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    • 1. 发明授权
    • Robust 8T SRAM cell
    • 坚固的8T SRAM单元
    • US07808812B2
    • 2010-10-05
    • US12238850
    • 2008-09-26
    • Jack LiuShao-Yu ChouHung-Jen Liao
    • Jack LiuShao-Yu ChouHung-Jen Liao
    • G11C11/00
    • G11C11/413
    • This invention discloses a static random access memory (SRAM) cell which comprises a pair of cross-coupled inverters having a first storage node, a first NMOS transistor having a source and a drain connected between the first storage node and a bit-line, a second NMOS transistor having a source and a drain connected between a gate of the first NMOS transistor and a word-line, the second NMOS transistor having a gate connected to a first column select line, and a third NMOS transistor having a source and a drain connected between a ground (VSS) and the gate of the first NMOS transistor, and a gate connected to a second column select line, the second column select line being complementary to the first column select line.
    • 本发明公开了一种静态随机存取存储器(SRAM)单元,其包括具有第一存储节点的一对交叉耦合的反相器,具有连接在第一存储节点和位线之间的源极和漏极的第一NMOS晶体管, 第二NMOS晶体管,其源极和漏极连接在第一NMOS晶体管的栅极和字线之间,第二NMOS晶体管具有连接到第一列选择线的栅极和具有源极和漏极的第三NMOS晶体管 连接在接地(VSS)和第一NMOS晶体管的栅极之间,以及连接到第二列选择线的栅极,第二列选择线与第一列选择线互补。
    • 2. 发明申请
    • ROBUST 8T SRAM CELL
    • 稳定的8T SRAM单元
    • US20100080045A1
    • 2010-04-01
    • US12238850
    • 2008-09-26
    • Jack LiuShao-Yu ChouHung-Jen Liao
    • Jack LiuShao-Yu ChouHung-Jen Liao
    • G11C11/00
    • G11C11/413
    • This invention discloses a static random access memory (SRAM) cell which comprises a pair of cross-coupled inverters having a first storage node, a first NMOS transistor having a source and a drain connected between the first storage node and a bit-line, a second NMOS transistor having a source and a drain connected between a gate of the first NMOS transistor and a word-line, the second NMOS transistor having a gate connected to a first column select line, and a third NMOS transistor having a source and a drain connected between a ground (VSS) and the gate of the first NMOS transistor, and a gate connected to a second column select line, the second column select line being complementary to the first column select line.
    • 本发明公开了一种静态随机存取存储器(SRAM)单元,其包括具有第一存储节点的一对交叉耦合的反相器,具有连接在第一存储节点和位线之间的源极和漏极的第一NMOS晶体管, 第二NMOS晶体管,其源极和漏极连接在第一NMOS晶体管的栅极和字线之间,第二NMOS晶体管具有连接到第一列选择线的栅极和具有源极和漏极的第三NMOS晶体管 连接在接地(VSS)和第一NMOS晶体管的栅极之间,以及连接到第二列选择线的栅极,第二列选择线与第一列选择线互补。
    • 7. 发明授权
    • SRAM bit cell
    • SRAM位单元
    • US08363454B2
    • 2013-01-29
    • US13015773
    • 2011-01-28
    • Ping WangHung-Jen LiaoYen-Huei ChenJihi-Yu LinShao-Yu Chou
    • Ping WangHung-Jen LiaoYen-Huei ChenJihi-Yu LinShao-Yu Chou
    • G11C11/00
    • G11C11/412
    • A semiconductor memory bit cell includes an inverter latch including a pair of cross-coupled inverters. A first transistor has a gate coupled to a first control line and a source coupled to the inverter latch, and a second transistor has a gate coupled to a second control line and a drain coupled to the drain of the first transistor at a first node. A third transistor has a source coupled to the first node and a gate coupled to a word line, and a fourth transistor has a gate coupled to a source of the second transistor and to the inverter latch. A fifth transistor has a gate coupled to the word line and a drain coupled to a read bit line.
    • 半导体存储器位单元包括具有一对交叉耦合的反相器的反相器锁存器。 第一晶体管具有耦合到第一控制线的栅极和耦合到反相器锁存器的源极,并且第二晶体管具有耦合到第二控制线的栅极和在第一节点耦合到第一晶体管的漏极的漏极。 第三晶体管具有耦合到第一节点的源极和耦合到字线的栅极,并且第四晶体管具有耦合到第二晶体管的源极和反相器锁存器的栅极。 第五晶体管具有耦合到字线的栅极和耦合到读位线的漏极。