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    • 7. 发明授权
    • Dual liquid crystal display device
    • 双液晶显示装置
    • US07920228B2
    • 2011-04-05
    • US12385213
    • 2009-04-01
    • Kyu-Han BaeShawn KimJames KimChang-Won LeeHwal ChoiDavid Lee
    • Kyu-Han BaeShawn KimJames KimChang-Won LeeHwal ChoiDavid Lee
    • G02F1/133
    • G02F1/1333G02F1/133615G02F2001/133342G02F2001/133391G02F2203/01G02F2203/02
    • A dual liquid crystal display device includes a transmissive liquid crystal display panel; a reflective liquid crystal display panel formed on the same substrate as the transmissive liquid crystal display panel; a first light guide block disposed under the transmissive liquid crystal display panel and having dot patterns formed on a first surface thereof; a second light guide block disposed under the reflective liquid crystal display panel and having V-grooves formed on a first surface thereof and dot pattern formed on a second surface thereof; a light source disposed adjacent to the first light guide block; and a housing in which the transmissive and reflective liquid crystal display panels, the light source and the light guide blocks are seated, the housing having an opening to correspond to an image display surface of the reflective liquid crystal display panel.
    • 双液晶显示装置包括透射型液晶显示面板; 形成在与透射型液晶显示面板相同的基板上的反射型液晶显示面板; 第一导光块,设置在所述透射型液晶显示面板的下方,具有在其第一面上形成的点图案; 第二导光块,设置在所述反射型液晶显示面板的下方,在其第一面上形成有V形槽,在其第二面上形成有点图案; 邻近所述第一导光块设置的光源; 以及壳体,其中所述透射和反射的液晶显示面板,所述光源和所述导光块就座,所述壳体具有与所述反射型液晶显示面板的图像显示面对应的开口。
    • 9. 发明授权
    • Semiconductor devices including gate structures and leakage barrier oxides
    • 包括栅极结构和漏电阻氧化物的半导体器件
    • US07772637B2
    • 2010-08-10
    • US12401087
    • 2009-03-10
    • Woong-Hee SohnChang-Won LeeSun-Pil YounGil-Heyun ChoiByung-Hak LeeJong-Ryeol YooHee-Sook Park
    • Woong-Hee SohnChang-Won LeeSun-Pil YounGil-Heyun ChoiByung-Hak LeeJong-Ryeol YooHee-Sook Park
    • H01L21/00
    • H01L21/28273H01L29/42324
    • Methods of forming a semiconductor device may include forming a tunnel oxide layer on a semiconductor substrate, forming a gate structure on the tunnel oxide layer, forming a leakage barrier oxide, and forming an insulating spacer. More particularly, the tunnel oxide layer may be between the gate structure and the substrate, and the gate structure may include a first gate electrode on the tunnel oxide layer, an inter-gate dielectric on the first gate electrode, and a second gate electrode on the inter-gate dielectric with the inter-gate dielectric between the first and second gate electrodes. The leakage barrier oxide may be formed on sidewalls of the second gate electrode. The insulating spacer may be formed on the leakage barrier oxide with the leakage barrier oxide between the insulating spacer and the sidewalls of the second gate electrode. In addition, the insulating spacer and the leakage barrier oxide may include different materials. Related structures are also discussed.
    • 形成半导体器件的方法可以包括在半导体衬底上形成隧道氧化物层,在隧道氧化物层上形成栅极结构,形成漏电阻氧化物,并形成绝缘衬垫。 更具体地,隧道氧化物层可以在栅极结构和衬底之间,并且栅极结构可以包括隧道氧化物层上的第一栅极电极,第一栅电极上的栅极间电介质和第二栅电极 所述栅极间电介质与所述第一和第二栅电极之间的栅极间电介质。 漏电阻氧化物可以形成在第二栅电极的侧壁上。 绝缘间隔物可以在绝缘隔离物和第二栅电极的侧壁之间的泄漏阻挡氧化物形成在漏电阻氧化物上。 此外,绝缘间隔物和漏电阻氧化物可以包括不同的材料。 还讨论了相关结构。