会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 91. 发明授权
    • Semiconductor device
    • 半导体器件
    • US08829608B2
    • 2014-09-09
    • US13051987
    • 2011-03-18
    • Wataru SaitoSyotaro OnoShunji TaniuchiMiho WatanabeHiroaki Yamashita
    • Wataru SaitoSyotaro OnoShunji TaniuchiMiho WatanabeHiroaki Yamashita
    • H01L29/78
    • H01L29/7813H01L29/0865H01L29/0878H01L29/1095H01L29/407H01L29/42372H01L29/66734
    • According to one embodiment, a semiconductor device includes a first semiconductor layer of a first conductivity type, a second semiconductor layer of the first conductivity type, a third semiconductor layer of a second conductivity type, a fourth semiconductor layer of the second conductivity type, a fifth semiconductor layer of the first conductivity type, a control electrode, a first main electrode, a second main electrode, and a sixth semiconductor layer of the first conductivity type. The second semiconductor layer and the third semiconductor layer are alternately provided on the first semiconductor layer in a direction substantially parallel to a major surface of the first semiconductor layer. The fourth semiconductor layer is provided on the second semiconductor layer and the third semiconductor layer. The fifth semiconductor layer is selectively provided on a surface of the fourth semiconductor layer. The control electrode is provided in a trench via an insulating film. The trench penetrates through the fourth semiconductor layer from a surface of the fifth semiconductor layer and is in contact with the second semiconductor layer. The first main electrode is connected to the first semiconductor layer. The second main electrode is connected to the fourth semiconductor layer and the fifth semiconductor layer. The sixth semiconductor layer is provided between the fourth semiconductor layer and the second semiconductor layer. An impurity concentration of the sixth semiconductor layer is higher than an impurity concentration of the second semiconductor layer.
    • 根据一个实施例,半导体器件包括第一导电类型的第一半导体层,第一导电类型的第二半导体层,第二导电类型的第三半导体层,第二导电类型的第四半导体层, 第一导电类型的第五半导体层,第一导电类型的控制电极,第一主电极,第二主电极和第六半导体层。 第二半导体层和第三半导体层在与第一半导体层的主表面大致平行的方向上交替地设置在第一半导体层上。 第四半导体层设置在第二半导体层和第三半导体层上。 第五半导体层选择性地设置在第四半导体层的表面上。 控制电极通过绝缘膜设置在沟槽中。 沟槽从第五半导体层的表面穿过第四半导体层并且与第二半导体层接触。 第一主电极连接到第一半导体层。 第二主电极连接到第四半导体层和第五半导体层。 第六半导体层设置在第四半导体层和第二半导体层之间。 第六半导体层的杂质浓度高于第二半导体层的杂质浓度。