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    • 51. 发明公开
    • 기상 성장용 서셉터
    • 不锈钢蒸汽相外观
    • KR1020140074467A
    • 2014-06-18
    • KR1020120142444
    • 2012-12-10
    • 코닝정밀소재 주식회사
    • 김준회박철민김우리한박보익배준영이동용이원조임성근최준성
    • C23C16/458H01L21/683H01L21/205
    • The present invention relates to a susceptor for vapor phase growth and, more particularly, to a susceptor for vapor phase growth which can minimize a phenomenon where the bottom of a base substrate having single crystal gallium nitride with vapor phase growth on the top thereof is exposed to growth gas, and which can minimize a contact area and stably fixate the base substrate. The provided susceptor for vapor phase growth comprises a base plate; and a pocket unit which is formed on the top of the base plate and where a base substrate to be evaporated with an evaporating film is seated. The pocket unit is separated from the bottom of the base substrate and is in line contact with an edge unit of the base substrate.
    • 本发明涉及一种用于气相生长的感受体,更具体地说,涉及用于气相生长的感受体,其可以最小化其顶部具有气相生长的具有单晶氮化镓的基底衬底的底部暴露的现象 生长气体,并且可以最小化接触面积并稳定地固定基底。 所提供的气相生长基座包括基板; 以及形成在基板的顶部并且用蒸发膜蒸发的基底的座袋单元。 袋单元与基底基板的底部分离,并与基底基板的边缘单元线接触。
    • 52. 发明公开
    • 기판의 결함 검출 방법
    • 检测基板缺陷的方法
    • KR1020140070006A
    • 2014-06-10
    • KR1020120137974
    • 2012-11-30
    • 코닝정밀소재 주식회사
    • 윤재헌황규홍정지화
    • G01N21/88G06T1/00
    • G01N21/8851G01N21/956G01N21/958G01N2021/8887G06T7/0004
    • The present invention relates to a method for detecting a defect on a substrate and, more particularly, to a method for detecting a defect on a substrate which is used as panel glass of a display device. The provided method for detecting a defect on a substrate comprises as follows: a pixel value obtaining step which obtains a pixel value of a substrate image by performing line scan on the substrate; a flattening step which flattens the obtained pixel value; and a detecting step which detects a defect on the substrate by comparing the flattened pixel value with a threshold. The flattening step is conducted by the following formula: Here, P(x, y) is a pixel value at coordinate (x, y), m(x) = a mode (h_x(k)), h(k) is a histogram of the entire obtained pixel values, h_x(k) is a histogram of the pixel value at coordinate x, and I is the maximum pixel value which can be obtained by a line-scan camera.
    • 本发明涉及一种用于检测基板上的缺陷的方法,更具体地,涉及一种用于检测用作显示装置的面板玻璃的基板上的缺陷的方法。 所提供的用于检测基板上的缺陷的方法包括:像素值获取步骤,通过在基板上执行行扫描来获得基板图像的像素值; 平坦化所获得的像素值的平坦化步骤; 以及检测步骤,通过将平坦化像素值与阈值进行比较来检测衬底上的缺陷。 平坦化步骤由下式进行:这里,P(x,y)是坐标(x,y),m(x)= a(h_x(k))的像素值,h(k) 整个获得的像素值的直方图,h_x(k)是坐标x处的像素值的直方图,I是可以由行扫描照相机获得的最大像素值。
    • 54. 发明公开
    • 박막 접합 기판 제조방법
    • 具有薄膜薄膜的基板的制作方法
    • KR1020140060688A
    • 2014-05-21
    • KR1020120127284
    • 2012-11-12
    • 코닝정밀소재 주식회사
    • 전종필김동운김동현김미현김민주김아라김현준박승용유율리아이보현정경섭
    • H01L21/20
    • The present invention relates to a method for manufacturing a thin film junction circuit board and, more specifically, to a method for manufacturing a thin film junction circuit board capable of reducing a crack by reducing a shear force applied to a junction circuit board in a layer transfer process. To achieve this, the present invention comprises a circuit board preparation step for preparing a first circuit board composed of crystalline structures and a second circuit board connected to the first circuit board and composed of different chemicals from the first circuit board; an ion injection step for forming an ion injection layer by injecting ion to a predetermined depth from the junction surface of the first circuit board connected to the second circuit board; a circuit board junction step for connecting the first circuit board to the second circuit board in a facing condition of junction surfaces of the first and the second circuit board; and a separation step for forming a crystalline thin film separated from the first circuit board by separating the first circuit board from the second circuit board based on the ion injection layer. The first circuit board is separated in the separation step by gradationally heating respective areas of the ion injection layer by dividing the whole area of the ion injection layer into multiple areas.
