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    • 1. 发明公开
    • 플라즈마발생장치
    • 等离子体发生设备
    • KR1020060120283A
    • 2006-11-24
    • KR1020067019601
    • 2005-03-22
    • 닛신덴키 가부시키 가이샤
    • 오노다마사토시다카하시에이지
    • H05H1/46H01L21/205H01L21/3065C23F4/00
    • C23C16/509C23C16/24H01J37/32082
    • Plasma generating equipment is provided with a plasma generating chamber (10) and a high-frequency antenna (1) arranged in the chamber (10), and generates inductively coupled plasma by applying high-frequency power to a gas in the chamber (10) from the antenna (1). The antenna (1) is a low-inductance antenna composed of a first part (11) extending from the outside of the chamber (10) to the inside of the chamber (10), and a plurality of second parts (12), which are branched electrically parallel from a chamber inner side edge part (11e) of the first part (11) with end edges (12e) directly connected to an inner wall of the grounded chamber (10). The surface of the antenna (1) is covered with an electrically insulating material. The frequency of the high-frequency power applied to the antenna may be as high as approximately 40MHz to several 100MHz, and desired plasma can be generated by suppressing problems such as abnormal electrical discharge and matching failure. The equipment can be also constituted for process of film formation and the like.
    • 等离子体发生设备设置有等离子体发生室(10)和布置在室(10)中的高频天线(1),并且通过向室(10)中的气体施加高频电力来产生感应耦合等离子体, 从天线(1)。 天线(1)是由从室(10)的外部延伸到室(10)的内部的第一部分(11)和多个第二部分(12)构成的低电感天线,多个第二部分 与第一部分(11)的室内侧边缘部分(11e)电分支,其端边缘(12e)直接连接到接地室(10)的内壁。 天线(1)的表面被电绝缘材料覆盖。 施加到天线的高频功率的频率可以高达大约40MHz到几百MHz,并且可以通过抑制诸如异常放电和匹配故障的问题来产生期望的等离子体。 该设备也可以用于成膜过程等。
    • 2. 发明授权
    • 기판처리장치 및 방법
    • 기판처리장치및방법
    • KR100413884B1
    • 2004-04-28
    • KR1019970055863
    • 1997-10-29
    • 닛신덴키 가부시키 가이샤
    • 안도야스노리오노다마사토시
    • H01L21/265
    • H01L21/67213H01L21/67742H01L21/67754
    • A substrate processing apparatus includes a processing chamber and a vacuum spare chamber adjacent thereto through a vacuum valve. The processing chamber houses two holders for holding substrates on their surfaces on the same side. The processing chamber is provided with an ion source for irradiating the substrate on each holder having reached a processing position P with an ion beam so that it is subjected to ion implantation. The processing chamber is internally provided with a holder moving mechanism for performing the operation of moving the two holders in parallel independently from each other so that they traverse the processing position P, and moving the two holders in parallel simultaneously between the insides of the processing chamber and vacuum spare chamber through the vacuum valve. The vacuum spare chamber is internally provided with a substrate replacing mechanism for replacing processed substrates and non-processed substrates with each other collectively for the two holders in cooperation with the holder moving mechanism.
    • 衬底处理设备包括处理室和通过真空阀与其相邻的真空备用室。 处理室容纳两个用于在同一侧的表面上保持基板的支架。 处理室设置有离子源,该离子源用于利用离子束照射到达处理位置P的每个保持器上的基板,以使其经受离子注入。 在处理容器的内部设置有保持架移动机构,该保持架移动机构进行使两个保持架彼此独立地并行移动的动作,以使它们横穿处理位置P,同时使两个保持架并行地在处理室内 并通过真空阀真空备用室。 真空备用室内部设置有基板更换机构,用于与保持器移动机构协作地将处理后的基板和未处理的基板彼此一起替换为两个保持器。 <图像>
    • 4. 发明授权
    • 플라즈마발생장치
    • 等离子发生器
    • KR100858102B1
    • 2008-09-10
    • KR1020067019601
    • 2005-03-22
    • 닛신덴키 가부시키 가이샤
    • 오노다마사토시다카하시에이지
    • H05H1/46H01L21/205H01L21/3065C23F4/00
    • C23C16/509C23C16/24H01J37/32082
    • 본 발명은 플라즈마발생실(10) 및 실(10) 내에 설치된 고주파 안테나(1)를 구비하고, 실(10) 내 가스에 안테나(1)로부터 고주파 전력을 인가하여 유도 결합 플라즈마를 발생시키는 플라즈마발생장치이다. 이를 위하여 안테나(1)는 실(10) 밖으로부터 실(10) 내로 연장하는 제 1 부분(11, 전원 연결부)과, 제 1 부분(11)의 실 안쪽 끝부(11e)로부터 전기적으로 병렬로 분기하여 종단(12e)이 접지된 실(10)의 내벽에 직접적으로 접속된 복수개의 제 2 부분(12, 접속부)으로 이루어지는 저인덕턴스 안테나이다. 안테나(1)의 표면은 전기절연성 재료로 피복되어 있다. 안테나에 인가되는 고주파 전력의 주파수는 40 MHz ~ 수100 MHz 정도의 높은 것이어도 좋고, 이상방전, 매칭불량 등의 단점을 억제하여 원하는 플라즈마를 발생시킬 수 있다. 막 형성과 같은 처리를 실시할 수 있도록 구성할 수도 있다.
