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    • 21. 发明公开
    • 에스피엠 나노탐침 및 그 제조방법
    • SPM纳米微粒及其制备方法
    • KR1020100019587A
    • 2010-02-19
    • KR1020080075397
    • 2008-08-01
    • 한국표준과학연구원
    • 안상정박병천강영호최진호정광훈
    • G01Q70/12G01Q70/16B82Y35/00
    • G01Q70/12
    • PURPOSE: An SPM(Scanning Probe Microscope) nanoprobe and a manufacturing method thereof for accurately measuring frictional force and adhesive force in a pattern are provided to control the ratio of a diameter of the deposit of a sphere and the diameter of the nano-needle. CONSTITUTION: A probe comprises a structure in which the deposit of a sphere is formed by particle beam induced deposition in the tip-end part of a nano-needle(20). A sectional diameter of the nano-needle and diameter of a circular deposit are range from 8.5 to 1.5. The diameter of the deposit of sphere is 15 nm to 1,000 nm range. In the particle beam conduction evaporation, the particle acceleration voltage is 50 kV range to 5. A particle density researched in the tip-end part is 400 to 10000.
    • 目的:提供用于精确测量图案中的摩擦力和粘附力的SPM(扫描探针显微镜)纳米探针及其制造方法,以控制球体沉积物的直径与纳米针的直径之比。 构成:探针包括其中通过在纳米针(20)的前端部分中的粒子束感应沉积形成球体沉积物的结构。 纳米针的截面直径和圆形沉积物的直径为8.5至1.5。 球体沉积物的直径为15nm至1000nm范围。 在粒子束传导蒸发中,粒子加速电压为50kV至5.尖端部分研究的粒子密度为400〜10000。
    • 24. 发明公开
    • 나노튜브 프로브 및 제조방법
    • 纳米探针及其制造方法
    • KR1020060034307A
    • 2006-04-21
    • KR1020067003055
    • 2004-09-08
    • 다이켄카가쿠 코교 가부시키가이샤나카야마 요시카즈
    • 나카야마요시카즈오카와다카시야마나카시게노부하라다아키오
    • G01Q70/16G01Q70/12B82Y35/00
    • G01Q70/12
    • A nanotube probe having durability, manufacturable in a short time, and having less impurities adhered to the surface of a holder holding a nanotube, wherein the nanotube (8) is fixed to a cantilevered projected part (4) by at least two partial coating films (12a) and (12b). One or more partial coating films may be additionally formed in the intermediate area of these two partial coating films. Each partial coating film is formed by radiating electron beam (10) to a position where the base end part (8b) of the nanotube touches the cantilevered projected part (4). The partial coating films are formed separately from each other so as not to be overlapped with each other. A coating time can be reduced by minimizing the size of the partial coating films to restrict the beam diameter of the electron beam (10). Since the beam diameter is small, the stacking of extra impurities can be suppressed.
    • 一种纳米管探针,其具有耐久性,可在短时间内制造,并且具有较少的杂质粘附到保持纳米管的保持器的表面,其中纳米管(8)通过至少两个部分涂膜固定到悬臂突出部分(4) (12a)和(12b)。 可以在这两个部分涂膜的中间区域另外形成一个或多个部分涂膜。 每个部分涂膜通过将电子束(10)辐射到纳米管的基端部分(8b)接触悬臂突出部分(4)的位置而形成。 部分涂膜彼此分开地形成,以便不彼此重叠。 通过最小化部分涂膜的尺寸来限制电子束(10)的光束直径,可以减少涂布时间。 由于光束直径小,所以能够抑制杂质的堆积。