuya , Yasuhiro Motoyama , Kunio Matsumoto , Susumu Kasukabe , Terutaka Mori , Hidetaka Shigi , Takayoshi Watanabe
发明人： Ryuji Kohno , Tetsuo Kumazawa , Makoto Kitano , Akihiko Ariga , Yuji Wada , Naoto Ban , Shuji Shibuya , Yasuhiro Motoyama , Kunio Matsumoto , Susumu Kasukabe , Terutaka Mori , Hidetaka Shigi , Takayoshi Watanabe
IPC分类号： G01R3126
CPC分类号： G01R3/00 , G01R1/0735
摘要： Dispersion of load may be kept within an allowance even when a plurality of probes in a large area are pressed in batch by pressing the probes provided in a membrane to a wafer by applying a pressure load to a plurality of places of a plane of pressure members on the side opposite from the wafer in a probe test step/burn-in test step which is one of semiconductor device manufacturing steps. It is then possible to provide semiconductor devices and a manufacturing method thereof which enhance the reliability and productivity of the semiconductor devices by probing a large number of integrated circuits or a large size integrated circuit in the same time.

104. 发明授权

US06287374B1 Pigment and process for producing the same, water base ink and process for producing the same 失效
标题翻译：颜料及其制造方法，水基油墨及其制造方法
公开(公告)号：US06287374B1
公开(公告)日：2001-09-11
申请号：US09392654
申请日：1999-09-09
申请人： Shozo Yanagida , Yuji Wada , Miwa Saito , Takamasa Ueda , Izumi Osawa
发明人： Shozo Yanagida , Yuji Wada , Miwa Saito , Takamasa Ueda , Izumi Osawa
IPC分类号： C09D1100
CPC分类号： C09D11/324 , C01P2004/62 , C01P2006/12 , C01P2006/19 , C09C1/565
摘要： In the present invention, a pigment is irradiated with a microwave so as to improve a surface thereof. Further, letting A be an area of a portion having hydrophilic groups on a surface of the pigment and B be an area of the other portion thereon, which are respectively found by measuring infrared spectrometers of the pigment, a ratio (A/B) is not less than 4. Water base ink according to the present invention is obtained by dispersing such a pigment in an aqueous medium.
摘要翻译：在本发明中，用微波照射颜料以改善其表面。此外，A是在颜料的表面上具有亲水基团的部分的面积，B是通过测定颜料的红外光谱仪分别发现的其他部分的面积，比例（A / B）为不低于4.根据本发明的水基油墨通过将这种颜料分散在水性介质中而获得。

105. 发明授权

US6138257A IC testing apparatus and method 失效
标题翻译： IC测试仪器及方法
公开(公告)号：US6138257A
公开(公告)日：2000-10-24
申请号：US115793
申请日：1998-07-15
申请人： Yuji Wada , Kaoru Fukuda , Yoshio Kamiko , Masaaki Mochiduki
发明人： Yuji Wada , Kaoru Fukuda , Yoshio Kamiko , Masaaki Mochiduki
IPC分类号： G01R31/3193 , G11C29/56 , G01R31/28 , G06F11/00
CPC分类号： G01R31/31935 , G11C29/56
摘要： Main tester unit tests an IC device for presence of a defect for each of a plurality of addresses of the IC device under predetermined test conditions and stores test results for the individual addresses into a first memory. Curing analysis processing section cures each of the addresses of the IC device determined as defective, on the basis of the test results for the individual addresses stored in the first memory. To this end, the curing analysis processing section may rearrange an address logic of the IC device to replace a physical space of the defective addresses with an extra or redundant address space and thereby place each of the defective addresses in a usable condition. In parallel with the operations by the curing analysis processing section, a defect analysis section acquires, from the main tester unit, the test results for the individual addresses along with data indicative of the predetermined test conditions for storage into a second memory, and analyzes a specific cause of the defect in the IC device on the basis of the stored data in the second memory. With this arrangement, it is possible to acquire information necessary for analyzing the defect in the IC during a curability determining analysis test on a mass production line and thereby can effectively analyze the specific cause of the detected defect.
摘要翻译：主测试器单元在预定测试条件下测试IC器件以存在IC器件的多个地址中的每一个的缺陷，并将各个地址的测试结果存储到第一存储器中。基于存储在第一存储器中的各个地址的测试结果，固化分析处理部分固化被确定为有缺陷的IC设备的每个地址。为此，固化分析处理部分可以重新排列IC设备的地址逻辑，以用额外的或冗余的地址空间替换缺陷地址的物理空间，从而将每个缺陷地址置于可用状态。与固化分析处理部分的操作并行，缺陷分析部分从主测试器单元获取各个地址的测试结果以及指示用于存储到第二存储器中的预定测试条件的数据，并且分析基于第二存储器中存储的数据，IC装置中的缺陷的特定原因。通过这种布置，可以在大规模生产线上的固化性确定分析测试中获取分析IC中的缺陷所需的信息，从而可以有效地分析检测到的缺陷的具体原因。