    • 等离子体产生装置包括等离子体产生室和设置在腔室中的高频天线,以通过从天线向腔室中的气体施加高频功率来产生感应耦合等离子体。 该设备。 为此,天线1具有从腔室10的外部延伸到腔室10中的第一部分11(电力连接部分)和从第一部分11的内端部11e延伸的第二部分11(电力连接部分) 并且,多个第二部分12(连接部分)直接连接到纱线10的内壁,末端12e接地到该内壁上。 天线1的表面覆盖有电绝缘材料。 施加到天线的高频电力的频率可以高达约40MHz到几百MHz,并且可以抑制异常放电的缺点,匹配故障等,由此产生期望的等离子体。 也可以执行诸如成膜的处理。
    • 7. 发明公开
    • 실리콘막 형성장치
    • 硅胶成型设备
    • KR1020060125910A
    • 2006-12-06
    • KR1020067019605
    • 2005-03-22
    • 닛신덴키 가부시키 가이샤
    • 도묘아츠시다카하시에이지후지와라마사키고테라다카시오노다마사토시
    • C23C14/14C23C14/34
    • H01J37/321C23C14/165C23C14/3471
    • Silicon film forming equipment is provided with a film forming chamber (10), a silicon sputter target (2) arranged in the chamber, a hydrogen gas supplying circuit (102 or 102') for supplying the chamber with hydrogen gas, and a high- frequency power applying apparatus (antenna (1, 1'), power supply PW, etc.) for applying high-frequency power to the hydrogen gas supplied in the film forming chamber (10) so as to generate inductively coupled plasma. The silicon film forming equipment forms a silicon film on a substrate S by chemically sputtering the target (2) by the plasma. Silane gas may be used at the same time. A gas reservoir (GR) may be provided on a silane gas supplying circuit (101). A desired silicon film can be formed at a relatively low temperature at a low cost and at a higher speed.
    • 硅成膜设备设置有成膜室(10),设置在室中的硅溅射靶(2),用于向室供应氢气的氢气供应回路(102或102'), 用于向在所述成膜室(10)中供应的氢气施加高频电力以产生电感耦合等离子体的高频电力施加装置(天线(1,1'),电源PW等)。 硅膜形成设备通过用等离子体化学溅射靶(2)在衬底S上形成硅膜。 硅烷气可以同时使用。 可以在硅烷气体供给回路(101)上设置储气罐(GR)。 可以以较低的成本和较高的速度在较低的温度下形成所需的硅膜。
    • 8. 发明公开
    • 박막형성장치 및 방법
    • 用于形成薄膜的装置和方法
    • KR1020040025847A
    • 2004-03-26
    • KR1020030065012
    • 2003-09-19
    • 닛신덴키 가부시키 가이샤
    • 기리무라히로야구보타기요시오노다마사토시구라타니나오토
    • H01L21/205
    • C23C16/45563C23C16/24C23C16/345C23C16/402C23C16/509H01J37/3244
    • PURPOSE: An apparatus and a method for forming a thin film are provided to improve the uniformity of the thickness of the thin film by increasing the amount of gas from a center to an end of a substrate. CONSTITUTION: An apparatus for forming a thin film includes a gas supplying device, a power applying device, a vacuum container, and an exhausting device. The gas supplying device(2) includes a gas supply member(21) having a gas supply surface portion. The gas supply surface portion is opposed to a film-forming surface of an article to be film-covered disposed in the vacuum container(1). The power applying device(4) includes a power applying electrode(41) disposed in the vacuum container. The gas supply member has a plurality of gas supply holes(210a,210b) dispersedly formed at the gas supply surface portion. The power applying electrode is disposed in a surrounding region around a space between the article to be film-covered disposed in the vacuum container and the gas supply surface portion of the gas supply member opposed to the article.
    • 目的:提供一种用于形成薄膜的设备和方法,以通过增加从基板的中心到端部的气体量来改善薄膜厚度的均匀性。 构成:用于形成薄膜的装置包括气体供给装置,动力施加装置,真空容器和排气装置。 气体供给装置(2)包括具有气体供给面部的气体供给部件(21)。 气体供给面部与设置在真空容器(1)中的要被覆盖的物品的成膜面相对。 动力施加装置(4)包括配置在真空容器内的动力施加电极(41)。 气体供给构件具有分散形成在气体供给面部的多个气体供给孔(210a,210b)。 电力施加电极设置在围绕设置在真空容器中的被覆盖物品与与物品相对的供气部件的气体供给面部之间的空间的周围区域。