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1. 发明公开

KR1020070112942A 반도체 소자 테스트 핸들러의 테스트 트레이 이송장치 有权
标题翻译：用于SEMICOANDUCTOR TEAT HANDLER的TEAT TRAY TRANSFER
公开(公告)号：KR1020070112942A
公开(公告)日：2007-11-28
申请号：KR1020060046516
申请日：2006-05-24
申请人： 미래산업 주식회사
发明人： 추승용 , 박성문 , 임용진
IPC分类号： H01L21/683
CPC分类号： G01R31/2893
摘要： A test tray transfer apparatus of a semiconductor device test tray handler is provided to transfer the test tray stably and rapidly as a simple structure by using a plurality of transferring bars and a driving unit. A plurality of transfer bars(10) on which screw grooves of a spiral locus are formed are installed within a handler chamber(1) and extended toward the transfer direction. A driving unit rotates the transfer bars depending on an uniform rotating amount. The driving unit is composed of a driving pulley(22) joined to an axis of a motor, a plurality of followers(23) fixed on each transfer bars and a driving power transmitting belt.
摘要翻译：提供一种半导体器件测试托盘处理器的测试托盘传送装置，通过使用多个传送杆和驱动单元，以简单的结构稳定且快速地传送测试托盘。在其中形成螺旋轨迹的螺旋槽的多个传送杆（10）安装在处理器室（1）内并朝向传送方向延伸。驱动单元根据均匀的旋转量旋转传送杆。驱动单元由与马达的轴线连接的驱动滑轮（22），固定在各个传送杆上的多个从动件（23）和驱动动力传递带构成。

2. 发明公开

KR1020030062568A 반도체 소자 테스트 핸들러의 소자 장착용 포켓 有权
标题翻译：半导体器件测试处理器的安装口袋
公开(公告)号：KR1020030062568A
公开(公告)日：2003-07-28
申请号：KR1020020002819
申请日：2002-01-17
申请人： 미래산업 주식회사
发明人： 임용진 , 최진호
IPC分类号： G01R31/26 , H01L21/66
摘要： PURPOSE: A pocket for mounting the device of semiconductor device test handler is provided to generate a sufficient vacuum pressure when an inlet pressure is generated although a region in which the balls of the semiconductor device is not created is small. CONSTITUTION: A pocket(20) for mounting the device of semiconductor device test handler includes a body(21) provided with a receiving member(22) on the top portion thereof for receiving the semiconductor device(120) and a pair of grooves(26) formed on the forward portion and the backward portion of the receiving member(22) for forming a latch moving path. The pocket(20) further includes a first through hole vertically formed at the central portion of the bottom surface of the body(21), a second through hole horizontally formed in the body(21) and a plurality of third through holes vertically formed at the end portions of the second through hole. In the pocket(20), the third through holes pass through the portions contact to the semiconductor device received at the receiving member(22).
摘要翻译：目的：提供一种用于安装半导体器件测试处理器的装置的口袋，以便当产生入口压力时产生足够的真空压力，尽管半导体器件的球不产生的区域很小。构成：用于安装半导体器件测试处理器的器件的口袋（20）包括在其顶部上设置有接收部件（22）的主体（21），用于接收半导体器件（120）和一对凹槽（26））形成在用于形成闩锁移动路径的接收构件（22）的前部和后部。所述凹部（20）还包括在所述主体（21）的底面的中央部垂直地形成的第一通孔，在所述主体（21）中水平形成的第二贯通孔，以及在所述主体第二通孔的端部。在所述口袋（20）中，所述第三通孔贯通接收在所述接收部件（22）的半导体装置的部分。

3. 发明授权

KR100411298B1 반도체 소자 테스트 핸들러의 소자 장착용 포켓 有权
标题翻译： 반도체소자테스트핸들러의소자장착용포켓
公开(公告)号：KR100411298B1
公开(公告)日：2003-12-24
申请号：KR1020020002819
申请日：2002-01-17
申请人： 미래산업 주식회사
发明人： 임용진 , 최진호
IPC分类号： G01R31/26 , H01L21/66
摘要： PURPOSE: A pocket for mounting the device of semiconductor device test handler is provided to generate a sufficient vacuum pressure when an inlet pressure is generated although a region in which the balls of the semiconductor device is not created is small. CONSTITUTION: A pocket(20) for mounting the device of semiconductor device test handler includes a body(21) provided with a receiving member(22) on the top portion thereof for receiving the semiconductor device(120) and a pair of grooves(26) formed on the forward portion and the backward portion of the receiving member(22) for forming a latch moving path. The pocket(20) further includes a first through hole vertically formed at the central portion of the bottom surface of the body(21), a second through hole horizontally formed in the body(21) and a plurality of third through holes vertically formed at the end portions of the second through hole. In the pocket(20), the third through holes pass through the portions contact to the semiconductor device received at the receiving member(22).
摘要翻译：目的：提供用于安装半导体器件测试处理器的器件的口袋，以在产生入口压力时产生足够的真空压力，尽管没有产生半导体器件的球的区域很小。一种用于安装半导体器件测试处理器装置的口袋（20），包括一个主体（21），在主体（21）的顶部设有一个用于接收半导体器件（120）的接收元件（22）和一对凹槽）形成在容纳构件（22）的前部和后部上以形成闩锁移动路径。所述凹槽20还包括垂直形成于所述本体21的底面的中心部分的第一通孔，水平形成于所述本体21中的第二通孔以及垂直形成于所述本体21中的多个第三通孔，第二通孔的端部。在凹槽（20）中，第三通孔穿过接收部件（22）处接收的与半导体器件接触的部分。