106. 发明授权

US08769339B2 Apparatus and method for managing network system 有权
标题翻译：用于管理网络系统的装置和方法
公开(公告)号：US08769339B2
公开(公告)日：2014-07-01
申请号：US12985019
申请日：2011-01-05
申请人： Masataka Sonoda , Yuji Wada , Atsuji Sekiguchi
发明人： Masataka Sonoda , Yuji Wada , Atsuji Sekiguchi
IPC分类号： G06F11/00
CPC分类号： H04L41/064
摘要： An apparatus for managing a network system including a plurality of components, the apparatus includes a memory that stores component type data of each component of the plurality of components, component relation data including relation information indicating a pair of components related to each other in the network system and error history data including error information of respective error components in the plurality of components. The apparatus includes a processor that executes a procedure including extracting a pair of component type data as a relation class candidate on the basis of the component type data of a pair of error components indicated by the error information in the error history data, the pair of error components being indicated by the relation information.
摘要翻译：一种用于管理包括多个部件的网络系统的装置，该装置包括存储多个部件的各部件的部件类型数据的存储器，包括表示在网络中彼此相关的一对部件的关系信息的部件关系数据系统和错误历史数据，包括多个分量中各个误差分量的误差信息。该装置包括一个处理器，该处理器执行一个过程，该过程包括基于由错误历史数据中的错误信息指示的一对误差分量的分量类型数据提取一对组分类型数据作为关系类候选，该对错误组件由关系信息指示。

107. 发明授权

US08631107B2 Communication system, communication control method, communication control apparatus 失效
标题翻译：通信系统，通信控制方法，通信控制装置
公开(公告)号：US08631107B2
公开(公告)日：2014-01-14
申请号：US12000459
申请日：2007-12-12
申请人： Takao Mohri , Yuji Wada , Shigeki Fukuta
发明人： Takao Mohri , Yuji Wada , Shigeki Fukuta
IPC分类号： G06F15/173 , H04W4/00 , H04L12/66
CPC分类号： H04L41/5058 , H04L12/281 , H04L12/282 , H04L69/08
摘要： According to an aspect of an embodiment, a communication system comprising: a plurality of service providing devices for providing first service information for identifying service by a first communication protocol; a gateway apparatus for converting from said first service information to second service information, and for sending second service information to said service using devices; and a plurality of service using devices for storing said second service information received from said gateway apparatus and sending a request for executing service in said service providing device to said gateway apparatus in accordance with an user input.
摘要翻译：根据实施例的一个方面，一种通信系统，包括：多个服务提供设备，用于通过第一通信协议提供用于识别服务的第一服务信息; 网关装置，用于从所述第一服务信息转换为第二服务信息，以及使用设备向所述服务发送第二服务信息; 以及多个服务使用装置，用于存储从所述网关装置接收的所述第二服务信息，并根据用户输入向所述网关装置发送在所述服务提供装置中执行服务的请求。

