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    • 8. 发明授权
    • Method for erasing programmable interconnect cells for field programmable gate arrays using reverse bias voltage
    • 使用反向偏置电压擦除现场可编程门阵列的可编程互连单元的方法
    • US07161841B1
    • 2007-01-09
    • US11171489
    • 2005-06-29
    • Volker HechtJohn McCollum
    • Volker HechtJohn McCollum
    • G11C11/34
    • G11C16/14H03K19/17748H03K19/1776
    • A method for erasing a non-volatile memory cell interconnect switch in an FPGA comprises providing an FPGA having a core containing a plurality of non-volatile-memory-cell interconnect switches, each switch formed in a switch well region and coupled to a source/drain of an n-channel transistor formed in a grounded well region separate from the switch well region. A non-volatile memory cell interconnect switch is selected for erasing. The switch well region is disconnected from ground. A VCC potential is applied to the switch well region and to the drain of the n-channel transistor to which it is coupled and an erase potential is applied to the gate of the selected non-volatile memory cell interconnect switch.
    • 用于擦除FPGA中的非易失性存储单元互连开关的方法包括提供具有包含多个非易失性存储单元互连开关的核的FPGA,每个开关形成在开关阱区域中并且耦合到源极/ 形成在与开关阱区域分离的接地阱区域中的n沟道晶体管的漏极。 选择非易失性存储单元互连开关进行擦除。 开关井区域与地面断开。 将VCC电位施加到开关阱区域和与其耦合的n沟道晶体管的漏极,并且将擦除电位施加到所选择的非易失性存储器单元互连开关的栅极。