4. 发明授权

KR100380960B1 수직식 핸들러의 슬리브 검색장치 失效
标题翻译： 수직식핸들러의슬리브검색장치
公开(公告)号：KR100380960B1
公开(公告)日：2003-04-26
申请号：KR1020000059771
申请日：2000-10-11
申请人： 미래산업 주식회사
发明人： 김원 , 임용진 , 정병일
IPC分类号： G01R31/26 , H01L21/66
摘要： PURPOSE: A sleeve scanning apparatus of a vertical handler is provided, which classifies sleeves having remained devices by scanning the remained devices after devices are exhausted from the sleeve for testing. CONSTITUTION: A scanning apparatus(500) comprises a cylinder body(511) installed in parallel with a longitudinal direction of a sleeve(20) when the sleeve is placed on a loading plate(200), and a rodless cylinder(510) comprising a slider(512) which goes to and from on the cylinder body, and a scan sensor(520) scanning whether there are remained devices in the sleeve as being interlocked with the slider by being attached to the slider of the rodless cylinder. And an elevating stay(530) is installed on both sides of the loading plate to increase an empty sleeve(20) to a position where the scan sensor attached to the rodless cylinder scans the empty sleeve when the empty sleeve is placed on the loading plate.
摘要翻译：目的：提供了一种垂直处理器的套筒扫描装置，其通过在装置从套筒中排出以便测试之后扫描剩余的装置来对具有剩余装置的套筒进行分类。本发明的扫描装置（500）包括：当套筒放置在加载板（200）上时平行于套筒（20）的纵向安装的筒体（511）;以及无杆缸体（510），包括（512），以及扫描传感器（520），扫描传感器（520）通过连接到无杆缸体的滑块而扫描套筒中是否有剩余装置与滑块互锁。并且在装载板的两侧安装升降支架（530），以将空套筒（20）增加至当将空套筒置于装载板上时连接至无杆气缸的扫描传感器扫描空套筒的位置。

5. 发明公开

KR1020020028654A 수직식 핸들러의 디바이스 슬리브 자동로딩장치 失效
标题翻译：装置套筒自动装载装置
公开(公告)号：KR1020020028654A
公开(公告)日：2002-04-17
申请号：KR1020000059768
申请日：2000-10-11
申请人： 미래산업 주식회사
发明人： 김원 , 임용진 , 정병일
IPC分类号： G01R31/26 , H01L21/66
CPC分类号： B65G47/1478 , B65G47/1492
摘要： PURPOSE: A device sleeve auto loading apparatus of a vertical handler is provided, which loads sleeves having devices to test on a loading part of a handler by stacking the sleeves automatically. CONSTITUTION: The auto loading apparatus(100) comprises a stacking slant plate(101) where sleeves are placed on its bottom part, and a fixing plate(102) is installed vertically on both sides of the stacking slant plate. And a transportation unit to transport sleeves placed on the stacking slant plate is installed in the back of the stacking slant plate. And a loading standby part, where sleeves are temporarily loaded before they are loaded on a loading part located in the back of the apparatus, is installed in the back of the transportation unit. The transportation unit is constituted with a system similar to a conveyor system, and transport sleeves slid to a rear edge of the stacking slant plate one by one to a top side and then transports them to the loading standby part.
摘要翻译：目的：提供垂直处理器的装置套筒自动装载装置，其装载具有通过自动堆叠套筒来对处理器的装载部分进行测试的装置的套筒。构成：自动装载装置（100）包括堆叠倾斜板（101），其中套筒放置在其底部，并且固定板（102）垂直地安装在堆叠倾斜板的两侧。另外，在堆放倾斜板的背面安装运送装在堆放斜板上的套筒的运输单元。并且在装载备用部件被装载在位于设备背面的装载部件上之前临时装载的装载备用部件安装在运输单元的后部。运输单元由类似于输送机系统的系统构成，运输套筒逐一滑动到堆叠倾斜板的后边缘，然后将其运送到装载待机部件。