    • 本发明涉及一种制造薄膜结电路板的方法,更具体地说,涉及一种薄膜接合电路板的制造方法,该薄膜结电​​路板能够通过减小施加到层中的结电路板的剪切力来减小裂纹 转移过程。 为了实现这一点,本发明包括一种用于制备由晶体结构构成的第一电路板和与第一电路板连接并由与第一电路板不同的化学品组成的第二电路板的电路板制备步骤; 离子注入步骤,用于通过从连接到第二电路板的第一电路板的接合表面注入离子至预定深度来形成离子注入层; 电路板接合步骤,用于在所述第一和第二电路板的接合表面的面对状态下将所述第一电路板连接到所述第二电路板; 以及分离步骤,用于通过基于离子注入层将第一电路板与第二电路板分开来形成与第一电路板分离的结晶薄膜。 通过将离子注入层的整个区域划分成多个区域,通过对离子注入层的各个区域进行分级加热,在分离步骤中分离第一电路板。
    • 56. 发明公开
    • 투명 도전성 기재 및 이를 포함하는 터치 패널
    • 透明导电基板和具有它的触控面板
    • KR1020140058062A
    • 2014-05-14
    • KR1020120124612
    • 2012-11-06
    • 코닝정밀소재 주식회사
    • 안진수오정홍이재홍임창묵
    • G06F3/041H01B5/14
    • G06F3/041H01B5/14H01B13/00
    • The present invention relates to a transparent conductive substrate and a touch panel including the transparent conductive substrate, and more particularly, to a transparent conductive substrate including a transparent conductive layer formed on a flexible substrate and a touch panel including the transparent conductive substrate. Accordingly, the present invention includes: a substrate; a first thin-film layer which is formed on the substrate and has a refractive index of 2.2 - 2.7 at a 550 mm wavelength; a second thin-film layer which is formed on the first thin-film layer and has a refractive index of 1.4 - 1.5 at a 550 mm wavelength; and a transparent conductive layer formed on the second thin-film layer. The transparent conductive layer includes: a crystalline transparent conductive layer; and an amorphous transparent conductive layer formed on at least one of the upper surface or the lower surface of the crystalline transparent conductive layer.
    • 本发明涉及一种透明导电基板和包括该透明导电基板的触摸面板,更具体地,涉及一种透明导电基板,该透明导电基板包括形成在柔性基板上的透明导电层和包括该透明导电基板的触摸面板。 因此,本发明包括:基板; 第一薄膜层,其形成在基板上,并且在550mm波长处具有2.2-2.7的折射率; 第二薄膜层,其形成在所述第一薄膜层上,并且在550mm波长处具有1.4-1.5的折射率; 以及形成在第二薄膜层上的透明导电层。 透明导电层包括:结晶透明导电层; 以及形成在所述结晶透明导电层的上表面或下表面中的至少一个上的非晶透明导电层。
    • 60. 发明授权
    • 단차 측정 장치
    • 测量步骤的装置
    • KR101379363B1
    • 2014-03-28
    • KR1020130039582
    • 2013-04-11
    • 코닝정밀소재 주식회사
    • 박정현김종필서덕교
    • G01B21/16G01B21/22G01B7/00
    • The present invention relate to a step measuring apparatus, and more specifically to a step measuring apparatus for measuring a step between blocks. To achieve this, the present invention as a step measuring apparatus for measuring a step between a first and a second block, provides a step measuring apparatus comprising: a body provided with a support unit surface-contact with the first block; an angle sensor unit installed on the body and measuring a slope of the first block; and a displacement sensor unit installed on the body and which is in contact with the second block so as to measure a slope of a step between the first and the second block and the second block.
    • 本发明涉及一种步进测量装置,更具体地涉及用于测量块之间的台阶的台阶测量装置。 为了实现这一点,本发明作为用于测量第一和第二块之间的台阶的台阶测量装置,提供了一种台阶测量装置,包括:主体,其设置有与第一块表面接触的支撑单元; 角度传感器单元,安装在身体上并测量第一块的斜率; 以及位移传感器单元,其安装在所述主体上并且与所述第二块接触,以便测量所述第一和第二块与所述第二块之间的台阶的斜率。