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1. 发明授权

US07449906B2 Probe for testing an electrical device 有权
标题翻译：用于测试电气设备的探头
公开(公告)号：US07449906B2
公开(公告)日：2008-11-11
申请号：US10556436
申请日：2003-08-29
申请人： Kiyotoshi Miura , Yuji Miyagi , Akihisa Akahira
发明人： Kiyotoshi Miura , Yuji Miyagi , Akihisa Akahira
IPC分类号： G01R31/02
CPC分类号： G01R1/06727
摘要： A probe having a first and a second arm portion extending between first and second connecting portions connecting the first and second arm portions respectively at their front end portion and base end portion, and a needle point portion below the first connecting portion. At least one of the entire first and second arm portions or the upper or lower edge portions of the first and second arm portions are arcuate.
摘要翻译：一种具有第一和第二臂部分的探针，所述第一和第二臂部分在第一和第二连接部分之间分别在其前端部分和基端部分分别连接第一和第二臂部分以及在第一连接部分下方的针尖部分。第一臂部分和第二臂部分的整个第一和第二臂部分或上边缘部分或下边缘部分中的至少一个是弓形的。

2. 发明申请

US20070216433A1 Probe For Electric Test 有权
标题翻译：电测试探头
公开(公告)号：US20070216433A1
公开(公告)日：2007-09-20
申请号：US10556436
申请日：2003-08-29
申请人： Kiyotoshi Miura , Yuji Miyagi , Akihisa Akahira
发明人： Kiyotoshi Miura , Yuji Miyagi , Akihisa Akahira
IPC分类号： G01R31/00
CPC分类号： G01R1/06727
摘要： A probe comprises a first and a second arm portions extending in the rightward and leftward direction at a vertical interval, a first and a second connecting portions connecting the first and second arm portions respectively at their front end portion and base end portion, and a needle point portion following one side in the upward and downward direction of the first connecting portion. At least one of the first and second arm portions has at least one of the whole arm portion, an edge portion on one side in the upward and downward direction of the arm portion, and an edge portion on the other side in the upward and downward direction of the arm portion made arcuate.
摘要翻译：探针包括沿垂直间隔沿左右方向延伸的第一臂部分和第二臂部分，分别在其前端部分和基端部分分别连接第一和第二臂部分的第一和第二连接部分，以及针在第一连接部的上下方向的一侧后方。第一臂部和第二臂部中的至少一个具有整个臂部，臂部的上下方向一侧的边缘部和上下方向上的另一侧的边缘部中的至少一个手臂部分的方向弧形。

3. 发明授权

US07525329B2 Electrical connecting apparatus 有权
标题翻译：电气连接装置
公开(公告)号：US07525329B2
公开(公告)日：2009-04-28
申请号：US11929005
申请日：2007-10-30
申请人： Yuji Miyagi , Kiyotoshi Miura , Hidehiro Kiyofuji , Akihisa Akahira , Tatsuo Inoue
发明人： Yuji Miyagi , Kiyotoshi Miura , Hidehiro Kiyofuji , Akihisa Akahira , Tatsuo Inoue
IPC分类号： G01R31/02
CPC分类号： G01R31/2889 , G01R1/07378
摘要： A wiring path of a circuit board has a first vertical path portion penetrating the circuit board at its outer edge in its thickness direction and connected to a connector on one surface, a second vertical path portion penetrating the circuit board in its thickness direction and connected to the electric coupler on the other surface, and a lateral path portion connecting both vertical portions, and the second vertical path portion is formed within an arrangement area (S1) of a reinforcing plate. One connecting end portion (electric coupler side) of the wiring path of the circuit board is disposed within the arrangement area (S1) of the reinforcing plate. On the other hand, the other connecting end portion (probe side) of the wiring path of the circuit board is disposed to be dispersed in an arrangement area (S2) wider than the arrangement area (S1) of the reinforcing plate.
摘要翻译：电路板的布线路径具有第一垂直路径部分，该第一垂直路径部分沿着其厚度方向在其外边缘处穿过电路板，并且连接到一个表面上的连接器，第二垂直路径部分沿厚度方向穿透电路板，并连接到在另一个表面上的电耦合器和连接两个垂直部分的横向路径部分和第二垂直路径部分形成在加强板的布置区域（S1）内。电路板的布线路径的一个连接端部（电耦合器侧）设置在加强板的布置区域（S1）内。另一方面，电路板的布线路径的另一个连接端部（探针侧）被配置为分散在比加强板的布置区域（S1）宽的布置区域（S2）中。