6. 发明公开

KR1020020028656A 수직식 핸들러용 디바이스 테스트 소켓 失效
标题翻译：用于垂直处理器的设备测试插座
公开(公告)号：KR1020020028656A
公开(公告)日：2002-04-17
申请号：KR1020000059770
申请日：2000-10-11
申请人： 미래산업 주식회사
发明人： 김원 , 임용진 , 정병일
IPC分类号： G01R31/26 , H01L21/66
摘要： PURPOSE: A device test socket for a vertical handler is provided, which covers a radio frequency by reducing a distance between a socket base and a contact part of a device and a socket steeply, by improving a contact method between the device and the socket by improving a structure of the test socket where the device is installed. CONSTITUTION: The device test socket comprises a socket housing(751) where a groove(752) formed with a thin rectangular body and having a device on its center is formed, and a port part(753) which is formed on both sides of the groove and is combined with a test apparatus electrically and where an outer part of a lead pin(11) of a device(10) to be inserted into the groove of the socket housing is grounded. The number of the port part is the same as the number of the lead pin to confront with each lead pin formed in the device individually. A distance of vortexes of both port parts is shorter than a distance between lead pins of the device to assure a contact between the port part and the device. And an elastic member(754) like a rubber is inserted into the port part.
摘要翻译：目的：提供一种用于垂直处理器的设备测试插座，其通过通过改进设备和插座之间的接触方法来减小插座基座与设备的接触部分和插座之间的距离来覆盖射频改进安装设备的测试插座的结构。构成：装置测试插座包括插座壳体（751），其中形成有薄矩形体并且在其中心具有装置的凹槽（752）形成在端子部分（753）上，端口部分并且与电测试装置组合，并且其中要插入插座壳体的凹槽中的装置（10）的引脚（11）的外部部分接地。端口部分的数量与单独形成在每个引脚上的引脚的数量相同。两个端口部分的涡流距离短于设备的引脚之间的距离，以确保端口部件和设备之间的接触。并且将诸如橡胶的弹性构件（754）插入到端口部分中。

7. 发明授权

KR100380959B1 수직식 핸들러용 디바이스 테스트 소켓 失效
标题翻译： 수직식핸들러용디바이스테스트소켓
公开(公告)号：KR100380959B1
公开(公告)日：2003-04-26
申请号：KR1020000059770
申请日：2000-10-11
申请人： 미래산업 주식회사
发明人： 김원 , 임용진 , 정병일
IPC分类号： G01R31/26 , H01L21/66
摘要： PURPOSE: A device test socket for a vertical handler is provided, which covers a radio frequency by reducing a distance between a socket base and a contact part of a device and a socket steeply, by improving a contact method between the device and the socket by improving a structure of the test socket where the device is installed. CONSTITUTION: The device test socket comprises a socket housing(751) where a groove(752) formed with a thin rectangular body and having a device on its center is formed, and a port part(753) which is formed on both sides of the groove and is combined with a test apparatus electrically and where an outer part of a lead pin(11) of a device(10) to be inserted into the groove of the socket housing is grounded. The number of the port part is the same as the number of the lead pin to confront with each lead pin formed in the device individually. A distance of vortexes of both port parts is shorter than a distance between lead pins of the device to assure a contact between the port part and the device. And an elastic member(754) like a rubber is inserted into the port part.
摘要翻译：目的：提供一种用于垂直处理器的器件测试插座，其通过改进设备和插座之间的接触方法来通过减小插座基座与器件的接触部分和插座之间的距离来覆盖射频改善安装设备的测试插座的结构。结构：器件测试插座包括一个插座外壳（751），在该插座外壳（751）中形成有一个由薄的矩形体形成并在其中心具有一个器件的凹槽（752），以及一个形成在凹槽并且与测试装置电连接，并且插入到插座壳体的凹槽中的装置（10）的引脚（11）的外部部分接地。端口部分的数量与单独在器件中形成的每个引脚相对应的引脚的数量相同。两个端口部分的涡流的距离小于设备的引脚之间的距离，以确保端口部分与设备之间的接触。并且像橡胶那样的弹性构件（754）被插入到端口部分中。

