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    • 1. 发明专利
    • Electronic control device and control characteristics adjustment method therefor
    • 电子控制装置及其控制特性调整方法
    • JP2014097735A
    • 2014-05-29
    • JP2012250893
    • 2012-11-15
    • Mitsubishi Electric Corp三菱電機株式会社
    • KANZAKI SHOZOARIMAI FUMIAKINISHIZAKI HIROYOSHI
    • B60R16/02
    • G05B13/041G05B19/0426G05B2219/21065G05B2219/23215G05B2219/25098G05B2219/25265G05B2219/25296
    • PROBLEM TO BE SOLVED: To dispose a label resistor to a specific sensor represented by a broken-line characteristic, the resistor for calibrating an inherent variation fluctuation of a detected signal, to realize a low cost and precision calibration signal.SOLUTION: An adjustment method includes: broken-line-approximating a standard characteristic that is an average characteristic of a number of samples by first, second and third lines 315a, 325a and 335a; storing a coordinate position of a first-second line constituting a comparison-adjustment point in a data memory of an electronic control device as standard data; broken-line-approximating an actual component characteristic of a calibration target by first, second and third lines 315b, 325b and 335b; adjusting a resistance value of a first label resistor to a value corresponding to ratios of a monitoring output (V10n/V10, V20n/V20); and adjusting a resistance value of a second label resistor to a value corresponding to ratios of a monitoring output (V30n/V30, V40n/V40). The electronic control device reads the resistance value of the label resistor, combines with the stored standard characteristic, interpolates a third line portion, and restore-generates an actual component characteristic.
    • 要解决的问题:将标签电阻器设置为由虚线特性表示的特定传感器,用于校准检测信号的固有变化波动的电阻器,以实现低成本和精确的校准信号。解决方案:调整方法 包括:虚线近似第一,第二和第三行315a,325a和335a的样本数的平均特性的标准特征; 将构成比较调整点的第一行的坐标位置存储在电子控制装置的数据存储器中作为标准数据; 通过第一,第二和第三线315b,325b和335b虚线近似校准目标的实际分量特性; 将第一标签电阻器的电阻值调整为与监视输出(V10n / V10,V20n / V20)的比率对应的值; 以及将第二标签电阻器的电阻值调整到与监视输出(V30n / V30,V40n / V40)的比率对应的值。 电子控制装置读取标签电阻的电阻值,与存储的标准特性组合,内插第三行部分,并恢复生成实际的分量特性。