4. 发明申请

US20100066396A1 ELECTRICAL CONNECTING APPARATUS 有权
标题翻译：电气连接装置
公开(公告)号：US20100066396A1
公开(公告)日：2010-03-18
申请号：US12517040
申请日：2007-03-20
申请人： Kiyotoshi Miura , Hitoshi Sato , Akihisa Akahira
发明人： Kiyotoshi Miura , Hitoshi Sato , Akihisa Akahira
IPC分类号： G01R31/02
CPC分类号： G01R31/2889
摘要： An electrical connecting apparatus for use in electrical measurement of a device under test comprises a supporting member and a flat plate-like probe base plate. On one surface of the probe base plate are provided multiple probes abutting on electrical connecting terminals of the device under test undergoing an electrical test. Also, on the other surface of the probe base plate is formed a securing portion provided with a screw hole opened at the top portion. It further has a generally cylindrical spacer and a screw member passing through the spacer and whose tip end is screwed in the screw hole of the securing portion. As for the spacer, movement in the axial direction is restricted in relation to the supporting member by a restricting means. The spacer has a head portion whose underside is mounted on the other surface of the supporting member and a body portion communicating with the head portion at one end, arranged to pass through a through hole formed in the supporting member, and whose other end is arranged to abut on the top face of the securing portion.
摘要翻译：用于被测设备的电测量的电连接装置包括支撑构件和平板状探针基板。在探针基板的一个表面上设置有多个探针，它们与经过电气测试的被测器件的电连接端子相邻。此外，在探针基板的另一个表面上形成有设置有在顶部开口的螺纹孔的固定部。它还具有通常为圆柱形的间隔件和通过间隔件的螺钉构件，并且其末端拧入固定部分的螺钉孔中。对于间隔件，通过限制装置相对于支撑构件限制轴向的移动。间隔件具有头部，其下侧安装在支撑构件的另一个表面上，主体部分在一端与头部连通，布置成穿过形成在支撑构件中的通孔，并且其另一端布置以抵靠固定部分的顶面。

5. 发明授权

US07843204B2 Electrical connecting apparatus 有权
标题翻译：电气连接装置
公开(公告)号：US07843204B2
公开(公告)日：2010-11-30
申请号：US12332242
申请日：2008-12-10
申请人： Hidehiro Kiyofuji , Kiyotoshi Miura , Akihisa Akahira , Yoshinori Kikuchi
发明人： Hidehiro Kiyofuji , Kiyotoshi Miura , Akihisa Akahira , Yoshinori Kikuchi
IPC分类号： G01R31/02
CPC分类号： G01R1/07307
摘要： The object of the present invention is to prevent an operator from touching electronic elements arranged on an upper surface of a probe assembly of an electrical connecting apparatus at the time of carrying the electrical connecting apparatus and to restrict bowing of the probe assembly caused by the temperature difference between the upper surface and the lower surface of the probe assembly. An electrical connecting apparatus 10 comprises a probe assembly having a plurality of contactors 14 on a lower surface and a plurality of electronic elements 18 arranged on an upper surface, a cover 32 arranged on the upper surface of the probe assembly so as to close a space 30 in which the electronic elements are arranged, and two grippers 42 attached to the cover. Each gripper 42 has one end 42a and the other end 42a, has a region ranging from one end to the other end formed approximately in a U-shape, and is attached to a main body portion 33 of the cover at both the ends.
摘要翻译：本发明的目的是防止操作员在携带电连接装置时接触布置在电连接装置的探头组件的上表面上的电子元件，并且限制由温度引起的探头组件的弯曲探针组件的上表面和下表面之间的差异。电连接装置10包括探针组件，其具有在下表面上的多个接触器14和布置在上表面上的多个电子元件18，布置在探针组件的上表面上的盖32，以封闭空间 30，其中电子元件被布置，以及附接到盖的两个夹持器42。每个夹持器42具有一端42a，另一端42a具有从大致U形形状的一端到另一端的区域，并且在两端部附接到盖的主体部33。