8. 发明授权

KR100380958B1 수직식 핸들러의 디바이스 슬리브 자동로딩장치 失效
标题翻译： 수직식핸들러의디바이스슬리브자동로딩장치
公开(公告)号：KR100380958B1
公开(公告)日：2003-04-23
申请号：KR1020000059768
申请日：2000-10-11
申请人： 미래산업 주식회사
发明人： 김원 , 임용진 , 정병일
IPC分类号： G01R31/26 , H01L21/66
CPC分类号： B65G47/1478 , B65G47/1492
摘要： The present invention relates to an apparatus for automatic loading of a sleeve on a device testing apparatus, for automatic lining up and loading of a sleeve having a device held therein on a device testing apparatus for carrying out device test, including a sloped loading plate for putting sleeves each having devices held therein thereon, vertical fixation plates at both sides of the sloped loading plate, carrier means fitted so as to be in contact with a lower edge of the sloped loading plate, for holding the sleeves put on, and slid down to the lower edge of, the sloped loading part, and transporting to a loading part in the device testing apparatus one by one in succession, driver means fitted to the fixation plate for driving the carrier means, and return means for, when a plurality of sleeves on the sloped loading plate are loaded on, and transported by the step, returning the sleeves back to the sloped loading plate again, leaving only one of the sleeves.
摘要翻译：本发明涉及一种用于装置测试设备上的套筒的自动加载的装置，用于自动地将在其中保持有装置的套筒装载和装载在用于执行装置测试的装置测试装置上，该装置包括倾斜加载板在其上放置有装置的套筒，在倾斜加载板的两侧的垂直固定板，安装成与倾斜加载板的下边缘接触的载体装置，用于保持套筒，并滑下到倾斜的装载部分的下边缘，并依次传送到装置测试设备中的装载部分，装配到固定板上用于驱动载体装置的驱动装置，以及用于当多个装在倾斜的加载板上的套筒被装上，然后由该台阶运送，再次将套筒返回到倾斜的加载板上，仅剩下一个套筒。

9. 发明公开

KR1020020028657A 수직식 핸들러의 슬리브 검색장치 失效
标题翻译：垂直操纵器的扫描扫描装置
公开(公告)号：KR1020020028657A
公开(公告)日：2002-04-17
申请号：KR1020000059771
申请日：2000-10-11
申请人： 미래산업 주식회사
发明人： 김원 , 임용진 , 정병일
IPC分类号： G01R31/26 , H01L21/66
摘要： PURPOSE: A sleeve scanning apparatus of a vertical handler is provided, which classifies sleeves having remained devices by scanning the remained devices after devices are exhausted from the sleeve for testing. CONSTITUTION: A scanning apparatus(500) comprises a cylinder body(511) installed in parallel with a longitudinal direction of a sleeve(20) when the sleeve is placed on a loading plate(200), and a rodless cylinder(510) comprising a slider(512) which goes to and from on the cylinder body, and a scan sensor(520) scanning whether there are remained devices in the sleeve as being interlocked with the slider by being attached to the slider of the rodless cylinder. And an elevating stay(530) is installed on both sides of the loading plate to increase an empty sleeve(20) to a position where the scan sensor attached to the rodless cylinder scans the empty sleeve when the empty sleeve is placed on the loading plate.
摘要翻译：目的：提供垂直处理器的套筒扫描装置，其通过在从套筒中排出装置进行测试之后扫描剩余装置来对具有保留装置的套筒进行分类。构成：扫描装置（500）包括当套筒放置在装载板（200）上时与套筒（20）的纵向方向平行安装的筒体（511），以及无杆缸（510），包括滑动件（512），以及扫描传感器（520），其通过附接到无杆缸的滑块来扫描套筒中是否存在与滑块互锁的装置。并且在装载板的两侧安装升降支架（530），以将空套管（20）增加到当无套筒放置在装载板上时，连接到无杆缸的扫描传感器扫描空套筒的位置。

10. 发明授权

KR100792732B1 반도체 소자 테스트 핸들러의 테스트 트레이 이송장치 有权
标题翻译：奶酪托盘转运半导体奶嘴处理器
公开(公告)号：KR100792732B1
公开(公告)日：2008-01-11
申请号：KR1020060046516
申请日：2006-05-24
申请人： 미래산업 주식회사
发明人： 추승용 , 박성문 , 임용진
IPC分类号： H01L21/683
CPC分类号： G01R31/2893
摘要： 본 발명은 반도체 소자 테스트 핸들러의 테스트 트레이 이송장치에 관한 것으로, 구조가 간단하고, 테스트 트레이 이송시 안정성과 신속성을 향상시킬 수 있도록 한 것이다.
이를 위한 본 발명은, 핸들러의 챔버 내부에 테스트 트레이의 이송방향을 향해 연장되도록 설치되며, 외주면에 테스트 트레이의 변부가 삽입되어 이동하는 나선형 궤적의 스크류홈이 형성된 복수개의 이송바아와; 상기 이송바아들을 일정한 회전량만큼 동기적으로 회동시키는 구동유닛을 포함 하여 구성된 반도체 소자 테스트 핸들러의 테스트 트레이 이송장치를 제공한다.
핸들러, 테스트 트레이, 이송장치

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