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    • 4. 发明公开
    • 하나의 송수신모듈만을 이용하는 테라헤르츠파 발생 및 검출 시스템
    • 具有一个Tx / Rx模块的太赫兹发射器/检测器系统
    • KR1020120059314A
    • 2012-06-08
    • KR1020100120997
    • 2010-11-30
    • 씨이비티 주식회사
    • 김호섭최상국
    • H01S1/00
    • H01S1/02G01J3/108G02B27/149
    • PURPOSE: A system for generating and detecting terahertz waves is provided to reduce manufacturing costs by constituting a system with only one transmission module or one transmission and reception module. CONSTITUTION: A terahertz wave transmission and reception module(100) includes a photoconductive antenna, a silicon ball lens, and silicon focusing lens. A beam splitter(200) transmits some of terahertz waves. The beam splitter reflects the rest of the terahertz waves. Mirrors(301,302,303) reflect the terahertz waves by 90 degrees, respectively. A delay module(400) delays the transmitted terahertz waves. The delay module reversely passes the reflected terahertz wave of a pulse type through a time and space interval of the transmitted terahertz wave wavelength. An analysis module(500) analyzes a property of a target object in a non-destruction method by using the terahertz waves detected through the transmission/reception module.
    • 目的:提供一种用于生成和检测太赫兹波的系统,通过构成仅具有一个传输模块或一个发送和接收模块的系统来降低制造成本。 构成:太赫兹波发射和接收模块(100)包括光电导天线,硅球透镜和硅聚焦透镜。 分束器(200)传输一些太赫兹波。 分束器反射其余的太赫兹波。 反射镜(301,302,303)分别将太赫兹波反射90度。 延迟模块(400)延迟所传输的太赫兹波。 延迟模块通过发射的太赫兹波长的时间和空间间隔反向通过脉冲类型的反射太赫兹波。 分析模块(500)通过使用通过发送/接收模块检测到的太赫兹波来分析目标对象在非破坏方法中的属性。
    • 8. 发明公开
    • 전자칼럼의 전자빔 에너지 변환 방법
    • 电子束中电子束能量的改变方法
    • KR1020080033416A
    • 2008-04-16
    • KR1020087003773
    • 2006-08-18
    • 씨이비티 주식회사
    • 김호섭
    • H01J37/147
    • H01J37/3174B82Y10/00B82Y40/00H01J37/063H01J2237/06375H01J2237/1205H01J2237/28
    • A method for regulating energy of an electron beam in an electron column is provided to easily maintain a super-high vacuum condition in an electron emitter by regulating the electron beam energy without applying a high voltage on the electron emitter. Voltages are applied on respective lens layers of a focus lens. An electron beam energy is changed by an electrode layer(10) for regulating electron beam energy, such as electrode layers(3a,3b,3c,6a,6b,6c) of a source lens(3) or a focus lens(6). A required energy is calculated and a voltage is applied on the electrode layer based on the calculated energy. A detector is coaxially arranged on the electrode layer. A voltage for an extractor is applied on a source lens position. A separate voltage is applied on a test material.
    • 提供了一种用于调节电子束中的电子束能量的方法,以通过在电子发射器上施加高电压来调节电子束能量来容易地保持电子发射体中的超高真空状态。 电压施加在聚焦透镜的相应透镜层上。 电子束能通过用于调节电子束能量的电极层(10)改变,例如源透镜(3)或聚焦透镜(6)的电极层(3a,3b,3c,6a,6b,6c) 。 计算所需的能量,并且基于计算的能量在电极层上施加电压。 检测器同轴地布置在电极层上。 用于提取器的电压施加在源透镜位置。 在测试材料上施加单独的电压。