6. 发明授权

US07859282B2 Electrical connecting apparatus 有权
标题翻译：电气连接装置
公开(公告)号：US07859282B2
公开(公告)日：2010-12-28
申请号：US12517040
申请日：2007-03-20
申请人： Kiyotoshi Miura , Hitoshi Sato , Akihisa Akahira
发明人： Kiyotoshi Miura , Hitoshi Sato , Akihisa Akahira
IPC分类号： G01R31/02
CPC分类号： G01R31/2889
摘要： An electrical connecting apparatus for use in electrical measurement of a device under test comprises a supporting member and a flat plate-like probe base plate. On one surface of the probe base plate are provided multiple probes abutting on electrical connecting terminals of the device under test undergoing an electrical test. Also, on the other surface of the probe base plate is formed a securing portion provided with a screw hole opened at the top portion. It further has a generally cylindrical spacer and a screw member passing through the spacer and whose tip end is screwed in the screw hole of the securing portion. As for the spacer, movement in the axial direction is restricted in relation to the supporting member by a restricting means. The spacer has a head portion whose underside is mounted on the other surface of the supporting member and a body portion communicating with the head portion at one end, arranged to pass through a through hole formed in the supporting member, and whose other end is arranged to abut on the top face of the securing portion.
摘要翻译：用于被测设备的电测量的电连接装置包括支撑构件和平板状探针基板。在探针基板的一个表面上设置有多个探针，它们与经过电气测试的被测器件的电连接端子相邻。此外，在探针基板的另一个表面上形成有设置有在顶部开口的螺纹孔的固定部。它还具有通常为圆柱形的间隔件和通过间隔件的螺钉构件，并且其末端拧入固定部分的螺钉孔中。对于间隔件，通过限制装置相对于支撑构件限制轴向的移动。间隔件具有头部，其下侧安装在支撑构件的另一个表面上，主体部分在一端与头部连通，布置成穿过形成在支撑构件中的通孔，并且其另一端布置以抵靠固定部分的顶面。

7. 发明授权

US07468610B2 Electrical connecting apparatus 有权
标题翻译：电气连接装置
公开(公告)号：US07468610B2
公开(公告)日：2008-12-23
申请号：US11871765
申请日：2007-10-12
申请人： Yuji Miyagi , Hidehiro Kiyofuji , Akihisa Akahira , Yoshinori Kikuchi
发明人： Yuji Miyagi , Hidehiro Kiyofuji , Akihisa Akahira , Yoshinori Kikuchi
IPC分类号： G01R31/02
CPC分类号： G01R31/2889 , G01R31/2891
摘要： An electrical connecting apparatus comprising: a circuit board on which a reinforcing plate is mounted and a plurality of first electric connections are provided; a probe board on which second electric connections corresponding to the first electric connections are provided, with a plurality of probes electrically connected to the corresponding second electric connections; an elastic connector having plural pairs of both contacts capable of contacting the first and second electric connections corresponding to each other of both boards therebetween and receiving a biasing force in directions for both contacts to separate from each other; screw members for integrally combining them; and a spacer member for holding the probe tips substantially on the same plane by tightening of the screw members. Between the reinforcing plate and the probe board, a spacer plate is inserted for adjusting a distance from the other surface of the probe board to the probe tips.
摘要翻译：一种电连接装置，包括：电路板，其上安装有加强板，并且设置有多个第一电连接; 探针板，其上设置有与第一电连接相对应的第二电连接，多个探针电连接到对应的第二电连接; 弹性连接器，其具有能够接触彼此之间的两个电极彼此之间的第一和第二电连接的两对触点，并且在两个触点彼此分离的方向上接收偏压力; 用于整体组合它们的螺钉构件; 以及用于通过拧紧螺钉构件将探针尖端基本保持在同一平面上的间隔构件。在加强板和探针板之间，插入间隔板以调节距离探针板的另一个表面到探针尖端的距离。

8. 发明申请

US20070069748A1 Probe assembly 审中-公开
标题翻译：探头装配
公开(公告)号：US20070069748A1
公开(公告)日：2007-03-29
申请号：US11585416
申请日：2006-10-23
申请人： Hidehiro Kiyofuji , Yutaka Minato , Akihisa Akahira
发明人： Hidehiro Kiyofuji , Yutaka Minato , Akihisa Akahira
IPC分类号： G01R31/02
CPC分类号： G01R31/2887
摘要： A probe assembly comprises a probe base plate with a plurality of probes to be used for electrical inspection of a plurality of semiconductor chip regions continuously formed in alignment in the directions orthogonal to each other on a substantially circular semiconductor wafer, and capable of contacting the electrical connecting portions of each semiconductor chip region. The tips of a plurality of probe groups are arranged in the X and Y directions orthogonal to each other on the surface of the probe base plate in correspondence to predetermined chip region groups including the predetermined number of semiconductor chip regions. The arrangement regions of the probe groups are formed discontinuously in both of the X and Y directions. The relative feeding movement of the semiconductor wafer in either of the X and Y directions enables the electrical inspection of all the chip region groups on the semiconductor wafer.
摘要翻译：探针组件包括具有多个探针的探针基板，用于对在大致圆形的半导体晶片上彼此正交的方向上连续形成的多个半导体芯片区域进行电气检查，并且能够接触电气连接各半导体芯片区域的部分。多个探针组的尖端相对应于包括预定数量的半导体芯片区域的预定芯片区域组，在探针基板的表面上彼此正交的X和Y方向上排列。探针组的排列区域在X方向和Y方向都不连续地形成。半导体晶片在X和Y方向中的相对馈送运动使得能够对半导体晶片上的所有芯片区域组进行电检查。

