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    • 5. 发明公开
    • 트랜지스터 어레이의 전기적 특성변화를 보상할 수 있는 반도체 장치
    • 可补充电子特性变化晶体管阵列的半导体器件
    • KR1020100053311A
    • 2010-05-20
    • KR1020080112367
    • 2008-11-12
    • 삼성전자주식회사
    • 김대욱도지성이상훈홍지석
    • H01L21/331
    • H01L27/0207H01L27/105
    • PURPOSE: A semiconductor device for compensating the electrical property change of a transistor array is provided to match the electrical property of a transistor array to those of other transistor arrays by reducing the contact sizes of transistors located in the outer-most area. CONSTITUTION: An N-well area(12) is formed on a P-type substrate. A transistor array(15) is separated from the N well area. The transistor array comprises a plurality of transistors. The plurality of transistors is regulated to have the same electrical properties. A first group of transistors(14) is separated from the N well area as much as a first distance. A second group of transistors(16) is separated from the N well area as much as a second distance.
    • 目的:提供一种用于补偿晶体管阵列的电性能变化的半导体器件,以通过减小位于最外面区域的晶体管的接触尺寸来将晶体管阵列的电特性与其它晶体管阵列的电性能相匹配。 构成:在P型基板上形成N阱区域(12)。 晶体管阵列(15)与N阱区分离。 晶体管阵列包括多个晶体管。 多个晶体管被调节为具有相同的电性能。 第一组晶体管(14)与N阱区域分开多达第一距离。 第二组晶体管(16)与N阱区域分开多达第二距离。
    • 8. 发明授权
    • 제품 파라미터들의 통계적 분포 특성을 평가하는 방법
    • 估算产品参数统计分布特征的方法
    • KR100735012B1
    • 2007-07-03
    • KR1020060006873
    • 2006-01-23
    • 삼성전자주식회사
    • 윤성희정승호김대욱유문현이종배
    • G06Q50/04
    • G06F17/5036G01R31/318357
    • A method for estimating statistical distribution characteristics of product parameters is provided to correctly/quickly analyze correlation between independent parameters distinguishing a product and dependent parameters depending on the independent parameters, and offer understanding for physical relation between the independent and dependent parameters. N production parameters distinguishing the product and m characteristic parameters depending on the production parameters are determined(S20). M relation functions expressing the characteristic parameters as a function of the production parameters are determined(S30). Reverse functions expressing the production parameters as the function of the characteristic parameters is found(S40). Samples for experimentally determining quantitative relation between the production and characteristic parameters are made(S50). Measurement data of the characteristic parameters is prepared by measuring the sample(S60). The distribution characteristics of the production parameters corresponding to measurement data distribution of the characteristic parameters is evaluated by using the reverse functions of the relation functions(S70).
    • 提供了一种用于估计产品参数的统计分布特征的方法,以便根据独立参数正确/快速地分析区分产品和依赖参数的独立参数之间的相关性,并提供对独立参数和从属参数之间的物理关系的理解。 确定根据生产参数区分产品和m特性参数的N个生产参数(S20)。 确定表示作为生产参数的函数的特征参数的M关系函数(S30)。 找到表示作为特征参数的函数的生产参数的反向功能(S40)。 进行用于实验确定生产和特征参数之间的定量关系的样品(S50)。 通过测量样品来准备特征参数的测量数据(S60)。 通过使用关系函数的反向函数来评估与特征参数的测量数据分布相对应的生产参数的分布特性(S70)。