会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明授权
    • Substrate transport apparatus and method
    • 基板输送装置及方法
    • US06577382B2
    • 2003-06-10
    • US10060322
    • 2002-02-01
    • Yoshiki KidaKenji Nishi
    • Yoshiki KidaKenji Nishi
    • G03B2742
    • G03F7/70691H01L21/68707Y10S414/135Y10S414/141
    • An object of the invention is to provide a substrate transport apparatus which enables prompt transfer of a substrate, and a substrate processing apparatus incorporating this. A substrate transport apparatus of the invention comprises a transport arm (45, 46, 145, 146) for supporting a peripheral portion of a substrate (W) at at least two places on the peripheral portion, and transporting the substrate to a stage (7). The transport arm comprises: a first arm (45) having a first support portion (45e) for supporting a rear face of one side of the peripheral portions of the substrate in a transport direction (C-D) of the substrate, and a first facing portion (45f) provided on the first support portion and facing a side face of the one peripheral portion of the substrate; a second arm (46) having a second support portion (46e) for supporting a rear face of the other side of the peripheral portions of the substrate in the transport direction of the substrate, and a second facing portion (46f) provided on the second support portion, and facing a side face of the other peripheral portion of the substrate; and a drive mechanism (43, 43a, 45a, 46a) for driving each of the first arm and the second arm so as to approach and separate from each other.
    • 本发明的目的是提供一种基板输送装置,其能够及时地传送基板,以及基板处理装置。 本发明的基板输送装置包括:输送臂(45,46,145,146),用于在周边部分的至少两个位置处支撑基板(W)的周边部分,并将基板输送到载物台 )。 传送臂包括:第一臂(45),具有第一支撑部分(45e),用于在基板的输送方向(CD)上支撑基板的周边部分的一侧的后表面;以及第一相对部分 (45f),其设置在所述第一支撑部分上并且面向所述基板的所述一个周边部分的侧面; 第二臂(46),具有第二支撑部(46e),用于在基板的输送方向上支撑基板的周边部分的另一侧的背面;以及第二面对部(46f),设置在第二支撑部 支撑部分,并且面对基板的另一个周边部分的侧面; 以及用于驱动第一臂和第二臂中的每一个以彼此接近和分离的驱动机构(43,43a,45a,46a)。
    • 4. 发明授权
    • Position control method in exposure apparatus
    • 曝光装置中的位置控制方法
    • US6141108A
    • 2000-10-31
    • US258146
    • 1999-02-26
    • Yoshiki KidaMasahiko Okumura
    • Yoshiki KidaMasahiko Okumura
    • G03F9/00G03F7/20H01L21/027G01N11/00
    • G03F7/70691G03F9/7011G03F9/7015
    • A method provides a technique for exposing a pattern on a mask that is held by a mask stage onto a substrate. The method includes a first step of detecting a mark on the mask that is held at a first position by the mask stage and determining a corresponding position of the mask stage; a second step of detecting the mark on the mask that is held at a second position different from the first position by the mask stage and determining a corresponding position of the mask stage; a third step of determining a position of the mask relative to the mask stage in accordance with the detection results in the first and second steps; a fourth step of aligning the mask with the substrate; and a fifth step of exposing the pattern on the mask onto the substrate.
    • 一种方法提供了将由掩模台保持的掩模上的图案曝光到基板上的技术。 该方法包括:第一步骤,通过掩模台检测保持在第一位置的掩模上的标记,并确定掩模台的对应位置; 第二步骤,通过掩模台检测保持在与第一位置不同的第二位置的掩模上的标记,并确定掩模台的对应位置; 第三步骤,根据第一和第二步骤中的检测结果确定掩模相对于掩模载物台的位置; 将掩模与衬底对准的第四步骤; 以及将掩模上的图案曝光到基板上的第五步骤。