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    • 6. 发明授权
    • SRAM bit cell
    • SRAM位单元
    • US08363454B2
    • 2013-01-29
    • US13015773
    • 2011-01-28
    • Ping WangHung-Jen LiaoYen-Huei ChenJihi-Yu LinShao-Yu Chou
    • Ping WangHung-Jen LiaoYen-Huei ChenJihi-Yu LinShao-Yu Chou
    • G11C11/00
    • G11C11/412
    • A semiconductor memory bit cell includes an inverter latch including a pair of cross-coupled inverters. A first transistor has a gate coupled to a first control line and a source coupled to the inverter latch, and a second transistor has a gate coupled to a second control line and a drain coupled to the drain of the first transistor at a first node. A third transistor has a source coupled to the first node and a gate coupled to a word line, and a fourth transistor has a gate coupled to a source of the second transistor and to the inverter latch. A fifth transistor has a gate coupled to the word line and a drain coupled to a read bit line.
    • 半导体存储器位单元包括具有一对交叉耦合的反相器的反相器锁存器。 第一晶体管具有耦合到第一控制线的栅极和耦合到反相器锁存器的源极,并且第二晶体管具有耦合到第二控制线的栅极和在第一节点耦合到第一晶体管的漏极的漏极。 第三晶体管具有耦合到第一节点的源极和耦合到字线的栅极,并且第四晶体管具有耦合到第二晶体管的源极和反相器锁存器的栅极。 第五晶体管具有耦合到字线的栅极和耦合到读位线的漏极。