9. 发明申请

US20100327898A1 PROBE CARD AND INSPECTION APPARATUS 有权
标题翻译：探针卡和检查装置
公开(公告)号：US20100327898A1
公开(公告)日：2010-12-30
申请号：US12788874
申请日：2010-05-27
申请人： Tatsuo Ishigaki , Katsuji Hoshi , Akihisa Akahira
发明人： Tatsuo Ishigaki , Katsuji Hoshi , Akihisa Akahira
IPC分类号： G01R31/02
CPC分类号： G01R1/07385 , G01R1/36
摘要： An automatic switching mechanism is controlled by a probe card independent from a tester without limitation of the number of control signals from the tester. A probe card and an inspection apparatus include probes to be brought into contact with electrodes of inspection targets and a power supply channel electrically connecting the probes to a tester. The automatic switching mechanism divides each of the power supply channels into a plurality of power supply wiring portions, which are respectively connected to the probes; and shuts off the power supply wiring responsive to electrical fluctuation such as overcurrent. An electrical fluctuation detection mechanism detects an electrical fluctuation due to a defective product among the inspection targets. A control mechanism, responsive to detection of an electrical fluctuation, shuts off the power supply wiring portion if the electrical fluctuation is caused by the automatic switching mechanism.
摘要翻译：自动切换机构由独立于测试仪的探针卡控制，而不受来自测试仪的控制信号的数量的限制。探针卡和检查装置包括要与检查对象的电极接触的探针和将探针电连接到测试器的电源通道。自动切换机构将各个电源通道分成多个电源配线部分，分别连接到探头; 并且响应于诸如过电流的电波动来关断电源布线。电波动检测机构检测检查对象中的不良品的电波动。如果由自动切换机构引起电气波动，则响应于电波动的检测的控制机构切断电源布线部。

10. 发明授权

US08736292B2 Probe card and inspection apparatus 有权
标题翻译：探头卡和检测仪器
公开(公告)号：US08736292B2
公开(公告)日：2014-05-27
申请号：US12788874
申请日：2010-05-27
申请人： Tatsuo Ishigaki , Katsuji Hoshi , Akihisa Akahira
发明人： Tatsuo Ishigaki , Katsuji Hoshi , Akihisa Akahira
IPC分类号： G01R31/02
CPC分类号： G01R1/07385 , G01R1/36
摘要： An automatic switching mechanism is controlled by a probe card independent from a tester without limitation of the number of control signals from the tester. A probe card and an inspection apparatus include probes to be brought into contact with electrodes of inspection targets and a power supply channel electrically connecting the probes to a tester. The automatic switching mechanism divides each of the power supply channels into a plurality of power supply wiring portions, which are respectively connected to the probes; and shuts off the power supply wiring responsive to electrical fluctuation such as overcurrent. An electrical fluctuation detection mechanism detects an electrical fluctuation due to a defective product among the inspection targets. A control mechanism, responsive to detection of an electrical fluctuation, shuts off the power supply wiring portion if the electrical fluctuation is caused by the automatic switching mechanism.
摘要翻译：自动切换机构由独立于测试仪的探针卡控制，而不受来自测试仪的控制信号的数量的限制。探针卡和检查装置包括要与检查对象的电极接触的探针和将探针电连接到测试器的电源通道。自动切换机构将各个电源通道分成多个电源配线部分，分别连接到探头; 并且响应于诸如过电流的电波动来关断电源布线。电波动检测机构检测检查对象中的不良品的电波动。如果由自动切换机构引起电气波动，则响应于电波动的检测的控制机构切断电源布线部。

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