108. 发明授权

US08494047B2 Encoding device, method for adjusting target amount of code and record medium 失效
标题翻译：编码装置，调整目标代码量和记录介质的方法
公开(公告)号：US08494047B2
公开(公告)日：2013-07-23
申请号：US12651009
申请日：2009-12-31
申请人： Yuji Wada , Koichi Yoshimura
发明人： Yuji Wada , Koichi Yoshimura
IPC分类号： H04N7/12
CPC分类号： H04N19/177 , H04N19/115 , H04N19/124 , H04N19/14 , H04N19/152 , H04N19/159 , H04N19/172
摘要： An encoding device includes an encoding unit that encodes image data, a computing unit that calculates a target amount of picture code for each picture when the image data is encoded, a selection unit that selects an adjustment coefficient corresponding to the position of a picture within a unit of image processing from adjustment coefficients that have an alternating sequence of maximum values and minimal values, and an adjusting unit that adjusts the target amount of picture code by multiplying the target amount of picture code calculated by the computing unit by the adjustment coefficient selected by the selection unit.
摘要翻译：一种编码装置，包括对图像数据进行编码的编码单元，计算单元，当对图像数据进行编码时，计算每个图像的图像代码的目标量;选择单元，其选择与图像内的图像的位置对应的调整系数; 由具有最大值和最小值的交替序列的调整系数的图像处理单元，以及调整单元，通过将由计算单元计算出的图像代码的目标量乘以由选择单元。

109. 发明授权

US08406542B2 Image decoding apparatus, image decoding method and computer program 失效
标题翻译：图像解码装置，图像解码方法和计算机程序
公开(公告)号：US08406542B2
公开(公告)日：2013-03-26
申请号：US12615409
申请日：2009-11-10
申请人： Hiroshi Ikeda , Yuji Wada , Kazuhiro Shimauchi
发明人： Hiroshi Ikeda , Yuji Wada , Kazuhiro Shimauchi
IPC分类号： G06K9/36
CPC分类号： H04N19/44 , H04N19/18 , H04N19/184 , H04N19/48 , H04N19/647
摘要： An image decoding apparatus includes an information acquisition section that acquires information of a bit-plane truncation position in an encoded stream from the encoded stream generated by performing bit-plane encoding on a transform coefficient, a decoding process section that performs a decoding process on the encoded stream and generates a transform coefficient, and a significant coefficient detection section that detects whether the transform coefficient generated in the decoding process section is significant. The image decoding apparatus includes a correction value acquisition section that acquires a correction value corresponding to the bit-plane truncation position in the transform coefficient detected to be significant, from a correction value table, and a coefficient correction processing section that performs coefficient correction processing on the transform coefficient using the correction value acquired in the correction value acquisition section only for the transform coefficient detected to be significant in the significant coefficient detection section.
摘要翻译：一种图像解码装置，包括：信息获取部，从通过对变换系数进行位平面编码生成的编码流获取编码流中的位平面截取位置的信息;解码处理部，对解码处理部进行解码处理编码流并生成变换系数，以及有效系数检测部，其检测在解码处理部中生成的变换系数是否显着。该图像解码装置包括校正值获取部，其从校正值表中获取与检测为有效的变换系数中的位平面截断位置对应的校正值，以及系数校正处理部，其对使用在校正值获取部分中获取的校正值的变换系数仅对于在有效系数检测部分中检测为有效的变换系数。

110. 发明申请

US20110173500A1 APPARATUS AND METHOD FOR MANAGING NETWORK SYSTEM 有权
标题翻译：用于管理网络系统的装置和方法
公开(公告)号：US20110173500A1
公开(公告)日：2011-07-14
申请号：US12985019
申请日：2011-01-05
申请人： Masataka SONODA , Yuji Wada , Atsuji Sekiguchi
发明人： Masataka SONODA , Yuji Wada , Atsuji Sekiguchi
IPC分类号： G06F11/07 , G06F15/16
CPC分类号： H04L41/064
摘要： An apparatus for managing a network system including a plurality of components, the apparatus includes a memory that stores component type data of each component of the plurality of components, component relation data including relation information indicating a pair of components related to each other in the network system and error history data including error information of respective error components in the plurality of components. The apparatus includes a processor that executes a procedure including extracting a pair of component type data as a relation class candidate on the basis of the component type data of a pair of error components indicated by the error information in the error history data, the pair of error components being indicated by the relation information.
摘要翻译：一种用于管理包括多个部件的网络系统的装置，该装置包括存储多个部件的各部件的部件类型数据的存储器，包括表示在网络中彼此相关的一对部件的关系信息的部件关系数据系统和错误历史数据，包括多个分量中各个误差分量的误差信息。该装置包括一个处理器，该处理器执行一个过程，该过程包括基于由错误历史数据中的错误信息指示的一对误差分量的分量类型数据提取一对组分类型数据作为关系类候选，该对错误组件由关系信息指示。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式